Patent Assignment
Reel/Frame 067369/0832
Assignment of Assignor's Interest
Recorded: 2024-05-09
Pages: 87
Assignor
SK HYNIX INC.
Executed: 2024-03-11
Assignee
MIMIRIP LLC
9330 LBJ FREEWAY, SUITE 900, DALLAS, TEXAS, 75243
Covered Properties
(509)
Biosensor and Sensing Cell Array Using the Same
Memory Device for Rapid Data Access from Memory Cell
Sram Cell and Method of Manufacturing the Same
Cleaning Solution for Photoresist and Method for Forming Pattern Using the Same
Method for Fabricating Capacitor in Semiconductor Device
Test Mode Control Device Using Nonvolatile Ferroelectric Memory
Method for Manufacturing Ferroelectric Random Access Memory Capacitor
Semiconductor Memory Device
Reset Signal Generating Circuit
Semiconductor Device and Method for Manufacturing the Same
Pre-Driver Circuit and Data Output Circuit Using the Same
Cell Array Block of Feram, and Feram Using Cell Array
Input/Output Byte Control Device Using Nonvolatile Ferroelectric Register
Method of Reading Memory Device in Page Mode and Row Decoder Control Circuit Using the Same
Method for Fabricating Ferroelectric Random Access Memory Device with Merged-Top Electrode-Plateline Capacitor
Method for Forming Low Dielectric Layer of Semiconductor Device
Semiconductor Memory Device for Preventing Skew and Timing Error of Output Data
Semiconductor Memory Device Capable of Reducing Noise During Operation Thereof
Semiconductor Memory Device for Enhancing Refresh Operation in High Speed Data Access
Method for Fabricating Semiconductor Device with Improved Refresh Time
Semiconductor Memory Device
Write/Precharge Flag Signal Generation Circuit and Circuit for Driving Bit Line Isolation Circuit in Sense Amplifier Using the Same
Apparatus and Method for Controlling Enable Time of Signal Controlling Operation of Data Buses of Memory Device
Multi-Port Memory Device with Precharge Control
Nano Tube Cell, and Semiconductor Device Having Nano Tube Cell and Double Bit Line Sensing Structure
Control Circuit for Delay Locked Loop
Method for Forming Isolation Layer of Semiconductor Device
Nonvolatile Ferroelectric Memory Device Having Power Control Function
Circuit for Generating Wait Signal in Semiconductor Device
Control Circuit for Stable Exit from Power-Down Mode
Driving Circuit for Non-Volatile Dram
Semiconductor Memory Device
Method for Fabricating Semiconductor Device
Input Device for a Semiconductor Device
Address Latch Circuit of Memory Device
Semiconductor Memory Device for Reducing Current Consumption in Operation
Method for Forming Fine Patterns of Semiconductor Device
Phase-Change Memory Device and Method for Manufacturing the Same
Phase-Change Random Access Memory Device and Method for Manufacturing the Same
Oscillator Circuit Operating with a Variable Driving Voltage
Semiconductor Memory Device for Sensing Voltages of Bit Lines in High Speed
Boosted Voltage Generator
Semiconductor Memory Device with Stable Internal Power Supply Voltage
Analog-To-Digital Converter
Apparatus and Method for Testing Semiconductor Memory Device
Semiconductor Memory Device Capable of Detecting Repair Address at High Speed
Semiconductor Memory Device and Internal Voltage Generating Method Thereof
Method for Forming Contact Plug of Semiconductor Device
Semiconductor Memory Device Capable of Stably Setting Mode Register Set and Method Therefor
Top Arc Polymers, Method of Preparation Thereof and Top Arc Compositions Comprising the Same
Semiconductor Memory Device with Simplified Data Control Signals
Nonvolatile Memory Device Using Hybrid Switch Cell
Memory Device and Method for Fabricating the Same
Data Output Driver for Reducing Noise
Nonvolatile Ferroelectric Memory Device
Internal Voltage Generation Control Circuit and Internal Voltage Generation Circuit Using the Same
Sram Cell and Method of Manufacturing the Same
Semiconductor Device with Reduced Power Consumption That Selectively Drives One of a Plurality of Signal Receivers According to Level of External Supply Voltage
Circuit for Generating Data Strobe Signal of Semiconductor Memory Device
Memory Device Capable of Detecting Its Failure
High Voltage Switching Circuit of a Nand Type Flash Memory Device
Semiconductor Memory Device with Internal Voltage Generator
Semiconductor Memory Device Having N-Bit Prefetch Type and Method of Transferring Data Thereof
Method for Forming Step Channel of Semiconductor Device
Methods for Forming Trench Isolation
Memory Device for Reducing Leakage Current
Flash Memory Device and Method of Fabricating the Same
Voltage Pumping Device
Method of Manufacturing Semiconductor Device Having Tungsten Gates Electrode
Method for Forming Landing Plug Contact in Semiconductor Device
Method of Controlling Mode Register Set Operation in Memory Device and Circuit Thereof
Partial Implantation Method for Semiconductor Manufacturing
Ferroelectric Random Access Memory Capacitor and Method for Manufacturing the Same
Metal Oxide Semiconductor Transistor and Method for Manufacturing the Same
Semiconductor Device and Method for Manufacturing the Same
Ferroelectric Register, and Method for Manufacturing Capacitor of the Same
Method of Manufacturing a Phase Change Ram Device Utilizing Reduced Phase Change Current
Flash Memory Device
Voltage Level Detection Circuit
Semiconductor Device and Method for Fabricating the Same
Semiconductor Device Having a Recessed Gate and Asymmetric Dopant Regions and Method of Manufacturing the Same
Page Buffer Circuit of Flash Memory Device
Method of Fabricating Flash Memory Device
Method of Forming Contact Plug in Semiconductor Device
Nonvolatile Semiconductor Static Random Access Memory Device
Page Buffer Circuit of Flash Memory Device with Improved Read Operation Function and Method of Controlling Read Operation Thereof
Semiconductor Memory Device for Securing a Stable Operation at a High Speed Operation
Method of Manufacturing Semiconductor Device Having Recess Gate Structure with Varying Recess Width for Increased Channel Length
Internal Voltage Generating Apparatus Adaptive to Temperature Change
Semiconductor Memory Device for Stably Controlling Power Mode at High Frequency and Method of Controlling Power Mode Thereof
Circuit and Method for Generating Power Up Signal
Rfid Device Having Nonvolatile Ferroelectric Memory Device
Method for Manufacturing Semiconductor Device
Multi-Port Memory Device
Pad Redistribution Chip for Compactness, Method of Manufacturing the Same, and Stacked Package Using the Same
Semiconductor Memory Device
Capacitor with Nano-Composite Dielectric Layer and Method for Fabricating the Same
Method for Fabricating Semiconductor Device Using Arf Photolithography Capable of Protecting Tapered Profile of Hard Mask
Biosensor and Sensing Cell Array Using the Same
Memory Device and Method for Fabricating the Same
Contact Structure of Semiconductor Device and Method for Fabricating the Same
Method of Forming Bit Line of Flash Memory Device
Phase Change Ram Device
Data Output Circuit of Synchronous Memory Device
Semiconductor Device and Method of Manufacturing the Same
Semiconductor Device
Internal Voltage Generation Control Circuit and Internal Voltage Generation Circuit Using the Same
Semiconductor Memory Device
Memory Device Having Latch for Charging or Discharging Data Input/Output Line
Method for Fabricating Semiconductor Device
Output Controller with Test Unit
Method for Fabricating Semiconductor Device Having Recess Gate
Semiconductor Memory Device
Nonvolatile Ferroelectric Memory Device and Method Thereof
Method of Forming Metal Line and Contact Plug of Flash Memory Device
Data Output Circuit of Semiconductor Memory Device and Operation Method Thereof
Method for Forming a Dram Semiconductor Device with a Sense Amplifier
Nano Tube Cell, and Semiconductor Device Having Nano Tube Cell and Double Bit Line Sensing Structure
Control Circuit for Stable Exit from Power-Down Mode
Semiconductor Memory Device
Multi-Chip Device and Method for Manufacturing the Same
Semiconductor Memory Device
Semiconductor Memory Device for Measuring Internal Voltage
Method for Manufacturing a Semiconductor Device Having a Device Isolation Trench
Multi-Port Memory Device
Semiconductor Memory Apparatus and Method of Resetting Input/Output Lines of the Same
Precharge Apparatus
Apparatus and Method of Controlling Bank of Semiconductor Memory
Data Output Clock Generating Circuit and Method of Generating Data Output Clock of Semiconductor Memory Apparatus
Method of Forming Metal Line of Semiconductor Device
Apparatus and Method for Controlling Active Cycle of Semiconductor Memory Apparatus
Circuit for Generating Data Strobe Signal of Semiconductor Memory Device
Repair Fuse Circuit for Storing I/O Repair Information Therein
Voltage Generator in a Flash Memory Device
Pattern Decomposition and Optical Proximity Correction Method for Double Exposure When Forming Photomasks
Method of Forming Hardmask Pattern of Semiconductor Device
Semiconductor Memory Device
Method for Calibrating a Driver and on-Die Termination of a Synchronous Memory Device
Method for Manufacturing Semiconductor Device
Semiconductor Memory Apparatus Having Noise Generating Block and Method of Testing the Same
Semiconductor Memory Device
Row Address Control Circuit in Semiconductor Integrated Circuit and Method of Controlling Row Address Using the Same
Semiconductor Device with a Bulb-Type Recess Gate
Offset Voltage Measuring Apparatus
Multi-Port Memory Device
Apparatus for Sensing Data of Semiconductor Integrated Circuit
Apparatus and Method of Generating Power Up Signal of Semiconductor Integrated Circuit
Band Gap Reference Circuit and Temperature Information Output Apparatus Using the Same
Semiconductor Integrated Circuit Having Data Input/Output Circuit and Method for Inputting Data Using the Same
Over Driving Pulse Generator
Command Decoder Circuit of Semiconductor Memory Device
Internal Voltage Generation Circuit of Semiconductor Memory Device
Electrostatic Discharge Protection Circuit Protecting Thin Gate Insulation Layers in a Semiconductor Device
Apparatus and Method for Controlling Enable Time of Signal Controlling Operation of Data Buses of Memory Device
Circuit for Supplying a Voltage in a Memory Device
Test Mode Control Device Using Nonvolatile Ferroelectric Memory
Test Mode Control Device Using Nonvolatile Ferroelectric Memory
Internal Voltage Generator of Semiconductor Device
Internal Voltage Generator
Nonvolatile Ferroelectric Memory Device
Nonvolatile Ferroelectric Memory Device
Non-Volatile Memory Device and Data Read Method and Program Verify Method of Non-Volatile Memory Device
Method for Manufacturing Semiconductor Device
Semiconductor Package Having Structure for Warpage Prevention
Semiconductor Device Having a Recess Channel Structure and Method for Manufacturing the Same
Non-Volatile Memory Device and Method of Programming a Multi Level Cell in the Same
Method of Forming Micro Pattern in Semiconductor Device
Nonvolatile Memory Device and Fabrication Method Thereof
Metal Line in Semiconductor Device and Method for Forming the Same
Semiconductor Device and Method for Fabricating the Same
Circuit for Discharging Static Electricity
Internal Voltage Generation Circuit for Generating Stable Internal Voltages Withstanding Varying External Conditions
Input/Output Upper and Lower Byte Control Device Using Nonvolatile Ferroelecric Register
Voltage Pumping Device
Dll Circuit and Method of Controlling the Same
Semiconductor Memory Device and Method for Driving the Same
Semiconductor Memory Device with on-Die Termination Circuit
Semiconductor Memory Device Having a Delay Locked Loop (Dll) and Method for Driving the Same
Data Input Circuit of Semiconductor Memory Apparatus and Method of Inputting the Data
Semiconductor Integrated Circuit and Semiconductor Package Module Having the Same
Over Driver Control Signal Generator in Semiconductor Memory Device
Memory Device Having Small Clock Buffer
Semiconductor Memory Device with Refresh Signal Generator and Its Driving Method
Delayed Locked Loop
Internal Voltage Generating Circuit
Circuit for Generating Clock of Semiconductor Memory Apparatus
Memory Device Capable of Detecting Its Failure
Stacked Semiconductor Package and Method for Manufacturing the Same
Semiconductor Package Adapted for High-Speed Data Processing and Damage Prevention of Chips Packaged Therein and Method for Fabricating the Same
Phase Change Memory Device in Which a Phase Change Layer Is Stably Formed and Prevented from Lifting and Method for Manufacturing the Same
Method for Manufacturing Phase Change Memory Device Which Can Stably Form an Interface Between a Lower Electrode and a Phase Change Layer
Semiconductor Device with Bulb-Type Recessed Channel and Method for Fabricating the Same
Semiconductor Package with Improved Size, Reliability, Warpage Prevention, and Heat Dissipation and Method for Manufacturing the Same
Metal Line of Semiconductor Device Having a Diffusion Barrier with an Amorphous Tabn Layer and Method for Forming the Same
Method of Fabricating Flash Memory Device
Flash Memory Device
Data I/O Control Signal Generating Circuit in a Semiconductor Memory Apparatus
Stacked Semiconductor Package and Method for Manufacturing the Same
Semiconductor Package Module
Method for Forming Line Pattern Array, Photomask Having the Same and Semiconductor Device Fabricated Thereby
Data Output Clock Signal Generating Apparatus and Semiconductor Integrated Circuit with the Same
Address Receiving Circuit for a Semiconductor Apparatus
Semiconductor Device Having a Recessed Gate and Asymmetric Dopant Regions and Method of Manufacturing the Same
Data Error Measuring Circuit for Semiconductor Memory Apparatus
Semiconductor Memory Apparatus
Flip Chip Package and Method for Manufacturing the Same
Method for Forming Capacitor of Semiconductor Device
Voltage Generating Circuit and Reference Voltage Generating Circuit for Semiconductor Memory Apparatus, and Semiconductor System Using the Same
Internal Voltage Generation Circuit and Method for Semiconductor Device
A Method Involving Trimming a Hard Mask in the Peripheral Region of a Semiconductor Device
Delay Cell and Phase Locked Loop Using the Same
Apparatus and Method for Generating Multi-Phase Clocks
Method for Fabricating Isolation Layer in Semiconductor Device
Column Address Control Circuit Capable of Selectively Enabling Sense Amplifier in Response to Column Addresses
Write Driving Circuit
Semiconductor Memory Device Having Wafer Burn-in Test Mode
Memory Module and Memory System
Delay Circuit of Semiconductor Memory Apparatus
Voltage Pumping Device
Semiconductor Integrated Circuit Including Bank Selection Control Block
Phase Detecting Circuit and Clock Generating Apparatus Including the Same
Write Circuit of Memory Device
Write Circuit of Memory Device
Warpage Resistant Semiconductor Package and Method for Manufacturing the Same
Rfid Device Having Nonvolatile Ferroelectric Memory Device
Electrostatic Discharge Protection Circuit Protecting Thin Gate Insulation Layers in a Semiconductor Device
Apparatus and Method for Transmitting/Receiving Signals at High Speed
Semiconductor Memory Device for Sensing Voltages of Bit Lines in High Speed
Data Output Clock Generating Circuit and Method of Generating Data Output Clock of Semiconductor Memory Apparatus
Ferroelectric Register, and Method for Manufacturing Capacitor of the Same
Input Circuit of Semiconductor Memory Apparatus and Control Method of the Same
Data Output Circuit of Synchronous Memory Device
Data Output Control Circuit of a Double Data Rate (Ddr) Synchronous Semiconductor Memory Device Responsive to a Delay Locked Loop (Dll) Clock
Semiconductor Device and Method for Manufacturing the Same
Phase Change Memory Device, Manufacturing Method Thereof and Operating Method Thereof
Semiconductor Memory Device Capable of Suppressing a Coupling Effect of a Test-Disable Transmission Line
Semiconductor Device with Reduced Resistance of Bit Lines and Method for Manufacturing the Same
Ringing Masking Device Having Buffer Control Unit
Method for Efficiently Driving a Phase Change Memory Device
Semiconductor Memory Device
Thermal Code Transmission Circuit and Semiconductor Memory Device Using the Same
Semiconductor Device and Operation Method Thereof
Method of Forming Contact Plug of Semiconductor Device
Method for Fabricating Semiconductor Device
Semiconductor Device Having Multiple I/O Modes
Semiconductor Memory Device Removing Parasitic Coupling Capacitance Between Word Lines
Internal Voltage Generator and Semiconductor Memory Device Including the Same
Semiconductor Memory Device and Operation Method Thereof
Method for Manufacturing Capacitor of Semiconductor Device
Bank Control Device and Semiconductor Device Including the Same
Semiconductor Memory Apparatus
Bulk Voltage Detector
Test Circuit Capable of Sequentially Performing Boundary Scan Test and Test Method Thereof
Phase Change Memory Device Having a Word Line Contact
Semiconductor Integrated Circuit and Method of Controlling the Same
Receiver Circuit
Semiconductor Memory Device and Method for Testing the Same
Current Mirror Semiconductor Device and a Layout Method of the Same
Voltage Generating Unit of Semiconductor Memory Device
Method for Manufacturing Phase Change Memory Device
Driving Strength Control Circuit and Data Output Circuit in Semiconductor Device
Internal Voltage Generator
Apparatus and Method of Controlling Bank of Semiconductor Memory
Method for Fabricating Transistor in a Semiconductor Device Utilizing an Etch Stop Layer Pattern as a Dummy Pattern for the Gate Electrode Formation.
Internal Voltage Generation Circuit of Semiconductor Memory Device
Semiconductor Memory Device
Vpp Pumping Circuit and Vpp Pumping Method Using the Same
Circuit for Controlling an Enabling Time of an Internal Control Signal According to an Operating Frequency of a Memory Device and the Method Thereof
Patent:
42,202 →
Application:
12/315,173 →
Semiconductor Memory Device and Operation Method Thereof
Pumping Mos Capacitor
Method for Fabricating Semiconductor Device
Printed Circuit Board Having Adaptable Wiring Lines and Method for Manufacturing the Same
Phase Change Memory Device Having Dielectric Layer for Isolating Contact Structure Formed by Growth, Semiconductor Device Having the Same, and Methods for Manufacturing the Devices
Semiconductor Device Preventing Floating Body Effect in a Peripheral Region Thereof and Method for Manufacturing the Same
Pad Structure of Semiconductor Integrated Circuit Apparatus
Capacitor of Semiconductor Device and Method for Forming the Same
Internal Voltage Generator
Semiconductor Memory Device
Phase Change Memory Device with Heater Electrodes Having Fine Contact Area and Method for Manufacturing the Same
Semiconductor Device
Phase-Change Memory Device
Xor Logic Circuit
Method for Manufacturing Stack Package Using Through-Electrodes
Analog to Digital Converter Using Successive Approximation
Method for Fabricating Pmos Transistor and Method for Forming Dual Gate Using the Same
Semiconductor Memory Apparatus
Wafer Test Trigger Signal Generating Circuit of a Semiconductor Memory Apparatus, and a Wafer Test Circuit Using the Same
Method for Manufacturing Semiconductor Device Preventing Loss of Junction Region
Apparatus for Sensing Data of Semiconductor Integrated Circuit
Phase Change Ram Device and Method for Manufacturing the Same
Semiconductor Memory Device
Semiconductor Memory Device and Method of Fabricating the Same
Semiconductor Memory Apparatus Having Decreased Leakage Current
Multi-Chip Device and Method for Manufacturing the Same
Semiconductor Memory Device and Delay Locked Loop Control Method Thereof
Charge Trap Type Non-Volatile Memory Device and Method for Fabricating the Same
Semiconductor Chip Capable of Increased Number of Pads in Limited Region and Semiconductor Package Using the Same
Phase Change Memory Device Having a Diode That Has an Enlarged Pn Interfacial Junction and Method for Manufacturing the Same
Semiconductor Memory Device
Method for Fabricating Capacitor in Semiconductor Device
Circuit for Generating Read and Signal and Circuit for Generating Internal Clock Using the Same
Method for Forming Device Isolation Layer of Semiconductor Device and Non-Volatile Memory Device
Test Circuit for Multi-Port Memory Device
Internal Write/Read Pulse Generating Circuit of a Semiconductor Memory Apparatus
Semiconductor Integrated Circuit Capable of Controlling Test Modes Without Stopping Test
Receiver of Semiconductor Memory Apparatus
Domain Crossing Circuit of a Semiconductor Memory Apparatus
Delay Locked Loop Circuit
Data Input Device of Semiconductor Memory Appartus and Control Method Thereof
Nonvolatile Memory Cell, Nonvolatile Memory Device and Method for Driving the Same
Method for Fabricating Semiconductor Device with Vertical Gate
Termination Control Circuit and Method for Global Input/Output Line
Layout of Semiconductor Device
Data Driver
Semiconductor Device
Semiconductor Memory Apparatus and Method of Testing the Same
Internal Voltage Generating Circuit Capable of Controlling Swing Width of Detection Signal in Semiconductor Memory Apparatus
Semiconductor Device and Interface Board for Testing the Same
Semiconductor Device and Method of Fabricating the Same
Data Output Clock Signal Generating Apparatus and Semiconductor Integrated Circuit with the Same
Semiconductor Memory Device Having Internal Voltage Generator and Method for Driving the Same
Method of Forming Micro Pattern in Semiconductor Device
Input Buffer Circuit of Semiconductor Apparatus
Method for Fabricating a Semiconductor Device Having a Device Isolation Trench
Biosensor and Sensing Cell Array Using the Same
Pad Redistribution Chip for Compactness, Method of Manufacturing the Same, and Stacked Package Using the Same
Semiconductor Device and Operating Method Thereof
Semiconductor Storage System for Decreasing Page Copy Frequency and Controlling Method Thereof
Semiconductor Package Having a Heat Dissipation Member
Semiconductor Package
Method for Fabricating Semiconductor Device
Clock Receiver in Semiconductor Integrated Circuit and Method of Controlling the Same
Partial Implantation Method for Semiconductor Manufacturing
Precharge Signal Generator and Semiconductor Memory Device
Semiconductor Memory Device and Method of Operating the Same
Semiconductor Integrated Circuit
Self-Refresh Test Circuit of Semiconductor Memory Apparatus
Flash Memory Device and Method of Manufacturing the Same
Fuse Structure for High Integrated Semiconductor Device
Semiconductor Memory Apparatus
Semiconductor Memory, Memory System, and Method of Controlling the Same
Cell Inferiority Test Circuit
Duty Cycle Correcting Circuit and Duty Cycle Correcting Method
Nonvolatile Memory Device and Fabrication Method Thereof
Semiconductor Memory Device and Method for Driving the Same
Non-Volatile Memory Device and Method for Fabricating the Same
Semiconductor Package Adapted for High-Speed Data Processing and Damage Prevention of Chips Packaged Therein and Method for Fabricating the Same
Method for Forming Hole Pattern
Non-Volatile Memory Device
Phase Change Memory Device Having 3 Dimensional Stack Structure and Fabrication Method Thereof
Method for Efficiently Driving a Phase Change Memory Device
Rfid Device
Signal Delay Circuit, Clock Transfer Control Circuit and Semiconductor Device Having the Same
Semiconductor Device
Gate Pattern of Semiconductor Device and Method for Fabricating the Same
Semiconductor Memory Device Having a Reduced Noise Interference
Semiconductor Memory Device Including a Write Driver to Output a Program Signal
Semiconductor Device with Vertical Gate and Method for Fabricating the Same
Semiconductor Memory Device, Memory System Including the Same, and Method for Adjusting Timing Between Internal Clock and Command
Method for Fabricating Semiconductor Device
Phase Change Memory Apparatus Having Global Bit Line and Method for Driving the Same
Phase Change Memory Device Capable of Reducing Disturbance and Method of Manufacturing the Same
Semiconductor Package and Stack Semiconductor Package Having the Same
Data I/O Control Signal Generating Circuit in a Semiconductor Memory Apparatus
Semiconductor Ic Having Electrical Fuse Capable of Preventing Thermal Diffusion
Semiconductor Memory Apparatus, and Circuit and Method for Controlling Faulty Address Therein
Semiconductor Circuit
Data Output Circuit of Semiconductor Memory and Related Method
External Signal Input Circuit of Semiconductor Memory
Phase Change Random Access Memory Device and Method of Manufacturing the Same
Electric Fuse Circuit and Method of Operating the Same
Semiconductor Package with Improved Size, Reliability, Warpage Prevention, and Heat Dissipation and Method for Manufacturing the Same
Output Driver Circuit
Semiconductor Memory Apparatus
Warpage Resistant Semiconductor Package and Method for Manufacturing the Same
Delay Circuit of Semiconductor Device
Method for Fabricating Semiconductor Device
Multi-Port Memory Device
Semiconductor Device
Data Output Control Circuit of a Double Data Rate (Ddr) Synchronous Semiconductor Memory Device Responsive to a Delay Locked Loop (Dll) Clock and Method Thereof
Determining and Using Dynamic Voltage Scaling Mode
Semiconductor Integrated Circuit
Phase Change Memory Device Having Dielectric Layer for Isolating Contact Structure Formed by Growth, Semiconductor Device Having the Same, and Methods for Manufacturing the Devices
Semiconductor Device with Bulb-Type Recessed Channel and Method for Fabricating the Same
Data Line Termination Circuit
Phase-Change Memory Device and Method of Fabricating the Same
Semiconductor Memory Apparatus Having Sense Amplifier
Voltage Generation Circuit
Semiconductor Memory Apparatus
Stacked Semiconductor Package and Method for Manufacturing the Same
Internal Voltage Generator
Phase-Change Memory Device Having Multiple Diodes
Semiconductor Device and Semiconductor System Including the Same
Semiconductor Chip to Dissipate Heat, Semiconductor Package Including the Same, and Stack Package Using the Same
Data Sensing Device Non-Volatile Memory
Ringback Circuit for Semiconductor Memory Device
Delay Locked Loop and Integrated Circuit Including the Same
Method for Manufacturing a Capacitor of a Semiconductor Device
Delay Locked Loop Circuit and Integrated Circuit Including the Same
Block Decoder of Semiconductor Memory Device
Semiconductor Memory Apparatus
Reference Voltage Generation Circuitary for Semiconductor Apparatus and Method for Checking a Reference Voltage
Circuit for Controlling an Enabling Time of an Internal Control Signal According to an Operating Frequency of a Memory Device and the Method Thereof
Semiconductor Package with Heat Dissipation Devices
On-Die Termination Circuit
Phase Change Memory Device in Which a Phase Change Layer Is Stably Formed and Prevented from Lifting and Method for Manufacturing the Same
Circuit for Controlling Redundancy in Semiconductor Memory Apparatus
Phase Change Memory Device and Method for Manufacturing the Same
Dll Circuit and Method of Controlling the Same
Method for Fabricating Storage Node of Semiconductor Device
Frequency Adjusting Apparatus and Dll Circuit Including the Same
Stacked Semiconductor Package and Method for Manufacturing the Same
Program Method of Semiconductor Memory Device
Semiconductor Memory Device
Control Voltage Generation Circuit and Non-Volatile Memory Device Including the Same
Integrated Circuit
Apparatus and Method for Transmitting/Receiving Signals at High Speed
Semiconductor Memory Device
Metal Line of Semiconductor Device Having a Diffusion Barrier with an Amorphous Tabn Layer and Method for Forming the Same
Calibrating Resistance for Integrated Circuit
Apparatus and Method for Compensating for Black Level
Non-Volatile Memory Device and Method for Fabricating the Same
Semiconductor Device Including Inner Interconnection Structure Able to Conduct Signals or Voltages in the Semiconductor Chip with Vertical Connection Vias and Horizontal Buried Conductive Lines
Nonvolatile Memory Device and Method of Operating the Same
Nonvolatile Memory Device
Memory System and Method of Operating the Same
Refresh Control Circuit, Memory Apparatus and Refresh Control Method Using the Same
Delay Locked Loop
Internal Voltage Generating Circuit
Delay Control Circuit and Semiconductor Memory Device Including the Same
Command Buffer Circuit of Semiconductor Apparatus
Stack Package Having Reduced Electrical Connection Length Suitable for High Speed Operations and Method of Manufacturing the Same
Semiconductor Memory Apparatus
Semiconductor Memory Apparatus Having a Pre-Discharging Function, Semiconductor Integrated Circuit Having the Same, and Method for Driving the Same
Address Delay Circuit of Semiconductor Memory Apparatus
Semiconductor Apparatus
Shift Circuit of a Semiconductor Device
Method for Correcting Critical Dimension of Phase Shift Mask and Method for Manufacturing the Same
Semiconductor Device Capable of Suppressing a Coupling Effect of a Test-Disable Transmission Line
Semiconductor Device and Method for Manufacturing the Same
Semiconductor Device and Method of Fabricating the Same
Memory Device and Method for Operating the Same
Flexible Semiconductor Package Apparatus Having a Responsive Bendable Conductive Wire Member and a Manufacturing the Same
Phase Change Memory Device to Prevent Thermal Cross-Talk and Method for Manufacturing the Same
Semiconductor Memory Apparatus
Delay Locked Loop
Semiconductor Package Having Through Electrodes That Reduce Leakage Current and Method for Manufacturing the Same
Semiconductor Memory System and Method for Driving the Same
Power-Up Signal Generating Circuit of Semiconductor Integrated Circuit
Semiconductor Memory Device Having Improved Erase Characteristic of Memory Cells and Erase Method Thereof
Readout Integrated Circuit for Infrared Signal and Method of Reading Out Infrared Signal
Semiconductor Memory Device Having a Floating Body Capacitor, Memory Cell Array Having the Same and Method of Manufacturing the Same
Nonvolatile Memory Device
Semiconductor Memory Device
Method for Fabricating Metal Pattern in Semiconductor Device
Semiconductor Memory Device Including Mode Register Set and Method for Operating the Same
Phase-Change Random Access Memory Device and Method of Manufacturing the Same
Nonvolatile Memory Apparatus and Write Control Method Thereof
Phase Change Random Access Memory and Method for Manufacturing the Same
Termination Control Circuit and Semiconductor Device Including the Same
Power-Up Signal Generation Circuit of Semiconductor Apparatus
Semiconductor Integrated Circuit and Data Read Method
Semiconductor Device and Testing Method Thereof
Semiconductor Device and Test Method with Boundary Scan
Internal Voltage Generation Circuit
Repair Method and Integrated Circuit Using the Same
System-In Package Including Semiconductor Memory Device and Method for Determining Input/Output Pins of System-in Package
Semiconductor Package Having Interposer with Openings Containing Conductive Layer
Semiconductor Memory Device Having Data Compression Test Cicuit
Memory and Test Method for Memory
Signal Delay Circuit
Phase-Change Random Access Memory Device and Method of Manufacturing the Same
Semiconductor Integrated Circuit Having Capacitor for Providing Stable Power and Method of Manufacturing the Same
Memory System
Emi Shielding Circuit and Semiconductor Integrated Circuit Including the Same
Semiconductor Memory Apparatus and Bit Line Equalizing Circuit
Nonvolatile Memory Device and Method of Programming the Device
Method of Manufacturing Semiconductor Device
Nonvolatile Memory Device and Method for Operating the Same
Current Control Circuit
Semiconductor Memory Device for Minimizing Mismatch of Sense Amplifier
Anti-Fuse Control Circuit
Data Alignment Circuit
Counting Circuit of Semiconductor Device and Duty Correction Circuit of Semiconductor Device Using the Same
Phase Change Memory Device Having Buried Conduction Lines Directly Underneath Phase Change Memory Cells and Fabrication Method Thereof
Phase Change Memory Device and Method of Manufacturing the Same
Semiconductor Memory Device
Semiconductor Device
Internal Negative Voltage Generation Device
Semiconductor Integrated Circuit
Semiconductor Memory Device for Improving Repair Efficiency
Semiconductor Memory Apparatus, and Set Program Control Circuit and Program Method Therefor
Buffer Circuit
Charge Trap Type Non-Volatile Memory Device and Method for Fabricating the Same
Delay Locked Loop
Apparatus and Method for Processing Intensity of Image in Digital Camera
Non-Volatile Memory Device and Method for Fabricating the Same
Semiconductor Package Having Substrate for High Speed Semiconductor Package
Non-Volatile Memory Device for Storing Write Data Having Different Logic Levels
Method for Fabricating Semiconductor Memory Device
Nonvolatile Memory Device
Method for Manufacturing a Semiconductor Device with a Bit Line Contact Hole
Method for Verifying Mask Pattern of Semiconductor Device
Patent:
44,221 →
Application:
13/507,529 →
Semiconductor Device with Buried Bit Lines and Method for Fabricating the Same
Signal Delay Circuit, Clock Transfer Control Circuit and Semiconductor Device Having the Same
Internal Voltage Generator and Semiconductor Memory Device Including the Same
Nonvolatile Memory Cell, Nonvolatile Memory Device and Method for Driving the Same
Nonvolatile Memory Cell, Nonvolatile Memory Device and Method for Driving the Same
Nonvolatile Memory Cell, Nonvolatile Memory Device and Method for Driving the Same
Related Assignments
(2)
Other recorded transfers of the patents in this record — the chain of ownership.
Change of Name
May 6, 2024
From: HYNIX-SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067328/0814 →
Corrective Assignment to Correct the Assignee Is Hynix Semiconductor Inc. Not Hynix-Semiconductor Inc. There Is No Hyphen in the Name. Previously Recorded on Reel 67328 Frame 814. Assignor(S) Hereby Confirms the Change of Name.
May 14, 2024
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067412/0482 →