IP Library Granted Patent US 7,729,196
Granted Patent B2
US 7,729,196 · App. 11/654,840 · Granted Jun 1, 2010

Apparatus and method for controlling enable time of signal controlling operation of data buses of memory device

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Quick Facts
Patent No.
US 7,729,196
App. No.
11/654,840
Granted
Jun 1, 2010
Kind
B2
Abstract

Disclosed is an apparatus for controlling an enable interval of a signal controlling an operation of data buses which connect a bit line sense amplifier with a data sense amplifier according to a variation of an operational frequency of a memory device. The apparatus comprises a pulse width control section for changing the pulse width of an input signal depending on the operational frequency of the memory device after receiving the input signal, a signal transmission section for buffering a signal outputted from the pulse width control section, and an output section for receiving a signal outputted from the signal transmission section so as to output a first signal for controlling the signal to control the operation of the data buses.

Claims (19)

1. A method for controlling an enable time of a signal controlling an operation of data buses of a memory device, the method comprising the steps of:

(a) generating a first signal having a first pulse width according to a burst operation command;

(b) generating N- 1 number of second signals having a second pulse width, in which N is a burst length;

(c) receiving the first signal and the second signals, detecting and receiving a clock signal of the memory device for modulating the pulse width output of the logically operated first signal and the second signals, and outputting third signals; and

(d) changing the pulse width of the signal controlling the operation of data buses that connect a bit line sense amplifier with a data sense amplifier using the logically operated third signals;

wherein the pulse width of the signal controlling the operation of the data buses is automatically changed according to a frequency of the clock signal.

2. The method as claimed in claim 1 , further comprising a step of additionally automatically controlling the pulse width of the third signal by using an address signal in step (c).

3. A method for controlling an enable time of signal controlling an operation of data buses of a memory device, the method comprising the steps of:

(a) receiving an input signal;

(b) detecting and receiving a clock signal provided to the memory device for modulating the pulse width output of the logically operated input signal, and outputting a first signal; and

(c) changing the pulse width of the signal controlling the operation of data buses that connect a bit line sense amplifier with a data sense amplifier by using the logically operated first signal.

4. The method as claimed in claim 3 , further comprising a step of additionally controlling the pulse width of the first signal by using an address signal in step (b).

5. A method for controlling an enable time of a signal controlling an operation of data buses of a memory device, the method comprising the steps of:

(a) generating a first signal in response to a burst operation command, the first signal having a first pulse width;

(b) generating and receiving the first signal to generate N- 1 number of second signals each second signal having a second pulse width such that the first and second signals form N strobe pulse signals in which each strobe pulse signal has a strobe pulse width, in which N is a burst length;

(c) receiving the N strobe pulse signals, a clock signal, a test mode signal and a plurality of address signals, and automatically changing the strobe pulse width of each strobe pulse signal as a function of the clock signal, the test mode signal and the address signals wherein

when not in a test mode induced by a first level of the test mode signal, changing the strobe pulse width of each strobe pulse signal as a function of the clock signal by controlling switching around and through various delay paths that the N strobe pulse signals traverse,

when in the test mode induced by a second level of the test mode signal, changing the pulse width of each strobe pulse signal as a function of the address signals by controlling switching around and through other delay paths that the N strobe pulse signals traverse; and

(d) controlling data bus operations that connects a bit line sense amplifier with a data sense amplifier using the logically operated N strobe pulse signals having the changed pulse widths.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE IS HYNIX SEMICONDUCTOR INC. NOT HYNIX-SEMICONDUCTOR INC. THERE IS NO HYPHEN IN THE NAME. PREVIOUSLY RECORDED ON REEL 67328 FRAME 814. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded May 14, 2024
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067412/0482 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 9, 2024
From: SK HYNIX INC.
To: MIMIRIP LLC
Reel/Frame 067369/0832 →
CHANGE OF NAME Recorded May 6, 2024
From: HYNIX-SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067328/0814 →