Repair fuse circuit for storing I/O repair information therein
View Patent ↗A repair fuse circuit includes an address comparator, and a plurality of I/O bus select bit output units. The address comparator outputs repair signals for selecting a redundant column that will replace a full column of a plurality of redundant columns according to a column address. The plurality of I/O bus select bit output units for outputting signals corresponding to respective bits of I/O bus repair signals for selecting an I/O bus to which the redundant column will be connected according to the repair signals.
1. A repair fuse circuit, comprising:
an address comparator to output repair signals for selecting a redundant column according to a column address, the redundant column being selected to replace a fail column and selected from a plurality of redundant columns; and
a plurality of I/O bus select bit output units to output signals corresponding to respective bits of I/O bus repair signals for selecting an I/O bus to which the redundant column is to be connected according to the repair signals.
2. The repair fuse circuit of claim 1 , wherein the address comparator outputs the repair signals corresponding to the redundant columns.
3. The repair fuse circuit of claim 2 , wherein the address comparator outputs a repair signal to select a redundant column that is to replace the fail column of the redundant columns, wherein the repair signal output to select the redundant column has a different logic level than remaining repair signals.
4. The repair fuse circuit of claim 1 , wherein a bit number of the I/O bus repair signal is the same as the number of the I/O bus select bit output unit.
5. The repair fuse circuit of claim 1 , wherein the I/O bus select bit output unit comprises:
a plurality of a switching elements operating according to the repair signals, respectively, and connected to a ground terminal in parallel;
a transistor connected to a power supply voltage terminal;
fuses, each connected between the transistor and one of the switching elements; and
an inverter to invert a voltage level of a node between the transistor and the fuses and apply the voltage level to a gate of the transistor.
6. The repair fuse circuit of claim 5 , wherein the fuses are installed as many as the number of redundant columns.
7. The repair fuse circuit of claim 5 , wherein an I/O bus to which a n th redundant column is to be connected is decided according to a cutting state of a n th fuse of the fuses.
8. The repair fuse circuit of claim 5 , further comprising a buffer connected to an output terminal of the inverter.
9. The repair fuse circuit of claim 5 , wherein the switching element comprises a NMOS transistor.
10. The repair fuse circuit of claim 5 , wherein the transistor comprises a PMOS transistor.