Band gap reference circuit and temperature information output apparatus using the same

1. A temperature information output apparatus, comprising:

a band gap reference (BGR) circuit configured to generate and output an internal voltage reference voltage which varies depending on a change in temperature and an analog temperature voltage corresponding to a change in semiconductor memory apparatus internal temperature using band gap characteristics;

an analog-to-digital converter (ADC) configured to convert the analog temperature voltage to digital temperature information in response to an activation a first control signal and initialize the digital temperature information in response to a second control signal, wherein the second control signal is a power up signal; and

a controller configured to activate the first control signal in response to an activation of at least one operation command.

2. The temperature information output apparatus as set forth in claim 1 , wherein the BGR circuit comprises:

a temperature-proportional current generating part configured to generate a current in proportion to a change in temperature through a plurality of current paths;

a temperature-inverse proportional current generating part configured to generate a current in inverse proportion to the change in temperature through a plurality of current paths;

an internal voltage reference voltage generating part configured to generate a reference voltage for an internal voltage using the current of the temperature-proportional current generating part and the current of the temperature-inverse proportional current generating part; and

a temperature voltage output part configured to output a voltage corresponding to a change in temperature.

3. The temperature information output apparatus as set forth in claim 2 , wherein the temperature-proportional current generating part comprises:

a first transistor group comprised of a plurality of transistors commonly coupled to a power source terminal;

a second transistor group comprised of a plurality of transistors coupled between some of the transistors of the first transistor group and a ground terminal, and having a negative temperature coefficient characteristic; and

a current controller configured to control the first transistor group using a voltage applied to the transistors of the second transistor group.

4. The temperature information output apparatus as set forth in claim 2 , wherein the temperature-inverse proportional current generating part comprises:

a plurality of transistors commonly coupled to a power source terminal; and

a current controller configured to control the plurality of transistors using a voltage according to a current which flows through one of the plurality of transistors and an internal voltage of the temperature-proportional current generating part.

5. The temperature information output apparatus as set forth in claim 2 , wherein the internal voltage reference voltage generating part comprises a resistor element commonly coupled to two current paths, one of the current paths being in the temperature-proportional current generating part and one of the current paths being in the temperature-inverse proportional current generating part, and the sum of the currents flowing through the two current paths varies according to the temperature.

6. The temperature information output apparatus as set forth in claim 2 , wherein the temperature voltage output part comprises:

a node from which the temperature voltage is output;

a transistor coupled between the node and a power source terminal;

a resistor coupled between the node and a ground terminal; and

a current controller configured to control the transistor using a voltage divided by the resistor and an internal voltage of the temperature-proportional current generating part.

7. The temperature information output apparatus as set forth in claim 1 , wherein the ADC comprises a counter,

wherein digital temperature information output from the counter is initialized in response to the second control signal.