IP Library Granted Patent US 7,414,876
Granted Patent B2
US 7,414,876 · App. 10/879,186 · Granted Aug 19, 2008

Nonvolatile ferroelectric memory device having power control function

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Quick Facts
Patent No.
US 7,414,876
App. No.
10/879,186
Granted
Aug 19, 2008
Kind
B2
Abstract

A nonvolatile ferroelectric memory device having a power control function improves a sensing margin by stably controlling a power applied to a cell capacitor. The sensing margin of a cell can be improved by controlling an operation voltage of the cell depending on an external supply voltage VEXT and applying a power voltage VCC obtained by dropping an external power voltage to adjacent circuits. Additionally, the reliability of a capacitor at a high voltage can be improved by employing a ferroelectric capcitor for stabilizing power to obtain capacitance of high capacity with a small area.

Claims (23)

1. A nonvolatile ferroelectric memory device having a power control function, comprising:

a voltage dropping unit for dropping an external power voltage to a predetermined level and supplying an internal power voltage;

a nonvolatile ferroelectric circuit unit having a hierarchical bit line structure including a plurality of sub bit lines connected to one of a plurality of main bit lines and including a first nonvolatile ferroelectric capacitor for reading/writing data depending on the internal power voltage, wherein a voltage of a sub bit line induced by cell data is converted into current by a current controller according to the voltage of the sub bit line so that a sensing voltage of a main bit line is induced;

a power stabilization unit including a second ferroelectric capacitor and a capacitor connected in parallel between the internal power voltage and a ground voltage for reducing noise from the internal power voltage applied from the voltage dropping unit to stabilize the internal power voltage;

a power-up detection reset unit for detecting the external power voltage level and generating a reset signal to initialize the nonvolatile ferroelectric circuit unit; and

a nonvolatile ferroelectric register unit, driven depending on the external power voltage, for storing cell data in a nonvolatile memory cell, wherein the nonvolatile ferroelectric register unit comprises:

a pull-up regulating unit for selectively supplying the external power voltage in response to a pull-up enable signal;

a pull-down regulating unit for selectively supplying a ground voltage to the nonvolatile memory cell in response to a pull-down enable signal; and

the nonvolatile memory cell for storing the cell data depending on the external power voltage applied from the pull-up regulating unit, wherein the nonvolatile memory cell comprises:

a pull-up latch unit having a cross-coupled structure for latching the external power voltage applied from the pull-up regulating unit;

a write/read port selecting unit for selectively connecting an internal bit line to nodes at both output terminals in response to a word line driving signal, and controlling a write operation;

a ferroelectric capacitor unit, connected to the node at both output terminals, for storing the cell data into a plurality of third nonvolatile ferroelectric capacitors in response to a cell plate signal; and

a pull-down latch unit having a cross-coupled structure for latching the ground voltage applied from the pull-down regulating unit.

2. The nonvolatile ferroelectric memory device according to claim 1 , wherein the reset signal is activated when the external power voltage reaches the predetermined level.

3. The nonvolatile ferroelectric memory device according to claim 1 , wherein the voltage dropping unit comprises:

a voltage dropping driving unit, including a plurality of voltage dropping means serially connected between the external power voltage and the internal power voltage terminal; and

a switching unit for selectively using the plurality of voltage dropping means.

4. The nonvolatile ferroelectric memory device according to claim 3 , wherein the plurality of voltage dropping means each includes PN diode devices.

5. The nonvolatile ferroelectric memory device according to claim 3 , wherein the switching unit comprises a plurality of switches which are connected in parallel to the plurality of voltage dropping means, wherein the plurality of switches each selectively couples to the both terminals of the corresponding voltage dropping means.

6. The nonvolatile ferroelectric memory device according to claim 1 , wherein the nonvolatile ferroelectric circuit unit comprises:

a main bit line load control unit for controlling load of the main bit line depending on selective supply of the internal power voltage; and

a plurality of sub cell arrays each having a plurality of nonvolatile cells, wherein the plurality of nonvolatile cells each includes-the first nonvolative ferroelectric capacitor.

7. The nonvolatile ferroelectric memory device according to claim 1 , wherein the capacitor includes an NMOS gate MOS capacitor.

Assignments (4)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE IS HYNIX SEMICONDUCTOR INC. NOT HYNIX-SEMICONDUCTOR INC. THERE IS NO HYPHEN IN THE NAME. PREVIOUSLY RECORDED ON REEL 67328 FRAME 814. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded May 14, 2024
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067412/0482 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 9, 2024
From: SK HYNIX INC.
To: MIMIRIP LLC
Reel/Frame 067369/0832 →
CHANGE OF NAME Recorded May 6, 2024
From: HYNIX-SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067328/0814 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 30, 2004
From: KANG, HEE BOK
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015529/0609 →