Semiconductor memory device capable of reducing noise during operation thereof
View Patent ↗Disclosed is a semiconductor memory device which is capable of reducing noise during an operation thereof by individually supplying clamping voltages to respective banks. The semiconductor memory device includes: a plurality of banks; a plurality of clamping voltage supply units corresponding to the plurality of banks, for supplying clamping voltages to the corresponding banks, in which the clamping voltages are obtained by clamping an external power supply voltage to a predetermined level; and a clamping voltage control units for controlling the plurality of clamping voltage supply units to allow the corresponding clamping voltages to be supplied to selected banks while the selected banks are activated.
1. A semiconductor memory device comprising:
a plurality of banks;
a plurality of clamping voltage supply means, corresponding to the plurality of banks, for supplying clamping voltages to the corresponding banks wherein a value of the clamping voltages is equal to subtracting a threshold voltage from the level of a corresponding champing control signal; and
a clamping voltage control means for outputting the clamping control signals at a Vpp level to allow the corresponding clamping voltages to be supplied to selected banks while the selected banks are activated, wherein the Vpp level is higher than the value of a core voltage used as an operating voltage of the banks.
2. The semiconductor memory device as recited in claim 1 , wherein the clamping voltage supply means is provided with a MOS transistor having one terminal receiving the power supply voltage, a gate receiving the clamping control signal from the clamping voltage control means, and the other terminal supplying the clamping voltage to the corresponding bank.
3. The semiconductor memory device as recited in claim 1 , wherein the clamping voltage control means includes:
a plurality of delay units for delaying a plurality of bank enable signals for a predetermined time and outputting the delayed bank enable signals, the plurality of bank enable signals being enabled during a period when the plurality of banks are activated; and
a plurality of level shifters corresponding to the plurality of delay units, for shifting a level of the power supply voltage to a level of the clamping control signal and supplying the shifted signal to the plurality of clamping voltage supply means, and for receiving outputs of the plurality of delay units to interrupt the clamping control signals.
4. The semiconductor memory device as recited in claim 3 , wherein the level shifter includes:
a first MOS transistor having one terminal connected to a voltage supply terminal having a level of the clamping control signal, the other terminal connected to a first node, and a gate connected to a second node;
a second MOS transistor having one terminal connected to the voltage supply terminal, the other terminal connected to the second node, and a gate connected to the first node;
a third MOS transistor having a gate receiving the power supply voltage, one terminal connected to the first node, and the other terminal connected to an output terminal of the corresponding delay unit among the plurality of delay units; and
a fourth MOS transistor having a gate connected to the output terminal of the first delay, one terminal connected to the second node, and the other terminal connected to the ground voltage, the clamping control signal being outputted through the second node.
5. The semiconductor memory device as recited in claim 4 , wherein the delay unit includes:
a first inverter for inverting the bank enable signal;
a delay element for delaying an output of the first inverter for a predetermined time;
a NAND gate for receiving the bank enable signal and an output of the delay element; and
a second inverter for inverting an output of the NAND gate to output the inverted signal to the gate of the fourth MOS transistor of the corresponding level shifter.