IP Library Granted Patent US 9,019,781
Granted Patent B2
US 9,019,781 · App. 13/336,875 · Granted Apr 28, 2015

Internal voltage generation circuit

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Quick Facts
Patent No.
US 9,019,781
App. No.
13/336,875
Granted
Apr 28, 2015
Kind
B2
Abstract

An internal voltage generation circuit includes: a selection unit configured to select one of first and second reference voltages as a selection reference voltage in response to a self refresh signal and a power-down mode signal and output the selection reference voltage; a driving signal generation unit configured to compare the selection reference voltage with a negative word line voltage applied to an unselected word line and generate a driving signal; and a driving unit configured to change the negative word line voltage in response to the driving signal.

Claims (22)

1. An internal voltage generation circuit comprising:

a selection unit configured to select one of first and second reference voltages as a selection reference voltage in response to a self refresh signal and a power-down mode signal and output the selection reference voltage;

a driving signal generation unit configured to compare the selection reference voltage with a negative word line voltage applied to an unselected word line and generate a driving signal; and

a driving unit configured to change the negative word line voltage in response to the driving signal,

wherein the selection unit comprises a selection signal generation section configured to generate a selection signal enabled in a self refresh mode or in a power-down mode, a first transmission gate configured to transmit the first reference voltage as the selection reference voltage, and a second transmission gate configured to transmit the second reference voltage as the selection reference voltage.

2. The internal voltage generation circuit of claim 1 , wherein the driving unit is configured to drive the negative word line voltage to a back bias voltage lower than a ground voltage, in response to the driving signal.

3. The internal voltage generation circuit of claim 1 , wherein the selection unit outputs the first reference voltage having a higher level than the second reference voltage as the selection reference voltage, when the internal voltage generation circuit enters the self refresh mode according to the self refresh signal or enters the power-down mode according to the power-down mode signal.

4. The internal voltage generation circuit of claim 1 , wherein the driving signal generation unit generates the driving signal which is enabled when the negative word line voltage has a higher level than the selection reference voltage.

5. The internal voltage generation circuit of claim 1 , further comprising a pumping circuit configured to compare the back bias voltage with a pumping reference voltage and pump the back bias voltage.

6. The internal voltage generation circuit of claim 5 , wherein the pumping circuit comprises:

a comparison section configured to compare the back bias voltage with the pumping reference voltage and generate a detection signal;

an oscillator configured to generate a periodic signal in response to the detection signal; and

a charge pump configured to pump the back bias voltage in response to the periodic signal.

7. The internal voltage generation circuit of claim 6 , wherein the comparison section generates the detection signal having a preset period when the back bias voltage has a higher level than the pumping reference voltage.

8. An internal voltage generation circuit comprising:

a selection unit configured to select one of first and second reference voltages as a selection reference voltage in response to a self refresh signal and a power-down mode signal and output the selection reference voltage;

a comparison unit configured to compare the selection reference voltage with a negative word line voltage applied to an unselected word line and generate a detection signal;

an oscillator configured to generate a periodic signal in response to the detection signal; and

a charge pump configured to pump the negative word line voltage in response to the periodic signal,

wherein the selection unit comprises a selection signal generation section configured to generate a selection signal enabled in a self refresh mode or in a power-down mode, a first transmission gate configured to transmit the first reference voltage as the selection reference voltage, and a second transmission gate configured to transmit the second reference voltage as the selection reference voltage.

9. The internal voltage generation circuit of claim 8 , wherein the selection unit outputs the first reference voltage having a higher level than the second reference voltage as the selection reference voltage, when the internal voltage generation circuit enters the self refresh mode according to the self refresh signal or enters the power-down mode according to the power-down mode signal.

10. The internal voltage generation circuit of claim 8 , wherein the comparison unit generates the detection signal which is enabled when the negative word line voltage has a higher level than the selection reference voltage.

Assignments (4)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE IS HYNIX SEMICONDUCTOR INC. NOT HYNIX-SEMICONDUCTOR INC. THERE IS NO HYPHEN IN THE NAME. PREVIOUSLY RECORDED ON REEL 67328 FRAME 814. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded May 14, 2024
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067412/0482 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 9, 2024
From: SK HYNIX INC.
To: MIMIRIP LLC
Reel/Frame 067369/0832 →
CHANGE OF NAME Recorded May 6, 2024
From: HYNIX-SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067328/0814 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 23, 2011
From: KIM, KEUN KOOK
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 027443/0416 →