IP Library Granted Patent US 7,349,290
Granted Patent B2
US 7,349,290 · App. 11/323,687 · Granted Mar 25, 2008

Semiconductor memory device

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Quick Facts
Patent No.
US 7,349,290
App. No.
11/323,687
Granted
Mar 25, 2008
Kind
B2
Abstract

A semiconductor memory device is provided. The semiconductor memory device includes: a first input/output control unit for changing a sensing node into a first level in response to an activation of a first enabling signal for enabling an output of a data synchronized with a rising edge of a clock signal; a second input/output control unit for changing the sensing node into a second level in response to a delay locked clock signal as the second input/output control unit is enabled when the first enabling signal and a second enabling signal for enabling an output of a data synchronized with a falling edge of the clock signal are disabled; an output unit for outputting an input/output control signal; and a data output driver for outputting a data as the data output driver is activated in response to a first level of the input/output control signal.

Claims (28)

1. A semiconductor memory device outputting data synchronized with a rising edge and a falling edge of a clock signal, the semiconductor memory device comprising:

a first input/output control unit for changing a sensing node into a first level in response to an activation of a first enabling signal for enabling an output of a data synchronized with a rising edge of the clock signal;

a second input/output control unit for changing the sensing node into a second level in response to a delay locked clock signal outputted from a delay locked loop as the second input/output control unit is enabled when the first enabling signal and a second enabling signal for enabling an output of a data synchronized with a falling edge of the clock signal are disabled;

an output unit for outputting an input/output control signal corresponding to a changed state of the sensing node; and

a data output driver for outputting a data as the data output driver is activated in response to a first level of the input/output control signal.

2. The semiconductor memory device of claim 1 , further including a data input buffer transmitting data as the data input buffer is activated in response to a second level of the input/output control signal.

3. The semiconductor memory device of claim 1 , wherein the first input/output control unit includes:

a first buffer and a second buffer buffering the first enabling signal and transmitting the buffered first enabling signal; and

a first metal oxide semiconductor (MOS) transistor pulling down the sensing node in response to an output of the first and second buffers.

4. The semiconductor memory device of claim 3 , wherein the second input/output control unit includes:

a NOR gate receiving the first enabling signal and the second enabling signal;

a NAND gate receiving an output of the NOR gate and the delay locked clock signal; and

a second MOS transistor pulling up the sensing node in response to an output of the NAND gate.

5. The semiconductor memory device of claim 4 , wherein the output unit includes:

a first latching device and a second latching device latching a signal from the sensing node; and

an inverter inverting the latched signal and outputting the inverted signal.

6. The semiconductor memory device of claim 1 wherein the data output by the data output driver is transmitted from a memory core region.

7. A semiconductor memory device outputting data synchronized with a rising edge and a falling edge of a DLL clock signal, comprising:

a control signal generator for generating an output data controlling signal in response to a DLL clock signal, a first enabling signal and a second enabling signal,

wherein the first enabling signal is for enabling an output of a first output data synchronized with a falling edge of the clock signal and a second enabling signal is for enabling an output of a second output data synchronized with a rising edge of the clock signal; and

a data output driver for outputting data in response to the output data controlling signal,

wherein the output data controlling signal is inactivated in response to a first clocking of the DLL clock after the first enabling signal and the second enabling signal are inactivated.

8. The semiconductor memory device of claim 7 , further including a data input buffer activated in response to a logic level of the output data controlling signal.

9. The semiconductor memory device of claim 7 , the control signal generator includes;

a first logic combination unit for outputting a logic output in response to an activation of the first enabling signal and the second enabling signal;

a second logic combination unit for changing a sensing node into a first logic level in response to an activation of the logic output;

a third logic combination unit for changing the sensing node into a second logic level in response to an activation of the second enabling signal; and

a fourth logic combination unit for outputting the output data controlling signal having a logic level corresponding to a changed state of the sensing node.

Assignments (4)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE IS HYNIX SEMICONDUCTOR INC. NOT HYNIX-SEMICONDUCTOR INC. THERE IS NO HYPHEN IN THE NAME. PREVIOUSLY RECORDED ON REEL 67328 FRAME 814. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded May 14, 2024
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067412/0482 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 9, 2024
From: SK HYNIX INC.
To: MIMIRIP LLC
Reel/Frame 067369/0832 →
CHANGE OF NAME Recorded May 6, 2024
From: HYNIX-SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067328/0814 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 30, 2005
From: HA, SUNG-JOO; CHO, HO-YOUB
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 017431/0358 →