IP Library Granted Patent US 7,710,817
Granted Patent B2
US 7,710,817 · App. 11/819,803 · Granted May 4, 2010

Semiconductor memory device having a delay locked loop (DLL) and method for driving the same

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Quick Facts
Patent No.
US 7,710,817
App. No.
11/819,803
Granted
May 4, 2010
Kind
B2
Abstract

A semiconductor memory device includes: a modulation controller for generating a modulation control signal for controlling a frequency modulation operation; a delay locked loop (DLL) circuit for performing a delay locking operation to generate first and second DLL clocks and outputting a frequency-modulated DLL clock in response to the modulation control signal; and a data strobe signal generator for outputting the frequency-modulated DLL clock as a data strobe signal.

Claims (46)

1. A semiconductor memory device, comprising:

a modulation controller for generating a modulation control signal for controlling a frequency modulation operation;

a delay locked loop (DLL) circuit for performing a delay locking operation to generate first and second DLL clocks and outputting a frequency-modulated DLL clock in response to the modulation control signal; and

a data strobe signal generator for outputting the frequency-modulated DLL clock as a data strobe signal.

2. The semiconductor memory device as recited in claim 1 , wherein the DLL circuit includes:

a clock input buffer for buffering a clock signal to output a reference clock;

a first phase comparator for comparing a phase of the reference clock with a phase of a first feedback clock;

a first delay circuit for delaying the reference clock by a delay value corresponding to the result of comparison of the first phase comparator to output a first DLL clock;

a first delay model for delaying an output signal of the first delay circuit by a model value to output the first feedback clock;

a second phase comparator for comparing a phase of the reference clock with a phase of a second feedback clock;

a second delay circuit for delaying the reference clock by a delay value corresponding to the comparison result of the second phase comparator and inverting the delayed reference clock to output a second DLL lock; and

a second delay model for delaying an output signal of the second delay circuit by a model value to output the second feedback clock.

3. The semiconductor memory device as recited in claim 2 , wherein the modulation controller includes:

a divider for dividing the clock signal to output a divided clock signal; and

a decoder for decoding the divided clock signal to output the modulation control signal.

4. The semiconductor memory device as recited in claim 3 , wherein the divider includes:

a shift register for transferring an input signal as an output signal in response to a predetermined number of transitions of the clock signal; and

an inverter for inverting the output signal of the shift register to output the inverted signal as the input signal of the shift register,

wherein the output signal of the shift register is outputted to the decoder.

5. The semiconductor memory device as recited in claim 4 , wherein the shift register includes:

a first transfer gate for transferring the input signal in response to a first transition of the clock signal;

a first latch for latching an output signal of the first transfer gate in response to a second transition of the clock signal;

a second transfer gate for transferring the latched signal of the first latch in response to the second transition of the clock signal; and

a second latch for latching an output signal of the second transfer gate in response to the first transition of the system clock.

6. The semiconductor memory device as recited in claim 2 , wherein the DLL circuit further comprises a duty corrector for correcting duty ratios of the first and second DLL clocks outputted from the first and second delay circuits to output the corrected first and second DLL clocks to the data strobe signal generator.

7. The semiconductor memory device as recited in claim 6 , wherein the duty corrector includes:

a duty-correction mixer for mixing the output signals of the first and second delay circuits in response to a duty correction control signal and the modulation control signal outputted from the modulation controller;

a dummy duty-correction mixer for mixing the output signals of the first and second delay circuits in response to the duty-correction control signal;

a duty-correction phase comparator for comparing a phase of the output signal of the first delay circuit with a phase of the output signal of the second delay circuit; and

a mixer controller for generating the duty-correction control signal in response to the phase comparison result of the duty-correction phase comparator.

8. The semiconductor memory device as recited in claim 7 , wherein the duty-correction mixer includes:

a plurality of first inverters arranged in parallel to invert the output signal of the first delay circuit in response to the duty-correction control signal;

a plurality of second inverters arranged in parallel to invert the output signal of the first delay circuit in response to the modulation control signal;

a plurality of third inverters arranged in parallel to invert the output signal of the second delay circuit in response to the duty-correction control signal;

a plurality of fourth inverters arranged in parallel to invert the output signal of the second delay circuit in response to the modulation control signal; and

a fifth inverter for inverting the output signals of the first to fourth inverters.

9. A method for driving a semiconductor memory device, comprising:

generating a frequency modulation control signal;

performing a delay locking operation to generate a delay locked loop (DLL) clock modulated in response to the frequency modulation control signal; and

outputting the modulated DLL clock as a data strobe signal.

10. The method as recited in claim 9 , wherein the generating of the frequency modulation control signal includes:

dividing a clock signal to output a divided clock signal; and

decoding the divided clock signal to generate the frequency modulation control signal.

11. The method as recited in claim 10 , wherein the outputting of the modulated DLL clock includes:

performing the delay locking operation to generate the DLL clock; and

correcting a duty ratio of the DLL clock and frequency-modulating the DLL clock in response to the frequency modulation control signal.

Assignments (4)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE IS HYNIX SEMICONDUCTOR INC. NOT HYNIX-SEMICONDUCTOR INC. THERE IS NO HYPHEN IN THE NAME. PREVIOUSLY RECORDED ON REEL 67328 FRAME 814. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded May 14, 2024
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067412/0482 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 9, 2024
From: SK HYNIX INC.
To: MIMIRIP LLC
Reel/Frame 067369/0832 →
CHANGE OF NAME Recorded May 6, 2024
From: HYNIX-SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067328/0814 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 29, 2007
From: KIM, KYOUNG-NAM; SHIN, YOON-JAE
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 019539/0772 →