IP Library Granted Patent US 7,936,207
Granted Patent B2
US 7,936,207 · App. 12/343,946 · Granted May 3, 2011

Internal voltage generator

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,936,207
App. No.
12/343,946
Granted
May 3, 2011
Kind
B2
Abstract

An internal voltage generating circuit includes an internal voltage generating unit configured to generate an internal voltage that corresponds to a target voltage level by driving an internal voltage terminal with an external power supply voltage, and current sinking unit configured to adjust leakage current introduced to the internal voltage terminal in response to the external power supply voltage.

Claims (24)

1. An internal voltage generating circuit, comprising:

an internal voltage generating unit configured to generate an internal voltage by driving an internal voltage terminal with an external power supply voltage; and

a current sinking unit configured to adjust, in response to the external power supply voltage, which is permanently applied to the current sinking unit, leakage current at the internal voltage terminal;

wherein the current sinking unit is enabled in response to the internal voltage being higher than a target voltage level.

2. The internal voltage generating circuit of claim 1 , wherein the internal voltage is a core voltage.

3. The internal voltage generating circuit of claim 1 , wherein the current sinking unit includes:

a sinking current control unit configured to control, in response to the external power supply voltage, current sunken through the sinking current control unit; and

an operation timing control unit configured to control a discharging timing of the current sunken through the sinking current control unit.

4. The internal voltage generating circuit of claim 3 , wherein the operation timing control unit is connected between the internal voltage terminal and the sinking current control unit and is provided with at least one first MOS transistor.

5. The internal voltage generating circuit of claim 3 , wherein the operation timing control unit has a threshold voltage corresponding to the target voltage level.

6. The internal voltage generating circuit of claim 1 , wherein a current sunken through the current sinking unit is sunken to a ground voltage terminal.

7. The internal voltage generating circuit of claim 4 , wherein the internal voltage generating unit includes:

a voltage comparing unit configured to compare a reference voltage that corresponds to the target voltage level with a feedback voltage;

a driving unit configured to drive the internal voltage terminal with the external power supply voltage in response to an output signal of the voltage comparing unit; and

a voltage dividing unit configured to generate the feedback voltage by dividing the internal voltage.

8. The internal voltage generating circuit of claim 7 , wherein the driving unit is connected between an external power supply voltage terminal and the internal voltage terminal and is provided with a second MOS transistor controlled by the output signal of the voltage comparing unit.

9. The internal voltage generating circuit of claim 8 , wherein the at least one first MOS transistor and the second MOS transistor have the same physical characteristics in response to processing variations.

10. The internal voltage generation circuit of claim 1 , wherein the current sinking unit includes a plurality of diode-connected transistors and a MOS transistor that is connected between the plurality of diode-connected transistors and a ground voltage terminal and has a gate electrode coupled to the external power supply voltage.

11. A method of providing an internal voltage from an internal voltage generation circuit comprising:

using an output of a comparator to drive a current source coupled to an internal voltage terminal, wherein the comparator compares a reference voltage with a feedback voltage, and the comparator and current source output the internal voltage at the internal voltage terminal;

using a voltage divider coupled to the internal voltage terminal to divide the internal voltage and provide the feedback voltage; and

sinking leakage current sourced through the current source by using a diode chain and a transistor, wherein the transistor is coupled between the diode chain and a ground voltage terminal and has a gate electrode coupled to an external power supply voltage, which is permanently applied to the transistor.

12. The method of claim 11 , wherein the diode chain has a plurality of PMOS transistors that are connected in series.

13. The method of claim 11 , wherein the transistor turns on as the external power supply voltage is increased and the diode chain starts to conduct when the internal voltage becomes greater than the reference voltage.

Assignments (4)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE IS HYNIX SEMICONDUCTOR INC. NOT HYNIX-SEMICONDUCTOR INC. THERE IS NO HYPHEN IN THE NAME. PREVIOUSLY RECORDED ON REEL 67328 FRAME 814. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded May 14, 2024
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067412/0482 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 9, 2024
From: SK HYNIX INC.
To: MIMIRIP LLC
Reel/Frame 067369/0832 →
CHANGE OF NAME Recorded May 6, 2024
From: HYNIX-SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067328/0814 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 24, 2008
From: IM, JAE-HYUK
To: HYNIX SEMICONDUCTOR, INC.
Reel/Frame 022044/0359 →