IP Library Granted Patent US 7,579,846
Granted Patent B2
US 7,579,846 · App. 11/647,390 · Granted Aug 25, 2009

Offset voltage measuring apparatus

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Quick Facts
Patent No.
US 7,579,846
App. No.
11/647,390
Granted
Aug 25, 2009
Kind
B2
Abstract

An offset voltage measuring apparatus includes an offset voltage measuring unit including a plurality of measurement nodes having a current variation in response to a feedback voltage. An offset voltage amplifying unit outputs an output voltage amplified in response to an output signal of the offset voltage measuring unit, changes feedback voltage in response to a change in the output voltage and feeds back the feedback voltage to the offset voltage measuring unit.

Claims (65)

1. An offset voltage measuring apparatus comprising:

an offset voltage measuring unit including a plurality of measurement nodes having a current variation in response to a first feedback voltage and a second feedback voltage; and

an offset voltage amplifying unit to output an output voltage amplified in response to an output signal of the offset voltage measuring unit, to generate and adjust the first and second feedback voltages in response to a change in the output voltage, and to feed back the adjusted feedback voltages to the offset voltage measuring unit, the offset voltage amplifying unit comprises:

a switching circuit receiving an external power supply voltage and outputting the output voltage in response to the output signal;

a first feedback voltage generator connected between the switching circuit and a ground voltage, and outputting the first feedback voltage; and

a second feedback voltage generator connected in parallel with the first feedback voltage generator between the switching circuit and ground, and outputting the second feedback voltage.

2. The apparatus as set forth in claim 1 , wherein the offset voltage measuring unit comprises:

a current mirror to enable the same current to flow through the measurement nodes;

a measurement node circuit connected to the current mirror; and

a driver connected to the measurement node circuit to receive a driving signal.

3. The apparatus as set forth in claim 2 , wherein at least one measurement node is connected with a measuring device.

4. The apparatus as set forth in claim 1 , wherein the offset voltage measuring unit comprises a differential amplifier.

5. The apparatus as set forth in claim 1 , wherein the first feedback voltage generator changes and outputs the first feedback voltage by a predetermined level in response to the change in the output voltage.

6. The apparatus as set forth in claim 2 , wherein the measurement node circuit comprises:

first and second measurement nodes connected with the current mirror; and

third and fourth measurement nodes connected with the driver.

7. The apparatus as set forth in claim 6 , further comprising

a first measuring device connected to the first and third measurement nodes.

8. The apparatus as set forth in claim 7 , further comprising:

a second measuring device connected to the second and fourth measurement nodes.

9. The apparatus as set forth in claim 8 , wherein at least one of the first and second measuring device includes a transistor.

10. The apparatus as set forth in claim 9 , wherein the current mirror comprises:

a first PMOS transistor having a gate terminal, a source terminal connected to an external power supply voltage, and a drain terminal connected with the first measurement node; and

a second PMOS transistor having a source terminal connected to the external power supply voltage, a drain terminal connected with the second measurement node, and a gate terminal connected with the second measurement node and the gate terminal of the first PMOS transistor.

11. The apparatus as set forth in claim 10 , wherein the driver comprises:

a first NMOS transistor having a gate terminal receiving a driving signal,

a drain terminal connected to the third and fourth measurement nodes; and

a source terminal connected to a ground voltage terminal.

12. The apparatus as set forth in claim 9 , wherein the first measuring device includes an NMOS transistor having:

a gate terminal receiving the first feedback voltage;

a drain terminal connected to the first measurement node; and

a source terminal connected to the third measurement node.

13. The apparatus as set forth in claim 9 , wherein the second measuring device includes an NMOS transistor having:

a gate terminal receiving the second feedback voltage;

a drain terminal connected to the second measurement node; and

a source terminal connected to the fourth measurement node.

14. The apparatus as set forth in claim 5 , wherein the second feedback voltage generator changes and outputs the second feedback voltage by a value that exceeds the predetermined level in response to the change in the output voltage.

15. The apparatus as set forth in claim 14 , wherein the switching circuit comprises a PMOS transistor having:

a gate terminal to receive the output signal; and

a source terminal connected to the external power supply voltage.

16. The apparatus as set forth in claim 15 , wherein the first feedback voltage generator comprises:

a first resistive device connected to the drain terminal of the PMOS transistor; and

a first transistor having a diode configuration and connected between the first resistive device and the ground voltage terminal.

17. The apparatus as set forth in claim 16 , wherein the second feedback voltage generator comprises:

a second resistive device connected to the drain terminal of the PMOS transistor;

a third resistive device connected in series with the second resistive device; and

a second transistor having a diode configuration and connected between the third resistive device and the ground voltage terminal.

18. The apparatus as set forth in claim 17 , wherein the first and second resistive devices have the same resistance values.

19. The apparatus as set forth in claim 18 , wherein the first feedback voltage is output from a connecting terminal of the first restive device and the first transistor.

20. The apparatus as set forth in claim 19 , wherein the second feedback voltage is output from a connecting terminal of the second and third resistive devices.

21. The apparatus as set forth in claim 20 , wherein at least one of the first and second transistor includes a bipolar junction transistor.

22. An offset voltage measuring apparatus comprising:

an offset voltage measuring unit including a plurality of measurement nodes having a current variation in response to first and second feedback voltages; and

an offset voltage amplifying unit to output an output voltage with a voltage variation based on an amplification of a differential voltage between the first and second feedback voltages in response to an output signal of the offset voltage measuring unit,

wherein the offset voltage measuring unit comprises a current mirror to facilitate the same current to flow through the measurement nodes, a measurement node circuit connected to the current mirror; and a driver connected to the measurement node circuit to receive a driving signal.

23. The apparatus as set forth in claim 22 , wherein the offset voltage amplifying unit comprises:

a switching circuit to receive an external power supply voltage and output the output voltage based on a change in the output signal;

a first feedback voltage generator connected between the switching circuit and a ground voltage to output the first feedback voltage; and

a second feedback voltage generator connected in parallel with the first feedback voltage generator between the switching circuit and a ground voltage terminal to output the second feedback voltage.

24. The apparatus as set forth in claim 22 , wherein the offset voltage amplifying unit outputs the first and second feedback voltages in response to a change in the output voltage.

25. The apparatus as set forth in claim 23 , wherein the first feedback voltage generator changes and outputs the first feedback voltage by a predetermined level in response to the change in the output voltage.

26. The apparatus as set forth in claim 22 , further comprising:

first and second measurement devices each connected to a corresponding measurement node.

27. The apparatus as set forth in claim 22 , wherein the offset voltage measuring unit has a configuration of a differential amplifier.

28. The apparatus as set forth in claim 25 , wherein the second feedback voltage generator changes and outputs the second feedback voltage by a value that exceeds the predetermined level in response to the change in the output voltage.

Assignments (6)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 12, 2024
From: SK HYNIX INC.
To: MIMIRIP LLC
Reel/Frame 067712/0001 →
CHANGE OF NAME Recorded Jun 12, 2024
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067712/0465 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE IS HYNIX SEMICONDUCTOR INC. NOT HYNIX-SEMICONDUCTOR INC. THERE IS NO HYPHEN IN THE NAME. PREVIOUSLY RECORDED ON REEL 67328 FRAME 814. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded May 14, 2024
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067412/0482 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 9, 2024
From: SK HYNIX INC.
To: MIMIRIP LLC
Reel/Frame 067369/0832 →
CHANGE OF NAME Recorded May 6, 2024
From: HYNIX-SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067328/0814 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 29, 2006
From: RHO, KWANG-MYOUNG
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 018760/0721 →