Semiconductor memory device having wafer burn-in test mode
View Patent ↗A semiconductor memory device includes an enable signal generator configured to generate an enable signal in response to a plurality of burn-in test signals; a test mode signal generator configured to generate a plurality of peripheral region test mode signals and a plurality of core region test mode signals corresponding to the burn-in test signals in response to the enable signal; a core region controller configured to control circuits in a core region in response to the core region test mode signals; and a peripheral region controller configured to control circuits in a peripheral region in response to the peripheral region test mode signals.
1. A semiconductor memory device, comprising:
an enable signal generator configured to generate an enable signal in response to any one of a plurality of burn-in test signals;
a test mode signal generator configured to generate a plurality of peripheral region test mode signals and a plurality of core region test mode signals corresponding to the burn-in test signals in response to the enable signal;
a core region controller configured to control circuits in a core region in response to the core region test mode signals; and
a peripheral region controller configured to control circuits in a peripheral region in response to the peripheral region test mode signals.
2. The semiconductor memory device as recited in claim 1 , further comprising a path selector configured to output signals, received through a plurality of pads, as the burn-in test signals through corresponding paths upon entry into a wafer burn-in mode.
3. The semiconductor memory device as recited in claim 1 , wherein the enable signal is activated for a predetermined period in response to an activation point of at least one of the burn-in test signals.
4. The semiconductor memory device as recited in claim 1 , wherein the enable signal generator comprises:
a signal input unit configured to receive the burn-in test signals to output a signal reflecting an activation point of at least one of the burn-in test signals; and
a pulse generator configured to generate the enable signal with a pulse width corresponding to the predetermined period in response to the output signal of the signal input unit.
5. The semiconductor memory device as recited in claim 4 , wherein the pulse generator comprises:
a delay unit configured to delay the output signal of the signal input unit by the predetermined period; and
an output unit configured to output the enable signal in response to the output signal of the delay unit and the output signal of the signal input unit.
6. The semiconductor memory device as recited in claim 1 , wherein the test mode signal generator comprises:
a decoding unit configured to decode the burn-in test signals to generate a plurality of decoding signals;
a core region test mode signal output unit configured to output the core region test mode signal in response to the decoding signal corresponding to the core region; and
a peripheral region test mode signal output unit configured to output the peripheral region test mode signal in response to the decoding signal corresponding to the peripheral region.
7. The semiconductor memory device as recited in claim 6 , further comprising a delay unit configured to delay the enable signal by a time margin taken to output the burn-in test signals through the decoding unit.
8. The semiconductor memory device as recited in claim 1 , wherein the core region controller and the peripheral region controller are driven in a wafer burn-in mode.
9. A semiconductor memory device, comprising:
an enable signal generator configured to generate an enable signal in response to any one a plurality of burn-in test signals;
a decoding unit configured to decode the burn-in test signals to generate a plurality of decoding signals;
a core region test mode signal output unit configured to operate in response to the enable signal and to output a plurality of core region test mode signals in response to the decoding signal corresponding to a core region;
a refresh test mode signal output unit configured to operate in response to the enable signal and to output a refresh test mode signal in response to the decoding signal corresponding to a refresh operation;
a core region controller configured to control circuits in a core region in response to the core region test mode signals; and
a refresh controller configured to control circuits related to a refresh operation in response to the refresh test mode signal and a refresh normal mod signal.
10. The semiconductor memory device as recited in claim 9 , further comprising a path selector configured to output signals, received through a plurality of pads, as the burn-in test signals through corresponding paths, upon entry into a wafer burn-in mode.
11. The semiconductor memory device as recited in claim 9 , wherein the enable signal is activated for a predetermined period in response to an activation point of at least one of the burn-in test signals.
12. The semiconductor memory device as recited in claim 9 , wherein the enable signal generator comprises:
a signal input unit configured to receive the burn-in test signals to output a signal reflecting an activation point of at least one of the burn-in test signals; and
a pulse generator configured to generate the enable signal with a pulse width corresponding to the predetermined period in response to the output signal of the signal input unit.
13. The semiconductor memory device as recited in claim 12 , wherein the pulse generator comprises:
a delay unit configured to delay the output signal of the signal input unit by the predetermined period; and
an output unit configured to output the enable signal in response to the output signal of the delay unit and the output signal of the signal input unit.
14. The semiconductor memory device as recited in claim 9 , wherein the core region test mode signal output unit comprises a plurality of latch units configured to latch the decoding signals and output the core region test mode signals in response to the enable signal.
15. The semiconductor memory device as recited in claim 14 , wherein the latch unit is initialized in response to one of the decoding signals.
16. The semiconductor memory device as recited in claim 9 , wherein the core region controller and the refresh controller are driven in a wafer burn-in mode.
17. The semiconductor memory device as recited in claim 9 , wherein the refresh controller is driven in a refresh operation of a normal mode and a wafer burn-in mode.
18. The semiconductor memory device as recited in claim 9 , further comprising a delay unit configured to delay the enable signal by a time margin taken to output the burn-in test signals through the decoding unit.