IP Library › Assignment 020330/0956
Patent Assignment
Reel/Frame 020330/0956

Assignment of Assignor's Interest

Recorded: 2007-12-28 Pages: 2
Assignors
HAN, HI-HYUN
Executed: 2007-12-26
KIM, JEE-YUL
Executed: 2007-12-26
Assignee
HYNIX SEMICONDUCTOR INC.
SAN 136-1, AMI-RI, BUBAL-EUB, ICHON-SHI, KYOUNGKI-DO, 467-860, KOREA, REPUBLIC OF
Covered Property (1)
Semiconductor Memory Device Having Wafer Burn-in Test Mode
Patent: 7,660,174 →
Application: 12/005,853 →
Publication: US 2009/0116322
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name May 6, 2024
From: HYNIX-SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067328/0814 →
Assignment of Assignor's Interest May 9, 2024
From: SK HYNIX INC.
To: MIMIRIP LLC
Reel/Frame 067369/0832 →
Corrective Assignment to Correct the Assignee Is Hynix Semiconductor Inc. Not Hynix-Semiconductor Inc. There Is No Hyphen in the Name. Previously Recorded on Reel 67328 Frame 814. Assignor(S) Hereby Confirms the Change of Name. May 14, 2024
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 067412/0482 →