IP Library Granted Patent US 7,351,503
Granted Patent B2
US 7,351,503 · App. 10/733,723 · Granted Apr 1, 2008

Fused silica pellicle in intimate contact with the surface of a photomask

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Quick Facts
Patent No.
US 7,351,503
App. No.
10/733,723
Granted
Apr 1, 2008
Kind
B2
Abstract

A fused silica pellicle for use on photomasks having increased durability and improved transmission uniformity and birefringence properties. The pellicle is to be intimately secured to the patterned surface of a photomask.

Claims (39)

1. A photomask comprising:

(a) a substantially transparent photomask substrate,

(b) a patterned area of masking material affixed to said photomask substrate, and

(c) a fused silica pellicle affixed to said patterned area of masking material.

2. The photomask of claim 1 wherein said silica pellicle is made from F-doped fused silica.

3. The photomask of claim 1 wherein said silica pellicle is made from silicon nitride.

4. The photomask of claim 1 wherein said silica pellicle is affixed to said patterned area of masking material using an adhesive.

5. The photomask of claim 1 wherein said silica pellicle is affixed to said patterned area of masking material using a reusable adhesive.

6. An embedded-attenuated phase shift photomask comprising:

(a) a substantially transparent photomask substrate;

(b) a phase shift layer affixed to said photomask substrate;

(c) a patterned area of masking material affixed to said phase shift layer; and

(d) a fused silica pellicle affixed to said patterned area of masking material.

7. The embedded-attenuated phase shift photomask of claim 6 wherein said silica pellicle is made from F-doped fused silica.

8. The embedded-attenuated phase shift photomask of claim 6 wherein said silica pellicle is made from silicon nitride.

9. The embedded-attenuated phase shift photomask of claim 6 wherein said silica pellicle is affixed to said patterned area of masking material using an adhesive.

10. The embedded-attenuated phase shift photomask of claim 6 wherein said silica pellicle is affixed to said patterned area of masking material using a reusable adhesive.

11. An alternating aperture phase shift mask comprising:

(a) a patterned area of a substantially transparent photomask substrate,

(b) a patterned area of masking material affixed to said photomask substrate, wherein said patterned area of said substantially transparent photomask substrate alternates with said patterned area of said masking material, and

(c) a fused silica pellicle affixed to said patterned area of masking material.

12. The alternating aperture phase shift mask of claim 11 wherein said silica pellicle is made from F-doped fused silica.

13. The alternating aperture phase shift mask of claim 11 wherein said silica pellicle is made from silicon nitride.

14. The alternating aperture phase shift mask of claim 11 wherein said silica pellicle is affixed to said patterned area of masking material using an adhesive.

15. The alternating aperture phase shift mask of claim 11 wherein said silica pellicle is affixed to said said patterned area of masking material using a reusable adhesive.

16. A photomask comprising:

(a) a substantially transparent photomask substrate,

(b) a patterned area of masking material affixed to said photomask substrate,

(c) a planarization layer affixed to the top surface of said patterned area of masking material, and

(d) a fused silica pellicle affixed to said planarization layer.

17. The photomask of claim 16 wherein said silica pellicle is made from F-doped fused silica.

18. The photomask of claim 16 wherein said silica pellicle is made from silicon nitride.

19. The photomask of claim 16 wherein said silica pellicle is affixed to said planarization layer using an adhesive.

20. The photomask of claim 16 wherein said planarization layer is an adhesive.

21. The photomask of claim 16 wherein said planarization layer is comprised of silicon dioxide.

22. The photomask of claim 16 wherein said planarization layer is comprised of spin-on glass.

23. The photomask of claim 16 wherein said planarization layer is comprised of an organic material.

24. The photomask of claim 16 wherein said planarization layer is comprised of an inorganic material.

25. The photomask of claim 16 wherein said silica pellicle is affixed to said planarization layer using a reusable adhesive.

Assignments (4)
SECURITY INTEREST Recorded Sep 28, 2018
From: PHOTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047002/0633 →
SECURITY AGREEMENT Recorded Feb 13, 2010
From: PHOTRONICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 023928/0612 →
SECURITY AGREEMENT Recorded Dec 19, 2008
From: PHOTRONICS, INC.
To: JPMORGAN CHASE BANK, NATIONAL ASSOCIATION
Reel/Frame 022012/0009 →
SECURITY AGREEMENT Recorded Dec 15, 2008
From: PHOTRONICS, INC.
To: JPMORGAN CHASE BANK, NATIONAL ASSOCIATION
Reel/Frame 021976/0635 →