Active programming and operation of a memory device
View Patent ↗Systems and methodologies for programming a memory cell having a functional or selective conductive layer are provided. The functional zone can include active, and/or passive and/or barrier layers. The system includes a controller that can actively trace conditions associated with such programming. In one aspect of the present invention, by providing an external stimulus, an associated electrical or optical property associated with the memory cell is affected. Such property is then compared to a predetermined value to set/verify a programming state for the memory cell. The external stimulus can then be removed upon completion of the programming, or reduced to a verifying state to read information. The memory cell can include alternating layers of active, passive, diode, and barrier layers positioned between at least two electrodes.
1. A system that programs a memory cell comprising:
a memory cell to be programmed comprising;
a first electrode that forms a base for the memory cell;
a functional layer formed over the first electrode to facilitate charge migration in the memory cell, an impedance state(s) of the functional layer changes based on a migration of electrons or holes when subject to an external electric field or light radiation, the impedance state(s) indicative of more than two programming states of the memory cell; and
a second electrode formed over the functional layer and operative with the first electrode to activate a memory portion in the memory cell,
a control component that applies an external stimulus to the memory cell, to affect at least one of an electrical and optical property associated with the memory cell, the control component comprising a comparator that compares a value of the at least one of an electrical and optical property with a threshold value, to determine a program state of the memory cell;
a ballast resistor operatively connected to the memory cell; and
a registering device for monitoring circuit conditions during programming of the memory cell.
2. The system of claim 1 , the control component comprising a generator.
3. The system of claim 1 , wherein the external stimulus is a voltage.
4. The system of claim 1 , wherein the impedance of the memory cell represents four bits of information.
5. The system of claim 1 , the functional layer is a selectively conductive media further comprising an organic light emitting material.
6. The system of claim 1 , the functional layer comprises a passive layer, an active layer and a barrier layer.
7. The system of claim 1 , the second electrode comprising a plurality of electrodes to facilitate decoupling of write and read circuits that program the memory cell.
8. The system of claim 1 further comprising a second registering device.
9. The system of claim 1 , wherein the registering device comprises a voltmeter.
10. The system of claim 1 , wherein the registering device comprises a oscillograph.
11. A method of programming a memory cell using the system of claim 1 , comprising:
providing a memory cell comprising a selectively conductive layer that is sandwiched between electrodes;
applying an external stimulus to the memory cell to affect an impedance state of the memory cell and indicate one state of more than two impedance states of the memory cell; and
comparing the impedance state with a predetermined threshold value.
12. The method of claim 11 , wherein applying an external stimulus comprises applying a voltage to the memory cell.
13. The method of claim 11 , further comprising comparing an electric current passing through the memory cell with a predetermined threshold value.
14. The method of claim 11 , further comprising removing the external stimulus based on an outcome of the comparing act.
15. A method of programming information in a memory cell using the system of claim 1 , comprising:
applying an electric field pulse that exceeds a threshold value to the memory cell, the memory cell comprising a selectively conductive layer that is sandwiched between electrodes; and
controlling at least one of an impedance of the cell, current flowing through the cell, and a time duration that current flows through the cell, to program the memory cell, to one of more than two operating states of the memory cell.
16. The method of claim 15 further comprising comparing a current flowing through the cell with a predetermined value.
17. The method of claim 16 further comprising removing the electric field pulse based on an outcome of comparing a current flowing through the cell with a predetermined value.
18. The method of claim 17 further comprising applying a further electric pulse to read information from the memory cell.
19. The method of claim 15 further comprising applying a reverse electric field pulse to erase programmed information.