IP Library Granted Patent US 7,280,333
Granted Patent B2
US 7,280,333 · App. 10/810,303 · Granted Oct 9, 2007

Method and device for short circuit or open load detection

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Quick Facts
Patent No.
US 7,280,333
App. No.
10/810,303
Granted
Oct 9, 2007
Kind
B2
Abstract

A method or apparatus is provided for detecting an error condition associated with a load (R L ) or a connection (P) to the load (R L ). The load (R L ) may comprise an energy storing element (Cext). During a first diagnosis phase, it is determined whether the load (R L ) or the connection (P) to the load (R L ) is in a normal operation condition or in an error condition. If the load (R L ) or the connection (P) to the load (R L ) is in an error condition, during a second diagnosis phase it is determined whether the error condition is an open load condition, short circuit condition to ground or a short circuit condition to a power supply. When the load is in a starting state before the first diagnosis phase, the method or apparatus may further comprise carrying out, after the second diagnosis phase, a resetting phase for resetting the load to the starting state.

Claims (37)

1. A method for detecting an error condition associated with a load (R L ) or a connection (P) to the load (R L ) comprising:

during a first diagnosis phase determining whether the load (R L ) or the connection (P) to the load (R L ) is in a normal operation condition or in an error condition, and

if the load (R L ) or the connection (P) to the load (R L ) is in an error condition, during a second diagnosis phase determining whether the error condition is an open load condition, short circuit condition to ground or a short circuit condition to a power supply,

wherein the second diagnosis phase comprises changing a first parameter associated with the load in an attempt to escape from said error condition.

2. A method according to claim 1 , wherein changing a first parameter comprises changing the polarity of a current flowing in or out the load (R L ).

3. A method according to claim 1 , wherein changing a first parameter comprises changing the amplitude of a current flowing in or out the load (R L ).

4. A method according to claim 2 , wherein changing a first parameter furthermore comprises changing the amplitude of a current flowing in or out the load (R L ).

5. A method according to claim 3 , wherein changing the amplitude of the current is such that the amplitude of the current is larger than a minimum level, said minimum level being defined by formula:

I

DiagMin

=

Δ

V

·

A

ext

t

wherein ΔV is a reference voltage, A ext is a memory value of an energy storing element present in the load (R L ) and t is the time between the change of the amplitude of the current and a moment of measuring a voltage.

6. A method according to claim 1 , the load (R L ) being in a starting state before the first diagnosis phase, the method further comprising carrying out, after the second diagnosis phase, a resetting phase for resetting the load (R L ) to the starting state.

7. A method according to claim 1 , wherein the first diagnosis phase comprises monitoring whether a second parameter associated with the load (R L ) is below a first pre-determined low level or is above a second pre-determined high level, and if so, reporting that the load (R L ) is in an error condition.

8. A method according to claim 7 , wherein monitoring a second parameter comprises monitoring a current flowing in or out the load (R L ) or a voltage drop across the load (R L ).

9. A method according to claim 6 , wherein the resetting phase comprises changing a third parameter associated with the load (R L ).

10. A method according to claim 9 , wherein changing a third parameter comprises changing a current flowing in or out the load (R L ).

11. An error detection apparatus for detecting an error condition associated with a load (R L ) or a connection (P) to the load (R L ) comprising:

first diagnosis means for determining whether the load (R L ) or the connection (P) to the load (R L ) is in a normal operation condition or in an error condition and

second diagnosis means for, if the load (R L ) or the connection (P) to the load (R L ) is in an error condition, determining whether the error condition is an open load condition, a short circuit condition to ground or a short circuit condition to power supply and

wherein the second diagnosis means comprises means for changing a first parameter associated with the load (R L ) in an attempt to escape from said error condition.

12. An error detection apparatus according to claim 11 , wherein said means for changing a first parameter comprises means for changing the polarity of a current flowing in or out the load (R L ).

13. An error detection apparatus according to claim 11 , wherein said means for changing a first parameter comprises means for changing the amplitude of a current flowing in or out the load (R L ).

14. An error detection apparatus according to claim 12 , wherein said means for changing a first parameter furthermore comprises means for changing the amplitude of a current flowing in or out the load (R L ).

15. An apparatus according to claim 11 , wherein the load (R L ) comprises an energy storing element (C ext ).

16. An apparatus according to claim 11 , for detecting an error condition on the load (R L ) in a starting state, the apparatus further comprising resetting means for resetting the load (R L ) to the starting state.

17. An apparatus according to claim 11 , wherein the first diagnosis means comprises means for monitoring whether a second parameter associated with the load (R L ) is below a first pre-determined low level or is above a second pre-determined high level, and reporting means for reporting that the load (R L ) is in an error condition.

18. An apparatus according to claim 17 , wherein the second parameter is a current flowing in or out the load (R L ) or a voltage drop across the load (R L ).

19. An apparatus according to any of claims 16 , wherein the resetting means comprises means for changing a third parameter associated with the load (R L ).

Assignments (6)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
BILL OF SALE Recorded Sep 25, 2009
From: AMI SEMICONDUCTOR BELGIUM BVBA
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, L.L.C.
Reel/Frame 023282/0476 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 11, 2005
From: HORSKY, PAVEL; KOUDAR, IVAN
To: AMI SEMICONDUCTOR BELGIUM BVBA
Reel/Frame 016350/0132 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 12, 2004
From: HORSKY, PAVEL; KOUDAR, IVAN
To: AMI SEMICONDUCTOR BELGIUM BVBA
Reel/Frame 016362/0714 →