Method of forming composite barrier layers with controlled copper interface surface roughness
View Patent ↗A composite α-Ta/graded tantalum nitride/TaN barrier layer is formed in Cu interconnects with a controlled surface roughness for improved adhesion, electromigration resistance and reliability. Embodiments include lining a damascene opening, such as a dual damascene opening in a low-k interlayer dielectric, with an initial layer of TaN, forming a graded tantalum nitride layer on the initial TaN layer and then forming an α-Ta layer on the graded TaN layer, the composite barrier layer having an average surface roughness (Ra) of about 25 Å to about 50 Å. Embodiments further include controlling the surface roughness of the composite barrier layer by varying the N 2 flow rate and/or ratio of the thickness of the combined α-Ta and graded tantalum nitride layers to the thickness of the initial TaN layer.
1. A method of manufacturing a semiconductor device, the method comprising:
forming an opening in a dielectric layer over a semiconductor wafer;
forming a composite barrier layer with an exposed surface having an average surface roughness (Ra) of about 25 Å to about 50 Å lining the opening, the composite barrier layer comprising a layer of α-tantalum (α-Ta) over an initial layer of tantalum nitride (TaN); and
filling the opening with copper (Cu) or a Cu alloy.
2. The method according to claim 1 , further comprising:
depositing a graded tantalum nitride layer on the initial TaN layer lining the opening; and
depositing the α-Ta layer on the graded tantalum nitride layer.
3. The method according to claim 2 , comprising:
depositing the TaN layer by ionized sputter deposition using a Ta target and a sufficiently high nitrogen (N 2 ) flow rate to poison the Ta target with N 2 ;
discontinuing the flow of N 2 ; and
depositing the graded tantalum nitride and α-Ta layers using the Ta target.
4. The method according to claim 2 , comprising:
depositing the TaN layer using a nitrogen (N 2 ) flow rate; and
controlling the surface roughness (Ra) by varying:
a) the ratio of the thickness of the combined α-Ta and graded tantalum nitride layers to the thickness of the initial TaN layer; and/or
b) the N 2 flow rate during deposition of the TaN layer.
5. The method according to claim 4 , comprising:
varying the ratio between about 50 to about 250.
6. The method according to claim 4 , comprising varying the N 2 flow rate between about 10 to about 100 sccm.
7. The method according to claim 2 , wherein the opening is formed in dielectric material having dielectric constant less than about 3.9.
8. The method according to claim 7 , wherein the opening is a dual damascene opening, the method comprising filling the dual damascene opening to form a lower Cu or Cu alloy via in electrical contact with a lower metal feature and connected to an upper Cu or Cu alloy line.