IP Library Granted Patent US 7,053,689
Granted Patent B2
US 7,053,689 · App. 10/879,848 · Granted May 30, 2006

High voltage switch circuit

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Quick Facts
Patent No.
US 7,053,689
App. No.
10/879,848
Granted
May 30, 2006
Kind
B2
Abstract

The present invention discloses a high voltage switch circuit of a semiconductor device which can reduce a discharge time by supplying a higher voltage than a power voltage to a gate terminal of a discharge transistor in a discharge unit for discharging a high voltage.

Claims (21)

1. A high voltage switch circuit, comprising:

a discharge node;

a high voltage switch unit for switching an external high voltage according to a high voltage transmission enable signal and a clock signal;

a first NMOS transistor for discharging a high voltage which is the output from the high voltage switch unit according to the discharge node;

a power voltage transmission unit for transmitting a power voltage to the discharge node according to the high voltage transmission enable signal;

a second NMOS transistor for controlling a voltage of the discharge node according to the high voltage transmission enable signal; and

a voltage pumping unit for increasing the voltage of the discharge node by a predetermined level according to the high voltage transmission enable signal and the clock signal.

2. The circuit of claim 1 , wherein the power voltage transmission unit includes a PMOS transistor and a third NMOS transistor connected in series between the power voltage and the discharge node.

3. The circuit of claim 2 , wherein the PMOS transistor is driven according to the high voltage transmission enable signal, and the third NMOS transistor is driven according to the power voltage transmitted through the PMOS transistor.

4. The circuit of claim 1 , wherein the voltage pumping unit includes:

an inverter for inverting the high voltage transmission enable signal;

a NAND gate for NANDing the output from the inverter and the clock signal; and

a fourth NMOS transistor capacitor-coupled for increasing the voltage of the discharge node by the predetermined level according to the output from the NAND gate.

5. A high voltage switch circuit, comprising:

a discharge node;

a high voltage switch unit for switching an external high voltage according to a high voltage transmission enable signal and a clock signal;

a first NMOS transistor for discharging a high voltage which is the output from the high voltage switch unit according to the discharge node;

a power voltage transmission unit for transmitting a power voltage to the discharge node according to the high voltage transmission enable signal, wherein the power voltage transmission unit includes a PMOS transistor and a third NMOS transistor connected in series between the power voltage and the discharge node;

a second NMOS transistor for controlling a voltage of the discharge node according to the high voltage transmission enable signal; and

a voltage pumping unit for increasing the voltage of the discharge node by a predetermined level according to the high voltage transmission enable signal and the clock signal, wherein the voltage pumping unit includes an inverter for inverting the high voltage transmission enable signal, a NAND gate for NANDing the output from the inverter and the clock signal and a fourth NMOS transistor capacitor-coupled for increasing the voltage of the discharge node by the predetermined level according to the output from the NAND gate.

6. The circuit of claim 5 , wherein the PMOS transistor is driven according to the high voltage transmission enable signal, and the third NMOS transistor is driven according to the power voltage transmitted through the PMOS transistor.

Assignments (10)
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 24, 2012
From: STMICROELECTRONICS S.R.L.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 029186/0761 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 11, 2011
From: HYNIX SEMICONDUCTOR INC.
To: NUMONYX B.V.
Reel/Frame 027217/0862 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 11, 2011
From: NUMONYX B.V.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 027217/0837 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 6, 2006
From: HYNIX SEMICONDUCTOR INC.
To: HYNIX SEMICONDUCTOR INC.; STMICROELECTRONICS S.R.L.
Reel/Frame 018207/0057 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 29, 2004
From: KIM, YOUNG JOO
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015534/0365 →