Patent Assignment
Reel/Frame 018207/0057
Assignment of Assignor's Interest
Recorded: 2006-09-06
Pages: 10
Assignor
HYNIX SEMICONDUCTOR INC.
Executed: 2005-09-05
Assignees
HYNIX SEMICONDUCTOR INC.
SAN 136-1, AMI-RI, BUBAL-EUB, ICHON-SHI, KYOUNGKI-DO, KOREA, REPUBLIC OF
STMICROELECTRONICS S.R.L.
VIA C. OLIVETTI, 2, I-20041, AGRATE BRIANZA, ITALY
Covered Properties
(99)
Method for Forming Floating Gate in Flash Memory Device
Method of forming device isolation film in semiconductor device
Application:
10/720,457 →
Publication:
US 2004/0266132
Method of Forming Gate Electrode in Semiconductor Device
Method of Manufacturing Flash Memory Device
Method of Manufacturing Semiconductor Device
Method for Manufacturing Semiconductor Device
Method of Forming Tunnel Oxide Film in Semiconductor Device
Method of Forming Metal Line in Semiconductor Device
Method for Forming Bit Line of Flash Device
Method for Manufacturing Flash Memory Device
High Voltage Transfer Circuit
Method of Manufacturing Flash Memory Device
Method of Manufacturing High Voltage Transistor in Flash Memory Device
Method of Manufacturing Dual Gate Oxide Film
Method for Manufacturing Semiconductor Device
Method of Manufacturing Semiconductor Device
Method for Reading Flash Memory Cell, Nand-Type Flash Memory Apparatus, and nor-Type Flash Memory Apparatus
Semiconductor Device and Method of Fabricating the Same
Method of Manufacturing Semiconductor Device
Data Input/Output Buffer and Semiconductor Memory Device Using the Same
Method of Forming Gate Electrode in Flash Memory Device
Patent:
6,803,277 →
Application:
10/744,495 →
Method of Manufacturing Flash Memory Device
Detergent Composition Comprising Lauric Soap
Method for Manufacturing Flash Memory Device
Method of Manufacturing a Semiconductor Device
Method for Manufacturing Nand Flash Device
Encoding Circuit for Semiconductor Device and Redundancy Control Circuit Using the Same
High Voltage Switch Circuit of Semiconductor Device
Nand Flash Memory Device and Method of Reading the Same
Flash Memory Device Capable of Improving a Data Loading Speed
Method for manufacturing semiconductor device
Application:
10/878,173 →
Publication:
US 2005/0142764
High Voltage Transistor and Method of Manufacturing the Same
Method of Forming Metal Line in Semiconductor Device
Method for manufacturing flash memory device
Application:
10/878,916 →
Publication:
US 2005/0130372
Circuit of Redundancy Io Fuse in Semiconductor Device
Method of Measuring Threshold Voltage for a Nand Flash Memory Device
Method for Manufacturing Flash Memory Device and Flash Memory Device
Method for Forming Dielectric Layer Between Gates in Flash Memory Device
Method for forming metal wiring in semiconductor device
Application:
10/879,785 →
Publication:
US 2005/0142847
Semiconductor Device Having Pad Structure for Preventing and Buffering Stress of Silicon Nitride Film
High Voltage Switch Circuit
Page Buffer Having Dual Register, Semiconductor Memory Device Having the Same, and Program Method Thereof
Method for Manufacturing Semiconductor Device
Method for Manufacturing Flash Memory Cell
Method for Forming Isolation Layer in Semiconductor Device
Method of Forming Oxide Layer in Semiconductor Device
Method of Forming Gate Oxide Layer in Semiconductor Device
Flash memory cell and method of erasing the same
Application:
10/881,423 →
Publication:
US 2005/0133853
Method of Manufacturing Flash Memory Devices
Patent:
6,835,620 →
Application:
10/881,461 →
Method for Manufacturing Flash Memory Device
Method for Manufacturing Flash Memory Device
Method for Manufacturing Flash Memory Device
Method for Manufacturing Flash Memory Device
Method and Device for Preserving Word Line Pass Bias Using Rom in Nand-Type Flash Memory
Method for Manufacturing Semiconductor Device
Method of Manufacturing Flash Memory Device
Contact Plug in Semiconductor Device and Method of Forming the Same
Method of Manufacturing Nand Flash Device
Nand Flash Memory Device and Method of Programming the Same
Multi-Input/Output Repair Method of Nand Flash Memory Device and Nand Flash Memory Device Thereof
High Voltage Switch Circuit for Semiconductor Device
Method for Forming Oxide Film in Semiconductor Device
Page Buffer for Flash Memory Device
Method of Erasing Nand Flash Memory Device
Method of Manufacturing Flash Memory Device
Method of Manufacturing a Transistor of a Semiconductor Device
Method of Controlling Page Buffer Having Dual Register and Circuit Thereof
Method of Reading Multi-Level Nand Flash Memory Cell and Circuit for the Same
Method of Manufacturing Semiconductor Device
Page Buffer of Flash Memory Device and Data Program Method Using the Same
Block Switch in Flash Memory Device
Oscillator Circuit for Semiconductor Device
Redundancy Circuit for Nand Flash Memory Device
Semiconductor memory device and package thereof, and memory card using the same
Application:
11/010,664 →
Publication:
US 2006/0083096
Method of Forming an Element Isolation Film of a Semiconductor Device
Method for Forming a Gate Electrode in a Non-Volatile Memory Device
Nand Flash Memory Device and Method of Forming a Well of a Nand Flash Memory Device
Flash Memory Device and Method of Erasing Flash Memory Cell Thereof
Flash memory system and erase method thereof
Application:
11/011,962 →
Publication:
US 2006/0090029
Page Buffer of Non-Volatile Memory Device and Method of Programming and Reading Non-Volatile Memory Device
Method of Manufacturing Flash Memory Device
Flash Memory Device and Method for Driving the Same
Method of Fabricating Flash Memory Device
Nand Flash Memory Device
Method of Forming Polysilicon Layer in Semiconductor Device
Method for Forming Wall Oxide Layer and Isolation Layer in Flash Memory Device
Method for Forming Isolation Layer in Semiconductor Memory Device
Method for Forming Passivation Film of Semiconductor Device and Structure of Passivation Film of Semiconductor Device
Method for Manufacturing Flash Memory Device
Method for Forming Isolation Film in Semiconductor Device
Method of forming dielectric layer in semiconductor device
Application:
11/022,460 →
Publication:
US 2006/0079097
Semiconductor Device and Method of Manufacturing the Same
Method of Manufacturing a Select Transistor in a Nand Flash Memory
Method of Reading a Flash Memory Device
Method of forming passivation layer in semiconductor device
Application:
11/119,646 →
Publication:
US 2006/0019499
Method for Manufacturing Nand Flash Device
Method for Manufacturing Nand Flash Device
Method for Reading Flash Memory Cell, Nand-Type Flash Memory Apparatus, and nor-Type Flash Memory Apparatus
Method for Reading Flash Memory Cell, Nand-Type Flash Memory Apparatus, and nor-Type Flash Memory Apparatus
Related Assignments
(25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 10, 2003
From: CHO, IHL HYUN
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 014787/0179 →
Assignment of Assignor's Interest
Dec 12, 2003
From: LEE, BYUNG SEOK
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 014796/0480 →
Assignment of Assignor's Interest
Dec 12, 2003
From: LEE, BYOUNG KI
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 014796/0017 →
Assignment of Assignor's Interest
Dec 18, 2003
From: KIM, KI S.
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 014832/0836 →
Assignment of Assignor's Interest
Dec 18, 2003
From: KIM, SANG DEOK
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 014821/0372 →
Assignment of Assignor's Interest
Mar 1, 2004
From: DONG, CHA DEOK
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015016/0102 →
Assignment of Assignor's Interest
Mar 8, 2004
From: DONG, CHA DEOK; SON, HO MIN
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015046/0041 →
Assignment of Assignor's Interest
Mar 8, 2004
From: DONG, CHA DEOK; HAN, KEOUN II
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015046/0044 →
Assignment of Assignor's Interest
Mar 15, 2004
From: SONG, YOUNG T.
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015071/0424 →
Assignment of Assignor's Interest
Mar 22, 2004
From: KWAK, NOH YEAL
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015112/0618 →
Assignment of Assignor's Interest
Mar 22, 2004
From: LEE, SEUNG CHEOL; PARK, SANG WOOK
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015112/0621 →
Assignment of Assignor's Interest
Mar 22, 2004
From: KWAK, NOH YEAL
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015112/0633 →
Assignment of Assignor's Interest
Apr 2, 2004
From: SHIN, YOUNG KI
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015160/0050 →
Assignment of Assignor's Interest
Apr 2, 2004
From: LEE, KEUN WOO
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015160/0227 →
Assignment of Assignor's Interest
Apr 22, 2004
From: PARK, JEONG H.
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015235/0159 →
Assignment of Assignor's Interest
Apr 22, 2004
From: LEE, SEUNG C.; CHO, JUNG I.; PARK, SANG W.
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015236/0303 →
Record to Correct the Assignor on an Assignment Recorded on Reel 014821 Frame 0372.
Jul 14, 2004
From: LEE, CHANG JIN
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 014879/0063 →
Assignment of Assignor's Interest
Aug 3, 2004
From: WON, SAM K.
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015638/0248 →
Assignment of Assignor's Interest
Jan 10, 2005
From: HYNIX SEMICONDUCTOR, INC.
To: MAGNACHIP SEMICONDUCTOR, LTD.
Reel/Frame 016216/0649 →
Corrective Assignment to Correct Wrong Serial Number 10736730 on Document Previously Recorded on Reel 015160 Frame 0227
Jun 10, 2005
From: LEE, KEUN WOO
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 017170/0332 →
Assignment of Assignor's Interest
Nov 11, 2011
From: NUMONYX B.V.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 027217/0837 →
Assignment of Assignor's Interest
Nov 11, 2011
From: HYNIX SEMICONDUCTOR INC.
To: NUMONYX B.V.
Reel/Frame 027217/0862 →
Assignment of Assignor's Interest
Oct 24, 2012
From: STMICROELECTRONICS S.R.L.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 029186/0761 →
The Submission Is to Correct an Error Made in a Previously Recorded Document on Reel/Frame 016216/0649 Recorded on 01/10/2005 That Erroneously Affects the Identified Patent No. 7037822. an Affidavit Is Being Filed Herewith.
May 29, 2013
From: MAGNACHIP SEMICONDUCTOR, LTD.
To: HYNIX SEMICONDUCTOR, INC.
Reel/Frame 030508/0646 →
Assignment of Assignor's Interest
Aug 10, 2015
From: NUMONYX B. V.
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 036319/0139 →