IP Library Granted Patent US 7,403,431
Granted Patent B2
US 7,403,431 · App. 11/103,383 · Granted Jul 22, 2008

Method of reading a flash memory device

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Quick Facts
Patent No.
US 7,403,431
App. No.
11/103,383
Granted
Jul 22, 2008
Kind
B2
Abstract

A method of reading a flash memory device wherein the status of a predetermined cell is read in such a way that a plurality of page buffers connected to a memory cell array through a plurality of bit lines are divided into at least two group, and the page buffers are sequentially driven on a group basis. A power loss problem caused by excessive current consumption occurring since all page buffers operate at the same time is avoided.

Claims (24)

1. A method of reading a flash memory device comprising:

controlling an electric potential of a plurality of bit lines according to status of a predetermined cell to stop a supply of a predetermined voltage to a memory cell;

dividing a plurality of page buffers into at least two groups, the page buffers being connected to the memory cell array through the plurality of bit lines;

driving the plurality of page buffers on a group basis to read status of the memory cell, wherein while one of the at least two groups operates, another of the at least two groups starts operation such that the plurality of the page buffer groups is sequentially driven;

storing a data depending on the status of the memory cell; and

outputting the data.

2. A method of reading a flash memory device having a page buffer, wherein the page buffer comprises:

a first transistor that supplies a ground voltage to a selected memory cell through bit lines, according to a discharge signal, for a read operation;

a second transistor for precharging the bit lines according to control signals applied as different electric potentials, and supplying an electric potential depending upon the status of a cell that is connected to the bit lines to input/output nodes;

a third transistor for precharging the bit lines by supplying a predetermined voltage to the input/output nodes according to a precharge signal;

a fourth transistor for allowing program information to be supplied to a selected cell of the memory cell array through a selected bit line, according to a program signal, upon program;

a latch for storing output data from the selected cell of the memory cell array, and outputting the output data to data lines;

a fifth transistor for initializing the latch according to an initialization signal;

a sixth transistor for inverting the output data stored in the latch according to an electric potential and an inversion signal of the input/output node, and

the method comprises:

providing the flash memory device consisting of a plurality of the page buffers; and

dividing the plurality of the page buffers into predetermined groups by dividing signals for driving the transistors, and sequentially applying the divided signals on a group basis, whereby the page buffers are sequentially driven on a group basis.

3. The method as claimed in claim 2 , wherein at least one of the signals for driving the first, second, third and sixth transistors is divided by as many as the number of groups of the pages buffers to be divided.

4. A method of reading a flash memory device having a plurality of page buffers that operate to read the status of a selected cell, the method comprising:

supplying a predetermined voltage through bit lines connected to a selected memory cell, thereby precharging the bit lines;

controlling an electric potential of the hit lines according to the stains of the memory cell to stop the supply of the predetermined voltage; and

storing data depending on the status of the memory cell, and

outputting the data.

wherein the plurality of the page buffers connected to a memory cell array through the bit lines is divided into two or more groups, and is then driven on a group basis, wherein before one group finishes one reading step, the other group starts a new reading step, whereby the plurality of the page buffer groups is sequentially driven to read the status of a given cell.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 10, 2015
From: NUMONYX B. V.
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 036319/0139 →
CHANGE OF NAME Recorded Aug 10, 2015
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 036319/0271 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 6, 2006
From: HYNIX SEMICONDUCTOR INC.
To: HYNIX SEMICONDUCTOR INC.; STMICROELECTRONICS S.R.L.
Reel/Frame 018207/0057 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 11, 2005
From: KIM, DUCK JU
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 016467/0861 →