Patent Assignment
Reel/Frame 036319/0271
Change of Name
Recorded: 2015-08-10
Pages: 50
Assignor
HYNIX SEMICONDUCTOR INC.
Executed: 2012-03-23
Assignee
SK HYNIX INC.
2091, GYEONGCHUNG-DAERO, BUBAL-EUB, ICHEON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Properties
(59)
Method of Forming Gate Electrode in Semiconductor Device
Method of Manufacturing Flash Memory Device
Method for Manufacturing Semiconductor Device
Method of Forming Tunnel Oxide Film in Semiconductor Device
Method of Manufacturing Flash Memory Device
Method of Manufacturing High Voltage Transistor in Flash Memory Device
Semiconductor Device and Method of Fabricating the Same
Data Input/Output Buffer and Semiconductor Memory Device Using the Same
Method of Manufacturing a Semiconductor Device
Method for Manufacturing Nand Flash Device
Nand Flash Memory Device and Method of Reading the Same
Flash Memory Device Capable of Improving a Data Loading Speed
Method of Measuring Threshold Voltage for a Nand Flash Memory Device
Method for Manufacturing Flash Memory Device and Flash Memory Device
Method for Forming Dielectric Layer Between Gates in Flash Memory Device
Semiconductor Device Having Pad Structure for Preventing and Buffering Stress of Silicon Nitride Film
Method of Forming Oxide Layer in Semiconductor Device
Method of Manufacturing Flash Memory Devices
Patent:
6,835,620 →
Application:
10/881,461 →
Method for Manufacturing Flash Memory Device
Method and Device for Preserving Word Line Pass Bias Using Rom in Nand-Type Flash Memory
Method for Manufacturing Semiconductor Device
Method of Manufacturing Flash Memory Device
Contact Plug in Semiconductor Device and Method of Forming the Same
Nand Flash Memory Device and Method of Programming the Same
High Voltage Switch Circuit for Semiconductor Device
Method for Forming Oxide Film in Semiconductor Device
Method of Manufacturing Flash Memory Device
Method of Reading Multi-Level Nand Flash Memory Cell and Circuit for the Same
Page Buffer of Flash Memory Device and Data Program Method Using the Same
Oscillator Circuit for Semiconductor Device
Redundancy Circuit for Nand Flash Memory Device
Method for Forming a Gate Electrode in a Non-Volatile Memory Device
Nand Flash Memory Device and Method of Forming a Well of a Nand Flash Memory Device
Flash Memory Device and Method of Erasing Flash Memory Cell Thereof
Page Buffer of Non-Volatile Memory Device and Method of Programming and Reading Non-Volatile Memory Device
Flash Memory Device and Method for Driving the Same
Nand Flash Memory Device
Method for Forming Passivation Film of Semiconductor Device and Structure of Passivation Film of Semiconductor Device
Method for Forming Isolation Film in Semiconductor Device
Method of Reading a Flash Memory Device
Page Buffer for a Programmable Memory Device
Method for Manufacturing Nand Flash Device
Method for Manufacturing Nand Flash Device
Programmable Memory Device with an Improved Redundancy Structure
Memory with Embedded Error Correction Codes
Reading Method of a Nand-Type Memory Device and Nand-Type Memory Device
Multistage Regulator for Charge-Pump Boosted Voltage Applications
Page Buffer Circuit and Method for Multi-Level Nand Programmable Memories
Double Page Programming System and Method
Method of Programming and Verifying Cells of a Nonvolatile Memory and Relative Nand Flash Memory
Method for Manufacturing Flash Memory Device
Transistor of a Semiconductor Device
Passivation Film of Semiconductor Device
Page Buffer for Nonvolatile Memory Device
Page Buffer for Multi-Level Nand Electrically-Programmable Semiconductor Memories
Method of Programming Cells of a Nand Memory Device
Power on Reset Circuit for a Digital Device Including an on-Chip Voltage Down Converter
Semiconductor Device Having Pad Structure for Preventing and Buffering Stress of Silicon Nitride Film
Trimming of Operative Parameters in Electronic Devices Based on Corrections Mappings
Related Assignments
(20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 23, 2003
From: PARK, JIN SU
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 014842/0165 →
Assignment of Assignor's Interest
Mar 8, 2004
From: DONG, CHA DEOK; SON, HO MIN
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015046/0041 →
Assignment of Assignor's Interest
Mar 15, 2004
From: SONG, YOUNG T.
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015071/0424 →
Assignment of Assignor's Interest
Mar 22, 2004
From: KWAK, NOH YEAL
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015112/0618 →
Assignment of Assignor's Interest
Mar 22, 2004
From: LEE, SEUNG CHEOL; PARK, SANG WOOK
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015112/0621 →
Assignment of Assignor's Interest
Apr 2, 2004
From: LEE, KEUN WOO
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015160/0227 →
Assignment of Assignor's Interest
Apr 2, 2004
From: SHIN, YOUNG KI
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015160/0050 →
Assignment of Assignor's Interest
Apr 22, 2004
From: RYU, CHOON K.
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015235/0171 →
Assignment of Assignor's Interest
Jun 21, 2004
From: SONG, PIL GEUN; PARK, SANG WOOK
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015505/0232 →
Assignment of Assignor's Interest
Jun 24, 2004
From: LEE, HEE YOUL
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015524/0598 →
Assignment of Assignor's Interest
Jun 24, 2004
From: GIL, MIN C.
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015519/0334 →
Assignment of Assignor's Interest
Jun 29, 2004
From: PARK, JIN SU; KIM, DOE COOK
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015536/0651 →
Assignment of Assignor's Interest
Jun 29, 2004
From: PARK, SUNG KEE
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015534/0324 →
Assignment of Assignor's Interest
Aug 30, 2004
From: LEE, YOUNG BOK
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015090/0778 →
Assignment of Assignor's Interest
Sep 7, 2004
From: SON, HO MIN
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015105/0620 →
Assignment of Assignor's Interest
Sep 16, 2004
From: LEE, SOK KYU
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015786/0491 →
Assignment of Assignor's Interest
Sep 17, 2004
From: PARK, SANG WOOK
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015789/0536 →
Corrective Assignment to Correct Wrong Serial Number 10736730 on Document Previously Recorded on Reel 015160 Frame 0227
Jun 10, 2005
From: LEE, KEUN WOO
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 017170/0332 →
Assignment of Assignor's Interest
Sep 6, 2006
From: HYNIX SEMICONDUCTOR INC.
To: HYNIX SEMICONDUCTOR INC.; STMICROELECTRONICS S.R.L.
Reel/Frame 018207/0057 →
Assignment of Assignor's Interest
Aug 10, 2015
From: NUMONYX B. V.
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 036319/0139 →