IP Library Granted Patent US 7,015,743
Granted Patent B2
US 7,015,743 · App. 10/879,434 · Granted Mar 21, 2006

Circuit of redundancy IO fuse in semiconductor device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,015,743
App. No.
10/879,434
Granted
Mar 21, 2006
Kind
B2
Abstract

Provided is related to a redundancy IO fuse circuit of a semiconductor device. The redundancy IO fuse circuit is advantageous to enhancing an overall processing speed of a redundancy operation by preventing a voltage drop by a threshold voltage due to an NMOS transistor, by reducing back bias effects, preventing a decrease of noise margins at an inverter connected to an IO bus, and by improving time delay property involved in current reduction according to variation of operation mode.

Claims (14)

1. A redundancy Input/Output (IO) fuse circuit of a semiconductor device, comprising:

a plurality of fuse boxes for outputting a predetermined logic signal in accordance with a repair signal and a fuse cutoff state;

an inverter for outputting an inversed repair signal by receiving the repair signal; and

a plurality of transmission gates for transferring the predetermined logic signal into an IO bus in accordance with the repair signal and the inversed repair signal.

2. The redundancy IO circuit as recited in claim 1 , wherein the fuse box comprises:

a first fuse connected between an input terminal of the fuse box and an output terminal of the fuse box; and

a second fuse connected between a ground voltage and the output terminal of the fuse box.

3. The redundancy IO fuse circuit as recited in claim 1 , wherein the transmission gates are connected between the output terminals of the fuse boxes and the IO buses in parallel, each having an NMOS transistor controlled by the repair signal and a PMOS transistor controlled by the inversed repair signal.

4. A redundancy IO fuse circuit of a semiconductor device, comprising:

an inverter for inversing an external repair signal;

a first fuse for transferring a ground voltage in accordance with a cutoff state;

a second fuse for transferring a power supply voltage in accordance with a cutoff state;

an NMOS transistor for transferring the ground voltage to an IO bus in accordance with the repair signal; and

a PMOS transistor for transferring the power supply voltage to the IO bus in accordance with the inversed repair signal provided from the inverter.

Assignments (12)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 24, 2012
From: STMICROELECTRONICS S.R.L.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 029186/0761 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 11, 2011
From: HYNIX SEMICONDUCTOR INC.
To: NUMONYX B.V.
Reel/Frame 027217/0862 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 11, 2011
From: NUMONYX B.V.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 027217/0837 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 6, 2006
From: HYNIX SEMICONDUCTOR INC.
To: HYNIX SEMICONDUCTOR INC.; STMICROELECTRONICS S.R.L.
Reel/Frame 018207/0057 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 29, 2004
From: PARK, YOUNG S.; KWON, YI J.
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 015535/0634 →