IP Library Granted Patent US 7,355,260
Granted Patent B2
US 7,355,260 · App. 10/881,678 · Granted Apr 8, 2008

Schottky device and method of forming

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Quick Facts
Patent No.
US 7,355,260
App. No.
10/881,678
Granted
Apr 8, 2008
Kind
B2
Abstract

A conductive layer includes a first portion that forms a Schottky region with an underlying first region having a first conductivity type. A second region of a second conductivity type underlies the first region, where the second conductivity type is opposite the first conductivity type. A third region of the first conductivity type immediately underlies the second region and is electrically coupled to a cathode of the device.

Claims (30)

1. A device comprising:

a first terminal connected to a conductive layer, a first portion of the conductive layer being a Schottky contact;

a first region of a first conductivity type underlying the Schottky contact, a first portion of the first region immediately underlying the Schottky contact;

a second region of a second conductivity type underlying the first region, a first portion of the second region immediately underlying the first portion of the first region, the second conductivity type being opposite the first conductivity type;

a third region of the first conductivity type underlying the second region, a first portion of the third region immediately underlying the second region;

a second terminal overlying the first region and electrically connected to the first region and to the third region; and

a fourth region of the second conductivity type adjacent to the first region in a lateral direction, the fourth region electrically connected to the first terminal, a first portion of the fourth region immediately adjacent in a lateral direction to the second region, wherein the second region is electrically connected to the conductive layer through a tie-portion of the fourth region, and the tie-portion of the fourth region comprises a higher dopant concentration than other portions of the fourth region.

2. The device of claim 1 wherein a second portion of the fourth region immediately underlies a second portion of the conductive layer.

3. The device of claim 2 , wherein the second portion of the conductive layer is immediately adjacent in a lateral direction to the first portion of the conductive layer.

4. The device of claim 3 , wherein a third portion of the fourth region is immediately adjacent to the first region, and has a higher dopant concentration of the second conductivity type than the first portion of the fourth region.

5. The device of claim 1 , wherein the fourth region does not immediately underlie the conductive layer.

6. The device of claim 1 , wherein a second portion of the fourth region overlies the first portion of the fourth region, wherein the second portion of the fourth region comprises a higher dopant concentration than the first portion of the fourth region, and the tie-portion of the fourth region is part of the second portion of the fourth region that is immediately adjacent to the conductive layer.

7. The device of claim 6 , wherein the first portion of the fourth region is physically separated from the tie-portion of the fourth region by the second portion of the fourth region.

8. The device of claim 1 , wherein the third region is electrically connected to the first region.

9. The device of claim 8 , wherein the third region is electrically connected to the first region through a conductive path at least as conductive as the third region.

10. The device of claim 1 , wherein

the first region comprises a plurality of first interleave structures; and

the fourth region comprises a plurality of second interleave structures interleaved with the plurality first interleave structures.

11. The device of claim 1 , wherein the first region and the second region form a first planar interface facing a first direction and the first region and the fourth region form a second planar interface facing a second direction, the first direction and the second direction being substantially orthogonal.

12. The device of claim 11 , wherein the first region and the fourth region form a third planar interface facing a third direction, the third direction and the first direction being substantially orthogonal and the third direction and second direction being substantially orthogonal.

13. The device of claim 1 , wherein the conductive layer is a silicide.

14. The device of claim 1 , wherein the first terminal is an anode of the Schottky contact and the second terminal is a cathode of the Schottky contact.

15. The device of claim 1 , wherein the first terminal is a cathode of the Schottky contact and the second terminal is an anode of the Schottky contact.

16. A device comprising:

a first terminal connected to a conductive layer, a first portion of the conductive layer being a Schottky contact;

a first region of a first conductivity type underlying the Schottky contact, a first portion of the first region immediately underlying the Schottky contact;

a second region of a second conductivity type immediately underlying the first portion of the first region, the second conductivity type being opposite the first conductivity type;

a third region of the first conductivity type immediately underlying the second region;

a second terminal overlying the first region and electrically connected to the first region and to the third region; and

a fourth region of the second conductivity type adjacent to the first region in a lateral direction, the fourth region electrically connected to the first terminal, a first portion of the fourth region immediately adjacent in a lateral direction to the second region, wherein the second region is electrically connected to the conductive layer through a tie-portion of the fourth region, and the tie-portion of the fourth region comprises a higher dopant concentration than other portions of the fourth region.

Assignments (23)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0225 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0719 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded Sep 24, 2008
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 021570/0449 →
SECURITY AGREEMENT Recorded Feb 2, 2007
From: FREESCALE SEMICONDUCTOR, INC.; FREESCALE ACQUISITION CORPORATION; FREESCALE ACQUISITION HOLDINGS CORP.; FREESCALE HOLDINGS (BERMUDA) III, LTD.
To: CITIBANK, N.A. AS COLLATERAL AGENT
Reel/Frame 018855/0129 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 2, 2005
From: KHEMKA, VISHNU K.; PARTHASARATHY, VIJAY; ZHU, RONGHUA; BOSE, AMITAVA
To: FREESCALE SEMICONDUCTORS, INC.
Reel/Frame 016296/0783 →