Ion irradiation of a target at very high and very low kinetic ion energies
View Patent ↗A particle-beam exposure apparatus ( 1 ) for irradiating a target ( 41 ) by means of a beam ( 2 ) of energetic electrically charged particles comprises: an illumination system ( 101 ) for generating and forming said particles into a directed beam ( 21 ); a pattern definition means ( 102 ) located after the illumination system for positioning a pattern of apertures transparent to the particles in the path of the directed beam, thus forming a patterned beam ( 22 ) emerging from the pattern definition means through the apertures; and a projection system ( 103 ) positioned after the pattern definition means ( 102 ) for projecting the patterned beam ( 22 ) onto a target (41) positioned after the projection system. The apparatus further comprises an acceleration/deceleration means ( 32 ) containing an electric potential gradient which is oriented substantially parallel to the path of the structured beam and constant over at least a cross-section of the beam.
1. A particle-beam exposure apparatus ( 1 , 4 , 7 , 8 ) for irradiating a target ( 41 ) by means of a beam ( 2 ) of energetic electrically charged particles, comprising
an illumination system ( 101 ) for generating and forming said energetic particles into a directed beam ( 21 ),
a pattern definition means ( 102 ) located after the illumination system as seen along the direction of the beam, said pattern definition means being adapted to position a pattern composed of apertures transparent to the energetic particles in the path of the directed beam, thus forming a patterned beam ( 22 ) emerging from the pattern definition means through the apertures, and
a projection system ( 103 ) positioned after the pattern definition means ( 102 ) and adapted to project the patterned beam ( 22 ) onto a target ( 41 ) positioned after the projection system, the apparatus further comprising at least one acceleration/deceleration means ( 32 , 14 , 17 , 18 ) containing an electric potential gradient oriented substantially parallel to the path of the beam, wherein the electric potential gradient is constant over at least a cross-section of the beam permeating the acceleration/deceleration means.
2. The apparatus of claim 1 , having an acceleration/deceleration means ( 32 , 18 ) realized as a component of the projection system ( 103 ).
3. The apparatus of claim 2 , wherein the projection system comprises a demagnifying projector ( 31 ) which is positioned in front of the acceleration/deceleration means, as seen along the direction of the beam.
4. The apparatus of claim 3 , wherein the acceleration/deceleration means is an electrostatic gradient tube ( 32 ) for acceleration/deceleration of the electrically charged particles by an energy difference corresponding to more than 50 kV potential difference.
5. The apparatus of claim 3 , wherein the acceleration/deceleration means is an electrostatic gradient tube ( 32 ) for acceleration/deceleration of the electrically charged particles by an energy difference corresponding to more than 100 kV potential difference.
6. The apparatus of claim 2 , wherein the projection system comprises a demagnifying projector ( 31 ′) which is positioned after the acceleration/deceleration means, as seen along the direction of the beam.
7. The apparatus of claim 6 , wherein the acceleration/deceleration means is an electrostatic gradient tube ( 17 , 18 ) for deceleration to energies below n·20 eV, where n is the charge number of the electrically charged particles.
8. The apparatus of claim 1 , having an acceleration/deceleration means ( 14 , 17 ) being positioned immediately in front of the pattern definition means ( 102 ), as seen along the direction of the beam.
9. The apparatus of claim 1 , wherein the electric potential gradient is substantially constant along at least a part of the length of the acceleration/deceleration means ( 32 ).
10. The apparatus of claim 1 , wherein the electrically charged particles are multiply charged.
11. The apparatus of claim 1 , wherein the electrically charged particles are heavy ions, Z≧2, preferably, Z≧18.