IP Library Granted Patent US 7,164,293
Granted Patent B2
US 7,164,293 · App. 10/902,204 · Granted Jan 16, 2007

Dynamic latch having integral logic function and method therefor

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Quick Facts
Patent No.
US 7,164,293
App. No.
10/902,204
Granted
Jan 16, 2007
Kind
B2
Abstract

A circuit ( 50 ) that receives dynamic signals performs both logic and latching to achieve high speed operation. The circuit has a clock that defines both an evaluation phase and a precharge phase in which the dynamic signals are evaluated during the evaluation phase. The circuit ( 50 ) functions by precharging a latch node (INT) during the evaluation phase then performing evaluation as well during the evaluation phase. The evaluation results in providing a valid logic state to the latch node. A latch circuit ( 54 ) latches this valid state during the precharge phase and holds it in this valid state during the precharge phase. This can be adapted to select which one of the dynamic signals is to be coupled and latched on the latch node (INT).

Claims (46)

1. A circuit having first and second dynamic signals responsive to a clock signal, comprising:

a first plurality of transistors of a first conductivity type in series coupled between a latch node and a power supply terminal, comprising:

a first transistor for receiving the first dynamic signal;

a second transistor for receiving the second dynamic signal;

a third transistor for receiving a complementary signal that is complementary to the clock signal;

a second plurality of transistors of a second conductivity type in series coupled between the latch node and a second power supply terminal, comprising;

a fourth transistor for receiving the first dynamic signal; and

a fifth transistor for receiving a first select signal;

a third plurality of transistors of the second conductivity type in series coupled between the latch node and the second power supply terminal, comprising:

a sixth transistor for receiving the second dynamic signal; and

a seventh transistor for receiving a second select signal; and

a latch having an input coupled to the latch node and an output coupled to the latch node.

2. The circuit of claim 1 , further comprising an output buffer having an input coupled to the latch node and an output for providing an output of the circuit.

3. The circuit of claim 2 , wherein the output buffer comprises an inverter.

4. The circuit of claim 1 , wherein the first plurality of transistors are further characterized as being P channel.

5. The circuit of claim 1 , wherein the first and second dynamic signals are forced to an inactive state in response to the clock signal switching from a first logic state to a second logic state.

6. The circuit of claim 1 , wherein the first select signal is active when the first dynamic signal is to be provided as an output of the circuit and the second select signal is active when the second dynamic signal is to be provided as an output of the circuit.

7. The circuit of claim 1 , wherein the latch comprises:

a first inverter having an input coupled to the latch node and an output; and

a clocked inverter having an input coupled to the output of the first inverter and an output coupled to the latch node.

8. The circuit of claim 7 , wherein the clocked inverter is clocked by the complementary signal.

9. A circuit operating during alternating evaluation and precharge phases, comprising:

a first plurality of transistors of a first conductivity type in series coupled between a latch node and a power supply terminal, comprising:

a first transistor for receiving a first dynamic signal that is evaluated during the evaluation phase and reset in response to a transition from the evaluation phase to the precharge phase;

a second transistor for receiving a second dynamic signal that is evaluated during the evaluation phase and reset in response to a transition from the evaluation phase to the precharge phase;

a third transistor that is conductive during the evaluation phase and non-conductive during the precharge phase;

a fourth transistor coupled between the latch node and a second power supply terminal for receiving the first dynamic signal;

a fifth transistor coupled between the latch node and a second power supply terminal for receiving the second dynamic signal; and

a latch coupled to the latch node.

10. The circuit of claim 9 wherein the latch node is precharged then evaluated during the evaluation phase and provides a valid logic state during the precharge phase.

11. The circuit of claim 10 , further comprising an output buffer having an input coupled to the latch node and an output for providing an output of the circuit.

12. The circuit of claim 10 , wherein the first plurality of transistors are further characterized as being P channel and the fourth and fifth transistors are characterized as being N channel.

13. The circuit of claim 10 , wherein the latch comprises:

a first inverter having an input coupled to the latch node and an output; and

a second inverter having an input coupled to the output of the first inverter and an output coupled to the latch node.

14. The circuit of claim 13 , wherein the second inverter is a clocked inverter.

15. The circuit of claim 14 , wherein the second inverter is clocked by the complementary clock signal.

16. The circuit of claim 10 , wherein:

the evaluation phase is defined by a true clock being at a first logic state and the precharge phase being defined by the true clock being at a second logic state; and

the third transistor is conductive and non-conductive in response to a complementary clock that is complementary to the true clock.

17. The circuit of claim 16 , wherein the first logic state is a relatively higher voltage than the second logic state.

18. The circuit of claim 10 , further comprising:

a sixth transistor coupled in series with the fourth transistor for receiving a first select signal; and

a seventh transistor coupled in series with the fifth transistor for receiving a second select signal

19. The circuit of claim 18 , wherein the first and second select signals are dynamic signals.

20. The circuit of claim 19 , wherein the first select signal is active when the first dynamic signal is to be provided as an output of the circuit and the second select signal is active when the second dynamic signal is to be provided as an output of the circuit.

Assignments (18)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
323.01(C) ASSIGNMENT OR CHANGE OF NAME IMPROPERLY FILED AND RECORDED BY ANOTHER PERSON AGAINST OWNER'S PATENT Recorded Oct 3, 2019
From: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
To: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Reel/Frame 052459/0656 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 15, 2017
From: NORTH STAR INNOVATIONS INC.
To: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 4, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NORTH STAR INNOVATIONS INC.
Reel/Frame 037694/0264 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0225 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
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