IP Library Granted Patent US 7,407,834
Granted Patent B2
US 7,407,834 · App. 10/902,785 · Granted Aug 5, 2008

Manufacturing method of a semiconductor device

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Quick Facts
Patent No.
US 7,407,834
App. No.
10/902,785
Granted
Aug 5, 2008
Kind
B2
Abstract

A non-leaded resin-sealed semiconductor device is manufactured by the steps of providing a metal substrate having a front surface, a rear surface, a chip fixing partition part, partition parts arranged around the chip fixing partition part, and grooves defined between the partition parts; providing a semiconductor chip having a front surface, a rear surface, electrodes formed on the front surface; fixing the semiconductor chip on the chip fixing partition part of the front surface of the metal substrate; electrically connecting the electrodes of the semiconductor chip with the front surface of the partition parts of the metal substrate by conductive wires, respectively; and forming a resin body which seals the semiconductor chip, the conductive wires, and the front surface of the partition parts of the metal substrate. After the resin body forming step, the rear surface of the metal substrate is etched so as to electrically isolate the partition parts of the metal substrate from one another, and after the etching step, the etched surface of the metal substrateis plated with solder by print-plating method.

Claims (11)

1. A method of manufacturing a semiconductor device comprising the steps of:

providing a metal substrate comprising a front surface, a rear surface opposite to the front surface, a chip fixing partition part on the front surface thereof, a depression formed into the rear surface thereof, grooves formed over the front surface, and partition parts surrounded by the grooves, the grooves being formed around the chip fixing partition part, a dimension of each of the partition parts being smaller than a dimension of the chip fixing partition part, and a bottom surface of the depression is substantially the same size as the chip fixing partition part which corresponds to the bottom surface of the depression across the metal substrate;

providing a semiconductor chip comprising a front surface, a rear surface, electrodes formed on the front surface thereof;

fixing the semiconductor chip over the chip fixing partition part on the front surface of the metal substrate;

electrically connecting the electrodes of the semiconductor chip with the partition parts of the metal substrate by conductive wires, respectively;

forming a resin body which seals the semiconductor chip, the conductive wires, each of the grooves, and the partition parts of the metal substrate;

after the resin body forming step, etching the rear surface of the metal substrate so that the partition parts are separated from each other and a part of the resin body formed in the each of the grooves is protruded from a level of the etched rear surface of each of the partition parts, a height of each of the partition parts being lower than a height of the resin body formed in the grooves; and

after the etching step, forming a solder plating film on the etched rear surface of each of the partition parts by a print-plating method, the solder plating film being thicker than a height of the part of the resin body protruded from the level of the etched rear surface of each of the partition parts.

2. A method of manufacturing a semiconductor device according to claim 1 , wherein the metal substrate providing step, the rear surface of the metal substrate, which is opposite to the front surface having the grooves and the partition parts formed thereon, has no grooves formed thereon.

3. A method of manufacturing a semiconductor device according to claim 1 , wherein the front surface of the partition parts has a square shape.

4. A method of manufacturing a semiconductor device according to claim 1 , wherein each dimension of said each partition part is smaller than a corresponding dimension of the chip fixing partition part.

Assignments (8)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
CHANGE OF NAME Recorded May 12, 2017
From: RENESAS SEMICONDUCTOR KYUSHU YAMAGUCHI CO., LTD.
To: RENESAS SEMICONDUCTOR PACKAGE & TEST SOLUTIONS CO., LTD.
Reel/Frame 042484/0880 →
MERGER Recorded May 12, 2017
From: HITACHI YONEZAWA ELECTRONICS CO., LTD.
To: NORTHERN JAPAN SEMICONDUCTOR TECHNOLOGIES, INC.
Reel/Frame 042595/0189 →
MERGER Recorded May 12, 2017
From: RENESAS NORTHERN JAPAN SEMICONDUCTOR, INC.
To: RENESAS SEMICONDUCTOR KYUSHU YAMAGUCHI CO., LTD.
Reel/Frame 042609/0807 →
CHANGE OF NAME Recorded May 12, 2017
From: NORTHERN JAPAN SEMICONDUCTOR TECHNOLOGIES, INC.
To: RENESAS NORTHERN JAPAN SEMICONDUCTOR, INC.
Reel/Frame 042458/0022 →
MERGER Recorded Jul 7, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024662/0280 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 2, 2004
From: SHIMANUKI, YOSHIHIKO; SUZUKI, MASAYUKI
To: HITACHI, LTD.; HITACHI YONEZAWA ELECTRONICS CO., LTD
Reel/Frame 015650/0337 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 2, 2004
From: HITACHI, LTD.
To: RENESAS TECHNOLOGY CORPORATION
Reel/Frame 015650/0339 →