Method of measuring meso-scale structures on wafers
View Patent ↗A method of measuring at least one parameter associated with a portion of a sample having formed thereon one or more structures with at least two zones each having an associated zone reflectance property. The method includes the steps of illuminating the zones with broadband light, and measuring at least one reflectance property of light reflected from the at least two zones. The measurement includes a substantial portion of non-specularly scattered light, thereby increasing the quality of the measurement. The method further includes the step of fitting a parameterized model to the measured reflectance property. The parameterized model mixes the zone reflectance properties of the zones to account for partially coherent light interactions between the two zones.
1. A test structure for use in the optical monitoring of the fabrication processes on a semiconductor wafer, said test structure comprising:
at least one upper layer having an array formed by an alternating pattern of materials; and
a lower layer defined by a flat reflective material to reduce the number of measurement variables associated with the optical monitoring of the test structure.
2. A test structure as recited in claim 1 , wherein the materials in the alternating pattern are dielectrics.
3. A test structure as recited in claim 2 , wherein the array is in the form of a grating.
4. As test structure as recited in claim 2 , wherein said array is in the form of the three-dimensional grating.