System and method for early detection of failure of a solid-state data storage system
View Patent ↗Various embodiments are disclosed of a failure detection system for a solid-state data storage system that can experience difficulties, such as system failure or loss of data integrity, when it runs out of spare storage locations. Spare storage locations can be used by a solid-state data storage system to replace storage locations that have become defective. In one embodiment, a count is kept of the available spare storage locations in a system, or sub-system, and when the amount of available spare locations drops to a threshold value, an action can be taken to avoid the consequences of an impending failure. In other embodiments, the available spare storage locations are monitored by keeping track of the percentage of initially available spare locations still remaining, by keeping track of the rate of new spare locations being used, or by other techniques. In various embodiments, the early failure detection system responds to detection of a possible impending failure by taking one or more of a variety of actions, including, for example, sending an alert notification, enabling additional storage capacity, copying portions of the data stored in the system to other secure storage locations, shutting the system down, and taking no action.
1. An early failure detection method for a flash memory system that designates a quantity of storage locations as spare storage locations, the early failure detection method comprising:
tracking a total number of spare storage locations that are available on multiple memory cards, wherein the spare storage locations are assigned for use as alternate storage locations in place of defective storage locations;
calculating a percentage of initially available spare storage locations which remain available, based on the total number of spare storage locations;
determining if a threshold value has been reached based on the calculated percentage; and
in the event that the threshold value has been reached, taking a preemptive action to avert impending failure of the flash memory system.
2. A method of determining the usability of a solid-state storage device, the solid-state storage device comprising a plurality of flash memory devices comprising storage locations and spare storage locations, the method comprising predicting the usability of the solid-state storage device based on a total number of unused spare storage locations in the solid-state storage device,
wherein the spare storage locations are assigned for use in place of defective storage locations, and
wherein the act of predicting the usability of the solid-state storage device comprises calculating a percentage of initially available spare storage locations which remain available, based on the total number of spare storage locations, and determining if a threshold value has been reached based on the calculated percentage.
3. The method of claim 2 , wherein the act of predicting the usability of the solid-state storage device further comprises monitoring the frequency of the occurrence of defects in the storage locations.
4. The method of claim 2 , wherein the act of predicting the usability of the solid-state storage device further comprises monitoring the rate of change in the frequency of the occurrence of defects in the storage locations.
5. A method of monitoring the life expectancy of a solid-state memory device, the method comprising:
calculating a percentage of initially available spare storage locations which remain available, based on the total number of spare storage locations available in an array of flash memory cards of the solid-state memory device, wherein the spare storage locations are assigned for use in place of defective storage locations in the solid-state storage device;
determining if a threshold value has been reached based on the calculated percentage; and
performing an action when the threshold value has been reached, so as to avoid the consequences of the failure of the flash memory cards.
6. The method of claim 5 , wherein the threshold value is maintained by a controller in the solid-state memory device.
7. The method of claim 5 , wherein the threshold value is based on the number of spare storage locations typically available within other solid-state memory devices similar to the solid-state memory device.
8. A flash memory device comprising:
a plurality of flash storage devices each comprising:
a plurality of storage locations; and
a plurality of spare storage locations assigned for use in place of defective storage locations; and
processor circuitry configured to calculate a percentage of initially available spare storage locations which remain available based on the total number of spare storage locations available in the flash memory device, determine if a threshold value has been reached based on the calculated percentage, and perform an action when the threshold value has been reached.
9. The flash memory device of claim 8 , wherein at least one flash storage device of the plurality of flash storage devices in the flash memory device is a flash memory card.
10. The flash memory device of claim 8 , wherein at least one flash storage device of the plurality of flash storage devices in the flash memory device is a flash memory chip.
11. The flash memory device of claim 8 , wherein the flash plurality of flash storage devices is an array of flash memory cards.
12. The flash memory device of claim 8 , wherein storage locations can be dynamically allocated as spare storage locations.
13. The flash memory device of claim 8 , wherein the action performed by the processor circuitry allows for the use of other unused spare storage locations accessible by the flash memory device to serve as supplemental spare storage locations.
14. The flash memory device of claim 8 , wherein the processor circuitry is further configured to evaluate the number of available spare storage locations by referring to a counter that is based on the number of times new spare storage locations are used.
15. The flash memory device of claim 8 , wherein the processor circuitry is further configured to evaluate the number of available spare storage locations by evaluating available spare storage locations at predetermined time intervals.
16. The flash memory device of claim 8 , wherein the processor circuitry is further configured to evaluate the number of available spare storage locations upon request by a host system.
17. A system for determining the usability of a solid-state storage device, the system comprising:
means for monitoring the number of available spare storage locations in multiple memory cards of the solid-state storage device, wherein the spare storage locations are assigned for use in place of defective storage locations;
means for calculating a percentage of initially available spare storage locations which remain available, based on the total number of spare storage locations available in the multiple memory cards;
means for determining if a threshold value has been reached based on the calculated percentage; and
means for performing an action when the threshold value has been reached, so as to avert the consequences of the potential failure of the solid-state storage device.