IP Library Granted Patent US 7,221,188
Granted Patent B2
US 7,221,188 · App. 10/967,563 · Granted May 22, 2007

Logic circuitry

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Quick Facts
Patent No.
US 7,221,188
App. No.
10/967,563
Granted
May 22, 2007
Kind
B2
Abstract

A logic circuit including at least one evaluate circuit coupled to a static output logic circuit. In one example, the evaluate circuit includes a dynamic node, a full keeper, an evaluate device, and a logic tree. In some examples, the output logic circuit is a sampled static output logic circuit and includes a sample device. In some examples, the logic circuit includes multiple evaluate circuits, each with a dynamic node coupled to a control gate of a transistor of the output logic circuit. Some examples may include a delay in a clock signal to increase the internal race margin.

Claims (126)

1. A logic circuit comprising:

an evaluate circuit having a plurality of inputs, the evaluate circuit including a dynamic node, the evaluate circuit including an evaluate device having an input coupled to a clock line, the evaluate circuit including a full keeper coupled to the dynamic node;

a static output circuit including a first input coupled to the dynamic node, the static output circuit including a sample device, the sample device including an input coupled to the clock line, the static output circuit including an output;

a second evaluate circuit having a second plurality of inputs, the second evaluate circuit including a second dynamic node, the second evaluate circuit including a second evaluate device having an input coupled to a clock line, the second evaluate circuit including a second full keeper coupled to the second dynamic node;

wherein the static output circuit includes a second input coupled the second dynamic node;

wherein the full keeper includes:

a first transistor having a first current terminal coupled to a first voltage supply, the first transistor having a second terminal coupled to the dynamic node;

a second transistor having a third current terminal coupled to the dynamic node;

wherein the first transistor, the second transistor, and the evaluate device are coupled in series.

2. The logic circuit of claim 1 wherein:

the evaluate device includes a transistor.

3. The logic circuit of claim 1 wherein the sample device includes a transistor.

4. The logic circuit of claim 3 wherein:

the static output circuit includes a second transistor having a control terminal coupled to the first input;

the transistor is coupled in series to the second transistor.

5. The logic circuit of claim 1 wherein a control terminal for the first transistor and a control terminal for the second transistor are connected.

6. The logic circuit of claim 1 wherein a control terminal for the first transistor and a control terminal for the second transistor are each coupled to the dynamic node.

7. The logic circuit of claim 6 wherein the control terminal for the first transistor and the control terminal for the second transistor are each coupled to the dynamic node via an inverter.

8. The logic circuit of claim 1 wherein the second transistor includes a fourth current terminal coupled to a current terminal of the evaluate device.

9. The logic circuit of claim 8 wherein:

the evaluate device includes a third transistor, the fourth current terminal is connected to a current terminal of the third transistor.

10. The logic circuit of claim 1 wherein:

the second terminal is characterized as a current terminal.

11. The logic circuit of claim 1 wherein the static output circuit is a sampled static output circuit.

12. The logic circuit of claim 1 further comprising:

an inverter having an input connected to the output.

13. The logic circuit of claim 1 wherein the plurality of inputs are coupled in one of an AND configuration or an OR configuration.

14. The logic circuit of claim 1 further comprising:

a delay circuit, the input of the sample device being coupled to the clock line via the delay circuit.

15. A logic circuit comprising:

an evaluate circuit having a plurality of inputs, the evaluate circuit including a dynamic node, the evaluate circuit including an evaluate device having an input coupled to a clock line, the evaluate circuit including a full keeper coupled to the dynamic node;

a static output circuit including a first input coupled to the dynamic node, the static output circuit including a sample device, the sample device including an input coupled to the clock line, the static output circuit including an output;

wherein the static output circuit implements a logic function described by an equation in which an outside operator is one of an AND or AND-INVERT;

a precharge circuit, the precharge circuit having an output to precharge the dynamic node, the precharge circuit having an input coupled to the clock line.

16. The logic circuit of claim 15 further comprising:

a second evaluate circuit having a second plurality of inputs, the second evaluate circuit including a second dynamic node, the second evaluate circuit including a second evaluate device having an input coupled to the clock line, the second evaluate circuit including a second full keeper coupled to the second dynamic node;

wherein the static output circuit includes a second input coupled the second dynamic node.

17. A logic circuit comprising:

an evaluate circuit having a plurality of inputs, the evaluate circuit including a dynamic node, the evaluate circuit including an evaluate device having an input coupled to a clock line, the evaluate circuit including a full keeper coupled to the dynamic node;

a static output circuit including a first input coupled to the dynamic node, the static output circuit including a sample device, the sample device including an input coupled to the clock line, the static output circuit including an output;

a second evaluate circuit having a second plurality of inputs, the second evaluate circuit including a second dynamic node, the second evaluate circuit including a second evaluate device having an input coupled to a clock line, the second evaluate circuit including a second full keeper coupled to the second dynamic node;

wherein the static output circuit includes a second input coupled the second dynamic node;

wherein the static output circuit includes a transistor having a control terminal connected to the dynamic node, a first current terminal connected to the output of the static output circuit, and a second current terminal coupled to a voltage supply.

18. A logic circuit comprising:

an evaluate circuit having a plurality of inputs, the evaluate circuit including a dynamic node, the evaluate circuit including an evaluate device having an input coupled to a clock line, the evaluate circuit including a full keeper coupled to the dynamic node;

a static output circuit including a first input coupled to the dynamic node, the static output circuit including a sample device, the sample device including an input coupled to the clock line, the static output circuit including an output;

a second evaluate circuit having a second plurality of inputs, the second evaluate circuit including a second dynamic node, the second evaluate circuit including a second evaluate device having an input coupled to a clock line, the second evaluate circuit including a second full keeper coupled to the second dynamic node;

wherein the static output circuit includes a second input coupled the second dynamic node;

wherein the evaluate circuit includes a plurality of transistors, each transistor of the plurality includes a first current terminal connected to the dynamic node and a second current terminal connected to a current terminal of the evaluate device.

19. A logic circuit comprising:

an evaluate circuit having a plurality of inputs, the evaluate circuit including a dynamic node, the evaluate circuit including an evaluate device having an input coupled to a clock line, the evaluate circuit including a full keeper coupled to the dynamic node;

a static output circuit including a first input coupled to the dynamic node, the static output circuit including a sample device, the sample device including an input coupled to the clock line, the static output circuit including an output;

a second evaluate circuit having a second plurality of inputs, the second evaluate circuit including a second dynamic node, the second evaluate circuit including a second evaluate device having an input coupled to a clock line, the second evaluate circuit including a second full keeper coupled to the second dynamic node;

wherein the static output circuit includes a second input coupled the second dynamic node;

a precharge circuit, the precharge circuit having an output to precharge the dynamic node, the precharge circuit having an input coupled to the clock line.

20. The logic circuit of claim 19 wherein:

the dynamic node is at a voltage dependent upon voltages of the plurality of inputs when a clock signal applied at the input of the sample device is at a first clock state;

the voltage of the dynamic node is at a predetermined voltage when a clock signal applied to the input of the precharge circuit is at a second clock state opposite the first clock state.

21. A logic circuit comprising:

a first evaluate circuit including a first plurality of inputs, the first evaluate circuit including a first dynamic node;

a second evaluate circuit including a second plurality of inputs, the second evaluate circuit including a second dynamic node;

a static output circuit including a first input coupled to the first dynamic node, the static output circuit including a second input coupled to the second dynamic node, the static output circuit including a sample device including an input coupled to a clock line, the static output circuit including an output;

wherein:

the first evaluate circuit includes a first full keeper coupled to the first dynamic node;

the second evaluate circuit includes a second full keeper coupled to the second dynamic node;

the static output circuit includes a first transistor having a control terminal coupled to the first input;

the static output circuit include a second transistor having a control terminal coupled to the second input;

the sample device includes a third transistor having a control terminal coupled to the clock line;

the third transistor is coupled in series with the first transistor;

the third transistor is coupled in series with the second transistor.

22. The logic circuit of claim 21 wherein the first transistor and the second transistor are coupled in series.

23. The logic circuit of claim 21 wherein the first transistor and the second transistor are coupled in parallel.

24. The logic circuit of claim 21 further comprising:

a third evaluate circuit having a third plurality of inputs, the third evaluate circuit including a third dynamic node;

wherein the static output circuit includes a third input coupled to the third dynamic node.

25. The logic circuit of claim 21 wherein:

the first evaluate circuit includes a first evaluate device having an input coupled to the clock line;

the second evaluate circuit includes a second evaluate device having an input coupled to the clock line.

26. The logic circuit of claim 25 wherein:

the first dynamic node is at a voltage dependent upon voltages of the first plurality of inputs when a clock signal applied at the input of the first evaluate device is at a first clock state;

the second dynamic node is at a voltage dependent upon voltages of the second plurality of inputs when a clock signal applied at the input of the second evaluate device is at a first clock state.

27. The logic circuit of claim 26 wherein:

the first dynamic node is at a predetermined voltage when a clock signal applied at the input of the first evaluate device is at a second clock state opposite the first clock state;

the second dynamic node is at a predetermined voltage when a clock signal applied at the input of the second evaluate device is at a second clock state opposite the first clock state.

28. The logic circuit of claim 21 wherein:

the first evaluate circuit includes a first logic tree including inputs coupled to the first plurality of inputs;

the second evaluate circuit includes a second logic tree including inputs coupled to the second plurality of inputs.

29. The logic circuit of claim 21 wherein the static output circuit implements a logical NAND function at its output.

30. A logic circuit comprising:

a first evaluate circuit including a first plurality of inputs, the first evaluate circuit including a first dynamic node;

a second evaluate circuit including a second plurality of inputs, the second evaluate circuit including a second dynamic node;

a static output circuit including a first input coupled to the first dynamic node, the static output circuit including a second input coupled to the second dynamic node, the static output circuit including a sample device including an input coupled to a clock line, the static output circuit including an output;

wherein:

the static output circuit includes a first transistor having a control terminal coupled to the first input;

the static output circuit include a second transistor having a control terminal coupled to the second input;

the sample device includes a third transistor having a control terminal coupled to the clock line;

the third transistor is coupled in series with the first transistor;

the third transistor is coupled in series with the second transistor;

the static output circuit further comprises a fourth transistor, the fourth transistor includes a control terminal coupled to the clock line;

the fourth transistor is coupled in series with the first transistor;

the fourth transistor is coupled in series with the second transistor;

the fourth transistor is coupled in series with the third transistor.

31. The logic circuit of claim 30 wherein the fourth transistor is of a first conductivity type and the third transistor is of a second conductivity type opposite the first conductivity type.

32. A logic circuit comprising:

a first evaluate circuit including a first plurality of inputs, the first evaluate circuit including a first dynamic node;

a second evaluate circuit including a second plurality of inputs, the second evaluate circuit including a second dynamic node;

a static output circuit including a first input coupled to the first dynamic node, the static output circuit including a second input coupled to the second dynamic node, the static output circuit including a sample device including an input coupled to a clock line, the static output circuit including an output;

a third evaluate circuit having a third plurality of inputs, the third evaluate circuit including a third dynamic node;

wherein:

the first evaluate circuit includes a first full keeper coupled to the first dynamic node;

the second evaluate circuit includes a second full keeper coupled to the second dynamic node;

wherein the static output circuit includes a third input coupled to the third dynamic node;

the static output circuit includes a first transistor having a control terminal coupled to the first input;

the static output circuit includes a second transistor having a control terminal coupled to the second input;

the static output circuit include a third transistor having a control terminal coupled to the third input;

the sample device includes a fourth transistor having a control terminal coupled to the clock line;

the fourth transistor is coupled in series with the first transistor;

the fourth transistor is coupled in series with the second transistor;

the fourth transistor is coupled in series with the third transistor.

33. A logic circuit comprising:

an evaluate circuit having a plurality of inputs, the evaluate circuit including a dynamic node, the evaluate circuit including an evaluate transistor having an input coupled to a clock line, the evaluate circuit including a full keeper, the full keeper including a first transistor having a first current terminal coupled to a voltage supply and a second current terminal connected to the dynamic node, the full keeper including a second transistor having a first current terminal connected to the dynamic node, the first transistor and the second transistor each including a control terminal coupled to the dynamic node;

a static output circuit including a third transistor having a control terminal coupled to the dynamic node, the static output circuit including a sample transistor having a control terminal coupled to the clock line, the static output circuit including an output, the static output circuit including a fourth transistor having a control terminal coupled to the clock line coupled to the control terminal of the sample transistor, wherein the third transistor, the fourth transistor, and the sample transistor are coupled in series.

34. The logic circuit of claim 33 wherein the output is coupled a current terminal of the third transistor.

35. The logic circuit of claim 33 wherein the static output circuit further includes:

a fourth transistor having a control terminal coupled to the dynamic node, a first current terminal coupled to the output, and a second current terminal coupled to a voltage supply.

36. The logic circuit of claim 33 wherein the control terminal of the sample transistor is coupled to a delay circuit.

Assignments (23)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
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From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
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To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
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To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
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To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
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SECURITY AGREEMENT Recorded Nov 6, 2013
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To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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To: CITIBANK, N.A., AS COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Nov 1, 2007
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