Methods for manufacturing semiconductor device

1 . A method of fabricating a semiconductor device comprising:

forming a gate electrode on an active region of a semiconductor substrate;

forming spacers on the sidewalls of the gate electrode;

implanting impurity ions for a source/drain region at a high concentration into the active region of the semiconductor substrate by using the gate electrode and the spacers as an ion implantation mask;

depositing an interlayer dielectric layer over the semiconductor substrate including the gate electrode and the spacers;

forming contact holes through the interlayer dielectric layer, wherein the contact holes expose some portion of the top surface of the source/drain region and the gate electrode;

depositing a barrier metal layer for silicide layers along the top surface of the interlayer dielectric layer and along the sidewalls and the bottoms of the contact holes; and

performing a thermal treatment process to activate the impurity ions in the source/drain region and form silicide layers on the source/drain region and the gate electrode.

2 . A method as defined by claim 1 , wherein the thermal treatment process is a rapid thermal treatment process, which is performed in an inert gas atmosphere at a temperature between about 800° C. and about 1050° C. for about 10 seconds to about 30 seconds.

3 . A method as defined by claim 1 , wherein the barrier metal layer is a Ti/TiN layer.

4 . A method of fabricating a semiconductor device comprising:

forming a source/drain region in an active region of a semiconductor substrate on which a gate insulating layer and a gate electrode are formed, wherein the gate insulating layer and gate electrode are positioned between the source region and the drain region;

depositing an interlayer dielectric layer over the semiconductor substrate including the gate electrode;

forming contact holes through the interlayer dielectric layer, wherein the contact holes expose some portion of the top surface of the gate electrode and the source/drain region;

implanting impurity ions into the source/drain region;

depositing a barrier metal layer along the top surface of the interlayer dielectric layer and along the sidewalls and the bottoms of the contact holes; and

performing a thermal treatment process to form a silicide layer on the source/drain region.

5 . A method as defined by claim 4 , wherein the impurity ions are Ge ions or Si ions.

6 . A method as defined by claim 5 , wherein the impurity ions are implanted at a dose between about 1E14 ions/cm 2 and about 1E15 ions/cm 2 under an energy level between about 10 keV and about 50 keV.

7 . A method as defined by claim 4 , wherein the barrier metal layer is a Ti/TiN layer.

8 . A method as defined by claim 4 , wherein the thermal treatment process is a rapid thermal treatment process, which is performed for about 10 seconds to about 60 seconds at a temperature between about 600° C. and about 800° C. in an inert gas atmosphere.

9 . A method of fabricating a semiconductor device comprising:

forming a source/drain region in an active region of a semiconductor substrate on which an gate insulating layer and a gate electrode are formed, wherein the gate insulating layer and gate electrode are positioned between the source region and the drain region;

depositing an interlayer dielectric layer over the semiconductor substrate including the gate electrode;

forming contact holes through the interlayer dielectric layer, wherein the contact holes expose some portion of the top surface of the gate electrode and the source/drain region;

depositing a barrier metal layer along the top surface of the interlayer dielectric layer and along the sidewalls and the bottoms of the contact holes;

implanting impurity ions into the barrier metal layer; and

performing a thermal treatment process to form a silicide layer on the source/drain region.

10 . A method as defined by claim 9 , wherein the impurity ions have the same conduction type as that of the source/drain region.

11 . A method as defined by claim 10 , wherein the impurity ions are B ions or BF 2 ions and are implanted into the barrier metal layer on the region for PMOS transistor of the semiconductor substrate.

12 . A method as defined by claim 11 , wherein the B ions are implanted at a dose of between about 1E14 ions/cm 2 and about 1E15 ions/cm 2 under an energy level between about 2 keV and about 15 keV.

13 . A method as defined by claim 11 , wherein the BF 2 ions are implanted at a dose of between about 2E14 ions/cm 2 and about 2E15 ions/cm 2 under an energy level between about 10 keV and about 50 keV.

14 . A method as defined by claim 10 , wherein the impurity ions are As ions or P ions and are implanted into the barrier metal layer on the region for NMOS transistor of the semiconductor substrate.

15 . A method as defined by claim 14 , wherein the As ions are implanted at a dose of between about 1E14 ions/cm 2 and about 1E15 ions/cm 2 under an energy level between about 30 keV and about 70 keV.

16 . A method as defined by claim 14 , wherein the P ions are implanted at a dose of between about 1E14 ions/cm 2 and about 1E15 ions/cm 2 under an energy level between about 10 keV and about 40 keV.

17 . A method as defined by claim 9 , wherein the barrier metal layer is a Ti/TiN layer.

18 . A method as defined by claim 9 , wherein the thermal treatment process is a rapid thermal treatment process, which is performed for about 10 seconds to about 60 seconds at a temperature between about 600° C. and about 800° C. in an inert gas atmosphere.