Granted Patent B2

US 7,202,678 · App. 11/018,133 · Granted Apr 10, 2007

Abstract

Claims (107)

1. A test probe tip or contact comprising:

(a) resistive material having a longitudinal axis, said resistive material comprising:

(i) a plurality of longitudinally extending resistive/conductive members, at least one resistive/conductive member having a first resistive/conductive member end and a second resistive/conductive member end;

(ii) encapsulating material enclosing said plurality of longitudinally extending resistive/conductive members which are dispersed throughout said encapsulating material; and

(iii) said first resistive/conductive member end and said second resistive/conductive member end exposed from said encapsulating material to provide electrical contacts; and

(b) said test probe tip constructed substantially from said resistive material, said test probe tip comprising:

(i) a probing end at said first resistive/conductive member end, said probing end for probing electronic circuitry; and

(ii) a connection end at said second resistive/conductive member end, said connection end for interfacing with a probing head.

2. The test probe tip of claim 1 wherein said resistive material is pultruded resistive material.

3. The test probe tip of claim 1 wherein said encapsulating material is nonconductive encapsulating material.

4. The test probe tip of claim 1 wherein said resistive material is pultruded rod.

5. The test probe tip of claim 1 wherein said test probe tip is constructed entirely of said resistive material.

6. The test probe tip of claim 1 wherein said plurality of longitudinally extending resistive/conductive members are conductive fiber elements.

7. The test probe tip of claim 1 wherein said resistive/conductive members is nonmetallic.

8. A probing system comprising:

(a) a probing head having a connection mechanism;

(b) a test probe tip constructed substantially from resistive material;

(c) said resistive material having a longitudinal axis, said resistive material comprising:

(i) a plurality of longitudinally extending resistive/conductive members, at least one resistive/conductive member having a first resistive/conductive member end and a second resistive/conductive member end;

(ii) encapsulating material enclosing said plurality of longitudinally extending resistive/conductive members which are dispersed throughout said encapsulating material; and

(iii) said first resistive/conductive member end and said second resistive/conductive member end exposed from said encapsulating material to provide electrical contacts; and

(d) said test probe tip comprising:

(i) a probing end at said first resistive/conductive member end, said probing end for probing electronic circuitry; and

(ii) a connection end at said second resistive/conductive member end, said connection end for interfacing with said connection mechanism of said probing head.

9. The test probe tip of claim 8 wherein said test probe tip is constructed entirely of said resistive material.

10. The test probe tip of claim 8 wherein said plurality of longitudinally extending resistive/conductive members are nonmetallic.

11. A test probe tip or contact comprising:

(a) resistive material comprising:

(i) resistive conducting material;

(ii) encapsulating material; and

(iii) said encapsulating material substantially enclosing said resistive conducting material such that said resistive conducting material is dispersed throughout said encapsulating material;

(b) said test probe tip constructed substantially from said resistive material, said test probe tip comprising:

(i) a probing end for probing electronic circuitry; and

(ii) a connection end for interfacing with a probing head; and

(c) said resistive conducting material forming at least one path through said encapsulating material from said probing end to said connection end.

12. The test probe tip or contact of claim 11 wherein said resistive conducting material is a plurality of longitudinally extending resistive/conductive members.

13. The test probe tip or contact of claim 11 wherein said resistive conducting material is a plurality of conductive fiber elements.

14. The test probe tip or contact of claim 11 wherein said resistive material is formed by pultrusion.

15. The test probe tip or contact of claim 11 wherein said resistive material is formed by molding.

16. The test probe tip or contact of claim 11 wherein said resistive conducting material is selected from the group consisting of:

(a) carbon;

(b) carbon/graphite;

(c) nichrome; and

(d) graphite.

17. The test probe tip or contact of claim 11 wherein said encapsulating material is selected from the group consisting of:

(a) a polymer;

(b) structural thermoplastic;

(c) thermosetting resins;

(d) polyesters;

(e) epoxies;

(f) vinyl esters;

(g) polyetheretherketones;

(h) polyetherimides;

(i) polyethersulphones;

(j) polypropylene;

(k) nylon;

(l) an elastomeric matrix;

(m) a silicone;

(n) fluorosilicone; and

(o) polyurethane elastomer.

18. The test probe tip or contact of claim 11 wherein said resistive conducting material is a plurality of particulate resistive/conductive members.

19. The test probe tip or contact of claim 11 wherein said resistive conducting material is nonmetallic.

20. A probing system comprising:

(a) a probing head having at least one connection mechanism;

(b) a test probe tip constructed substantially from resistive material, said test probe tip comprising:

(i) a probing end for probing electronic circuitry; and

(ii) a connection end for interfacing with a probing head;

(c) said resistive material comprising:

(i) resistive conducting material;

(ii) encapsulating material;

(iii) said resistive conducting material forming at least one path through said encapsulating material from said probing end to said connection end; and

(iv) said encapsulating material substantially enclosing said resistive conducting material such that said resistive conducting material is dispersed throughout said encapsulating material.

21. The probing system of claim 20 wherein said resistive conducting material is a plurality of longitudinally extending resistive/conductive members.

22. The probing system of claim 20 wherein said resistive conducting material is a plurality of conductive fiber elements.

23. The probing system of claim 20 wherein said resistive material is formed by pultrusion.

24. The probing system of claim 20 wherein said resistive material is formed by molding.

25. The probing system of claim 20 wherein said resistive conducting material is selected from the group consisting of:

(a) carbon;

(b) carbon/graphite;

(c) nichrome; and

(d) graphite.

26. The probing system of claim 20 wherein said encapsulating material is selected from the group consisting of:

(a) a polymer;

(b) structural thermoplastic;

(c) thermosetting resins;

(d) polyesters;

(e) epoxies;

(f) vinyl esters;

(g) polyetheretherketones;

(h) polyetherimides;

(i) polyethersulphones;

(j) polypropylene;

(k) nylon;

(l) an elastomeric matrix;

(m) a silicone;

(n) fluorosilicone; and

(o) polyurethane elastomer.

27. The probing system of claim 20 wherein said resistive conducting material is nonmetallic.

28. A test probe tip or contact comprising:

(a) pultruded resistive material having a longitudinal axis, said pultruded resistive material comprising:

(i) a plurality of longitudinally extending resistive/conductive members, at least one resistive/conductive member having a first resistive/conductive member end and a second resistive/conductive member end;

(ii) nonconductive encapsulating material enclosing said plurality of longitudinally extending resistive/conductive members which are dispersed throughout said encapsulating material; and

(iii) said first resistive/conductive member end and said second resistive/conductive member end exposed from said nonconductive encapsulating material to provide electrical contacts;

(b) said test probe tip constructed entirely from said pultruded resistive material, said test probe tip comprising:

(i) a probing end at said first resistive/conductive member end, said probing end for probing electronic circuitry; and

(ii) a connection end at said second resistive/conductive member end, said connection end for interfacing with a probing head.

29. The test probe tip or contact of claim 28 wherein said plurality of longitudinally extending resistive/conductive members are nonmetallic.

Assignments (8)