Patent Assignment
Reel/Frame 026826/0850
Security Agreement
Recorded: 2011-08-30
Pages: 16
Assignor
LECROY CORPORATION
Executed: 2011-08-08
Assignee
RBS CITIZENS, N.A., AS ADMINISTRATIVE AGENT
711 WESTCHESTER AVENUE, WHITE PLAINS, NEW YORK, 10604
Covered Properties
(135)
Test Probe
Patent:
4,423,373 →
Application:
06/243,993 →
Programmable Delay Device
Patent:
4,482,826 →
Application:
06/349,051 →
High-Speed Sampling Arrangement and Apparatus Using Same
Patent:
5,257,025 →
Application:
06/743,695 →
Coarse/Fine a-D Converter Using Ramp Waveform to Generate Fine Digital Signal
Patent:
4,734,677 →
Application:
06/900,994 →
Method and Apparatus for Recovering Clock Information from a Received Digital Signal and for Synchronizing That Signal
Patent:
4,805,197 →
Application:
06/944,249 →
Coarse\Fine a-D Converter Using Ramp Waveform to Generate Fine Digital Signal
Patent:
4,804,939 →
Application:
07/089,471 →
High-Speed Switching Tree with Input Sampling Pulses of Constant Frequency and Means for Varying the Effective Sampling Rate
Patent:
5,218,363 →
Application:
07/760,165 →
Apparatus and Method for Acquiring and Detecting Stale Data
Patent:
5,384,713 →
Application:
07/781,765 →
Signal Probe with Remote Control Function
Patent:
5,293,122 →
Application:
07/895,101 →
Method and Apparatus for Compacting Digital Time Series Data for Display on a Digital Oscilloscope
Patent:
5,255,365 →
Application:
07/956,556 →
Charge Sampling Circuit
Patent:
6,225,837 →
Application:
08/210,298 →
Very High Speed Precision Amplifier
Patent:
5,467,056 →
Application:
08/224,883 →
Delta Sigma Analog-to-Digital Converter with Temporally Interleaved Architecture
Patent:
5,621,408 →
Application:
08/394,427 →
Vernier Delay Line Interpolator and Coarse Counter Realignment
Patent:
5,703,838 →
Application:
08/602,904 →
Digital Oscilloscope Display and Method Therefor
Patent:
6,151,010 →
Application:
08/653,288 →
Multi-Range Analog-to-Digital Converter with Multi-Range Switching
Patent:
5,835,050 →
Application:
08/735,928 →
Vernier Delay Line Interpolator and Coarse Counter Realignment
Patent:
5,838,754 →
Application:
08/814,835 →
Method and System for Characterizing Terminations in a Local Area Network
Patent:
6,016,464 →
Application:
08/890,486 →
Computer Network Cross-Connect Panel Providing Physical Layer Monitoring and Method Therefor
Patent:
6,356,532 →
Application:
08/995,041 →
Recording Medium Failure Analysis Apparatus and Method
Digital Storage Oscilloscope with Simultaneous Primary Measurement and Derived Parameter Display on Common Time Axis and Method Therefor
Patent:
6,195,617 →
Application:
09/037,155 →
Self-Calibration of an Oscilloscope Using a Square-Wave Test Signal
Patent:
6,269,317 →
Application:
09/066,167 →
Waveform Translator for Dc to 75 Ghz Oscillography
Patent:
6,242,899 →
Application:
09/096,993 →
Apparatus and Method for Measuring Time Intervals with Very High Resolution
Patent:
6,137,749 →
Application:
09/155,670 →
Optical Recording Measurement Package
Patent:
6,112,160 →
Application:
09/155,969 →
Delta Sigma Analog-to-Digital Converter for Producing Multiple Digital Output Signals
Patent:
6,292,121 →
Application:
09/351,250 →
Method and System for Performing Time Domain Reflectometry Contemporaneously with Recurrent Transmissions on Computer Network
Patent:
6,657,437 →
Application:
09/440,293 →
Computer Network Physical-Layer Analysis Method and System
Patent:
6,829,223 →
Application:
09/474,390 →
Process for removing cyanide ion from cadmium plating rinse waters
Patent:
6,358,424 →
Application:
09/551,739 →
Legs for Forming a Tripod with an Electrical Test Probe Tip
Patent:
6,462,529 →
Application:
09/629,016 →
Electrical Test Probe Wedge Tip
Patent:
6,518,780 →
Application:
09/629,017 →
Notched Electrical Test Probe Tip
Patent:
6,538,424 →
Application:
09/629,018 →
Automatic Probe Identification System
Patent:
6,437,552 →
Application:
09/629,246 →
Cartridge System for a Probing Head for an Electrical Test Probe
Patent:
6,605,934 →
Application:
09/629,258 →
Method and Apparatus for Increasing Bandwidth in Sampled Systems
Patent:
6,542,914 →
Application:
09/669,955 →
Digital storage oscilloscope with simultaneous primary measurement and derived parameter display on common time axis and method therefor
Oscilloscope Panel Capture and Implementation
Streaming Architecture for Waveform Processing
System for Defining Internal Variables by Selecting and Confirming the Selected Value Is Within a Defined Range of Values
Measurement Icons for Digital Oscilloscopes
Data Compaction for Fast Display
Parallel Decimation Circuits
Precise Synchronization of Distributed Systems
Scaling Persistence Data with Interpolation
Context Sensitive Toolbar
Electrical Test Probe Flexible Spring Tip
Protocol Analyzer and Time Precise Method for Capturing Multi-Directional Packet Traffic
Patent:
7,173,943 →
Application:
10/082,886 →
Sample Synthesis for Matching Digitizers in Interleaved Systems
Patent:
6,567,030 →
Application:
10/090,047 →
Digital Frequency Response Compensator and Arbitrary Response Generator System
Active Differential Test Probe with a Transmission Line Input Structure
Patent:
6,822,463 →
Application:
10/261,829 →
User Defined Processing Function
Modular Active Test Probe and Removable Tip Module Therefor
Patent:
6,956,362 →
Application:
10/321,408 →
Self-Calibrating Electrical Test Probe
Patent:
6,870,359 →
Application:
10/321,422 →
Notched Electrical Test Probe Tip
Electrical Test Probe Wedge Tip
Calibration Cache and Database
Method and Apparatus for the Recovery of Signals Acquired by an Interleaved System of Digitizers with Mismatching Frequency Response Characteristics
Cartridge System for a Probing Head for an Electrical Test Probe
Method and Apparatus for Bit Error Rate Analysis
Method and Apparatus for Analyzing Serial Data Streams
Method of Analyzing Serial Data Streams
Digital Group Delay Compensator
Method and Apparatus for Determining Inter-Symbol Interference for Estimating Data Dependent Jitter
High Bandwidth Real-Time Oscilloscope
Guide for Tip to Transmission Path Contact
Patent:
7,317,312 →
Application:
10/781,146 →
Simultaneous Physical and Protocol Layer Analysis
Reflection Filter
Digital Oscilloscope Display and Method for Image Quality Improvement
Dual Tip Probe
Method of Fabricating a Notched Electrical Test Probe Tip
Guide for Tip to Transmission Path Contact
Patent:
7,173,439 →
Application:
10/975,769 →
Transmission Line Input Structure Test Probe
Patent:
7,019,544 →
Application:
10/995,801 →
Cartridge System for a Probing Head for an Electrical Test Probe
Cable and Substrate Compensating Custom Resistor
Patent:
7,042,232 →
Application:
11/018,059 →
Resistive Probe Tips
Cap at Resistors of Electrical Test Probe
Bendable Conductive Connector
Patent:
7,221,179 →
Application:
11/019,325 →
Parallel Decimation Circuits
Self-Calibrating Electrical Test Probe Calibratable While Connected to an Electrical Component Under Test
Patent:
7,180,314 →
Application:
11/086,008 →
Report Generating Method and Apparatus
Track of Statistics
Modular Active Test Probe and Removable Tip Module Therefor
Patent:
7,432,698 →
Application:
11/197,911 →
Use of Multiple Data Comparators in Parallel to Trigger an Oscilloscope on a Pattern Found in a Serial Data Stream
Data Decoder
High Bandwidth Real-Time Oscilloscope
Method and Apparatus for Artifact Signal Reduction in Systems of Mismatched Interleaved Digitizers
High Bandwidth Oscilloscope
High Bandwidth Real Time Oscilloscope
Pattern Trigger in a Coherent Timebase
Sequential Timebase
Planar on Edge Probing Tip with Flex
Patent:
7,262,614 →
Application:
11/352,128 →
Measuring Components of Jitter
Digital Frequency Response Compensator and Arbitrary Response Generator System
Patent:
39,693 →
Application:
11/364,796 →
Adaptive Interpolation
Probe Using High Pass Ground Signal Path
High Speed Signal Transmission Line Having Reduced Thickness Regions
Probing High-Frequency Signals
Thermal Tail Compensation
Common Mode Regulation for Thermal Tail Compensation
High Bandwidth Real Time Oscilloscope
Estimating Bit Error Rate Performance of Signals
Method of Compensating for Deterministic Jitter Due to Interleave Error
Ultra Low Power Cmos Oscillator for Low Frequency Clock Generation
Adjustable Resistance
Probing Blade Conductive Connector for Use with an Electrical Test Probe
Patent:
7,671,613 →
Application:
11/650,368 →
Digital Frequency Response Compensator and Arbitrary Response Generator System
Patent:
40,802 →
Application:
11/651,445 →
Pause Request Processing for Data Traffic Modification
Resistive Test Probe Tips and Applications Therefor
Dual Tip Probe
Test System and Method
High Bandwidth Oscilloscope
Bendable Conductive Connector
Patent:
7,492,177 →
Application:
11/803,733 →
Bit Pattern Synchronization in Acquired Waveforms
Virtual Probing
Cap at Resistors of Electrical Test Probe
Sequential Timebase
Fractional-Decimation Signal Processing
Patent:
7,466,247 →
Application:
11/906,934 →
Method of Crossover Region Phase Correction When Summing Signals in Multiple Frequency Bands
High Bandwidth Oscilloscope for Digitizing an Analog Signal Having a Bandwidth Greater Than the Bandwidth of Digitizing Components of the Oscilloscope
Method and Apparatus for a High Bandwidth Oscilloscope Utilizing Multiple Channel Digital Bandwidth Interleaving
Probing Apparatus for Illuminating an Electrical Device Under Test
Patent:
7,595,628 →
Application:
12/132,726 →
Simultaneous Physical and Protocol Layer Analysis
Method and Apparatus for Analyzing Serial Data Streams
Simultaneous Physical and Protocol Layer Analysis
Electrical test probe wedge tip
Patent:
444,401 →
Application:
29/127,136 →
Notched electrical test probe tip
Patent:
444,720 →
Application:
29/127,137 →
Electrical test probe probing head
Patent:
444,721 →
Application:
29/127,153 →
Measurement Instrument
Patent:
500,693 →
Application:
29/191,575 →
Measurement Instrument
Patent:
504,341 →
Application:
29/191,576 →
Measurement Instrument
Patent:
504,078 →
Application:
29/191,578 →
Measurement Instrument
Patent:
501,414 →
Application:
29/191,579 →
Housing for Test and Measurement Instrument
Patent:
553,520 →
Application:
29/242,941 →
Housing for Oscilloscope
Patent:
556,066 →
Application:
29/251,566 →
Housing for Test and Measurement Instrument
Patent:
581,821 →
Application:
29/303,234 →
Housing for Test and Measurement Instrument
Patent:
578,911 →
Application:
29/303,236 →
Related Assignments
(15)
Other recorded transfers of the patents in this record — the chain of ownership.
Security Agreement
Aug 27, 2010
From: LECROY CORPORATION
To: MANUFACTURERS AND TRADERS TRUST COMPANY
Reel/Frame 024892/0689 →
Release of Security Interest
Oct 15, 2012
From: MANUFACTURERS AND TRADERS TRUST COMPANY, AS AGENT
To: LECROY CORPORATION
Reel/Frame 029128/0280 →
Release of Security Interest
Oct 15, 2012
From: MANUFACTURERS AND TRADERS TRUST COMPANY, AS AGENT
To: LECROY CORPORATION
Reel/Frame 029129/0880 →
Merger
Oct 19, 2012
From: LECROY CORPORATION
To: TELEDYNE LECROY, INC.
Reel/Frame 029162/0724 →
Release of Security Interest
Oct 19, 2012
From: RBS CITIZENS, N.A.
To: TELEDYNE LECROY, INC.
Reel/Frame 029155/0478 →
Release of Security Interest
Nov 20, 2012
From: JP MORGAN CHASE BANK, N.A. AS ADMINISTRATIVE AGENT SUCCESSOR ADMINISTRATIVE AGENT TO THE BANK OF NEW YORK
To: LECROY CORPORATION
Reel/Frame 029328/0042 →
Release of Security Interest in Patents Previously Recorded at Reel/Frame (012506/0461)
Aug 14, 2015
From: JPMORGAN CHASE BANK, N.A. (F/K/A THE CHASE MANHATTAN BANK), AS ADMINISTRATIVE AGENT
To: GENTEK INC.; BALCRANK PRODUCTS, INC.; BIG T-2 COMPANY LLC; BINDERLINE DRAFTLINE, INC.
Reel/Frame 036355/0443 →
Share Purchase Agreement
Sep 8, 2015
From: KRONE INTERNATIONAL HOLDING INC.; KRONE DIGITAL COMMUNICATIONS INC.; GENTEK HOLDING CORPORATION; GENTEK INC.
To: ADC TELECOMMUNICATIONS, INC.
Reel/Frame 036563/0569 →
Assignment of Assignor's Interest
Oct 21, 2015
From: ADC TELECOMMUNICATIONS, INC.; TE CONNECTIVITY SOLUTIONS GMBH
To: TYCO ELECTRONICS SERVICES GMBH
Reel/Frame 036908/0443 →
Assignment of Assignor's Interest
Oct 26, 2015
From: TYCO ELECTRONICS SERVICES GMBH
To: COMMSCOPE EMEA LIMITED
Reel/Frame 036956/0001 →
Assignment of Assignor's Interest
Oct 29, 2015
From: COMMSCOPE EMEA LIMITED
To: COMMSCOPE TECHNOLOGIES LLC
Reel/Frame 037012/0001 →
Patent Security Agreement (Term)
Jan 13, 2016
From: COMMSCOPE TECHNOLOGIES LLC
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 037513/0709 →
Patent Security Agreement (Abl)
Jan 13, 2016
From: COMMSCOPE TECHNOLOGIES LLC
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 037514/0196 →
Release of Security Interest
Apr 9, 2019
From: JPMORGAN CHASE BANK, N.A.
To: REDWOOD SYSTEMS, INC.; ALLEN TELECOM LLC; ANDREW LLC; COMMSCOPE, INC. OF NORTH CAROLINA
Reel/Frame 048840/0001 →
Release of Security Interest
Apr 9, 2019
From: JPMORGAN CHASE BANK, N.A.
To: REDWOOD SYSTEMS, INC.; ALLEN TELECOM LLC; ANDREW LLC; COMMSCOPE, INC. OF NORTH CAROLINA
Reel/Frame 049260/0001 →