Probing apparatus for illuminating an electrical device under test
View Patent ↗A probe for probing an electrical device under test is provided. The probe comprises a selectively positionable door defining a recessed compartment and a light source positioned within the recessed compartment. When the door is in a first position, the compartment is closed, and when the door is in a second position, the compartment is opened. When opened, the light source is reflected from a reflective surface of the door to illuminate a device being probed. The door may further comprise a magnifying element to allow for magnification of the area being probed by a user.
1. A probe for probing an electrical device under test, comprising:
a selectively positionable door defining a recessed compartment;
a light source positioned within the recessed compartment; and
a reflective surface on an internal surface of the door, the reflective surface being configured to focus light emitted from the light source to illuminate the electrical device under test;
whereby when the door is in a first position, the compartment is closed, and when the door is in a second position, the compartment is opened and light from the light source illuminates the electrical device under test.
2. The probe of claim 1 , wherein the reflected light source illuminates an area about the tip of the probe.
3. The probe of claim 1 , wherein the light source is activated upon the positioning of the door in the second position.
4. The probe of claim 1 , wherein the light source is an LED.
5. The probe of claim 4 , wherein a color of the LED indicates a state of the probe.
6. The probe of claim 5 , wherein at least one LED color indicates electrical contact with a device under test.
7. The probe of claim 1 , further comprising:
a magnifying element positioned within the door.
8. The probe of claim 7 , wherein when the door is in the second position, light from the probe is magnified for a probe operator.