Patent Assignment
Reel/Frame 029162/0724
Merger
Recorded: 2012-10-19
Pages: 11
Assignor
LECROY CORPORATION
Executed: 2012-08-03
Assignee
TELEDYNE LECROY, INC.
C/O 1049 CAMINO DOS RIOS, THOUSAND OAKS, CALIFORNIA, 91360
Covered Properties
(141)
Charge Sampling Circuit
Patent:
6,225,837 →
Application:
08/210,298 →
Very High Speed Precision Amplifier
Patent:
5,467,056 →
Application:
08/224,883 →
Delta Sigma Analog-to-Digital Converter with Temporally Interleaved Architecture
Patent:
5,621,408 →
Application:
08/394,427 →
Digital Oscilloscope Display and Method Therefor
Patent:
6,151,010 →
Application:
08/653,288 →
Recording Medium Failure Analysis Apparatus and Method
Digital Storage Oscilloscope with Simultaneous Primary Measurement and Derived Parameter Display on Common Time Axis and Method Therefor
Patent:
6,195,617 →
Application:
09/037,155 →
Self-Calibration of an Oscilloscope Using a Square-Wave Test Signal
Patent:
6,269,317 →
Application:
09/066,167 →
Apparatus and Method for Measuring Time Intervals with Very High Resolution
Patent:
6,137,749 →
Application:
09/155,670 →
Optical Recording Measurement Package
Patent:
6,112,160 →
Application:
09/155,969 →
Legs for Forming a Tripod with an Electrical Test Probe Tip
Patent:
6,462,529 →
Application:
09/629,016 →
Electrical Test Probe Wedge Tip
Patent:
6,518,780 →
Application:
09/629,017 →
Notched Electrical Test Probe Tip
Patent:
6,538,424 →
Application:
09/629,018 →
Automatic Probe Identification System
Patent:
6,437,552 →
Application:
09/629,246 →
Cartridge System for a Probing Head for an Electrical Test Probe
Patent:
6,605,934 →
Application:
09/629,258 →
Method and Apparatus for Increasing Bandwidth in Sampled Systems
Patent:
6,542,914 →
Application:
09/669,955 →
Digital storage oscilloscope with simultaneous primary measurement and derived parameter display on common time axis and method therefor
Oscilloscope Panel Capture and Implementation
Streaming Architecture for Waveform Processing
System for Defining Internal Variables by Selecting and Confirming the Selected Value Is Within a Defined Range of Values
Measurement Icons for Digital Oscilloscopes
Data Compaction for Fast Display
Parallel Decimation Circuits
Precise Synchronization of Distributed Systems
Scaling Persistence Data with Interpolation
Context Sensitive Toolbar
Electrical Test Probe Flexible Spring Tip
Sample Synthesis for Matching Digitizers in Interleaved Systems
Patent:
6,567,030 →
Application:
10/090,047 →
Digital Frequency Response Compensator and Arbitrary Response Generator System
Active Differential Test Probe with a Transmission Line Input Structure
Patent:
6,822,463 →
Application:
10/261,829 →
User Defined Processing Function
Modular Active Test Probe and Removable Tip Module Therefor
Patent:
6,956,362 →
Application:
10/321,408 →
Self-Calibrating Electrical Test Probe
Patent:
6,870,359 →
Application:
10/321,422 →
Notched Electrical Test Probe Tip
Electrical Test Probe Wedge Tip
Calibration Cache and Database
Method and Apparatus for the Recovery of Signals Acquired by an Interleaved System of Digitizers with Mismatching Frequency Response Characteristics
Cartridge System for a Probing Head for an Electrical Test Probe
Method and Apparatus for Bit Error Rate Analysis
Method and Apparatus for Analyzing Serial Data Streams
Method of Analyzing Serial Data Streams
Digital Group Delay Compensator
Method and Apparatus for Determining Inter-Symbol Interference for Estimating Data Dependent Jitter
High Bandwidth Real-Time Oscilloscope
Guide for Tip to Transmission Path Contact
Patent:
7,317,312 →
Application:
10/781,146 →
Simultaneous Physical and Protocol Layer Analysis
Reflection Filter
Digital Oscilloscope Display and Method for Image Quality Improvement
Dual Tip Probe
Method of Fabricating a Notched Electrical Test Probe Tip
Guide for Tip to Transmission Path Contact
Patent:
7,173,439 →
Application:
10/975,769 →
Transmission Line Input Structure Test Probe
Patent:
7,019,544 →
Application:
10/995,801 →
Cartridge System for a Probing Head for an Electrical Test Probe
Cable and Substrate Compensating Custom Resistor
Patent:
7,042,232 →
Application:
11/018,059 →
Resistive Probe Tips
Cap at Resistors of Electrical Test Probe
Bendable Conductive Connector
Patent:
7,221,179 →
Application:
11/019,325 →
Parallel Decimation Circuits
Self-Calibrating Electrical Test Probe Calibratable While Connected to an Electrical Component Under Test
Patent:
7,180,314 →
Application:
11/086,008 →
Method and Apparatus for Increasing Bandwidth in Sampled Systems
Patent:
42,809 →
Application:
11/094,754 →
Report Generating Method and Apparatus
Track of Statistics
Modular Active Test Probe and Removable Tip Module Therefor
Patent:
7,432,698 →
Application:
11/197,911 →
Use of Multiple Data Comparators in Parallel to Trigger an Oscilloscope on a Pattern Found in a Serial Data Stream
Data Decoder
High Bandwidth Real-Time Oscilloscope
Method and Apparatus for Artifact Signal Reduction in Systems of Mismatched Interleaved Digitizers
High Bandwidth Oscilloscope
High Bandwidth Real Time Oscilloscope
Pattern Trigger in a Coherent Timebase
Sequential Timebase
Planar on Edge Probing Tip with Flex
Patent:
7,262,614 →
Application:
11/352,128 →
Measuring Components of Jitter
Digital Frequency Response Compensator and Arbitrary Response Generator System
Patent:
39,693 →
Application:
11/364,796 →
Envelope Generation Algorithm
Adaptive Interpolation
Probe Using High Pass Ground Signal Path
High Speed Signal Transmission Line Having Reduced Thickness Regions
Probing High-Frequency Signals
Thermal Tail Compensation
Common Mode Regulation for Thermal Tail Compensation
High Bandwidth Real Time Oscilloscope
Estimating Bit Error Rate Performance of Signals
Method of Compensating for Deterministic Jitter Due to Interleave Error
Adjustable Resistance
Probing Blade Conductive Connector for Use with an Electrical Test Probe
Patent:
7,671,613 →
Application:
11/650,368 →
Digital Frequency Response Compensator and Arbitrary Response Generator System
Patent:
40,802 →
Application:
11/651,445 →
Pause Request Processing for Data Traffic Modification
Code Editing for Data Traffic Modification
Resistive Test Probe Tips and Applications Therefor
Dual Tip Probe
Test System and Method
High Bandwidth Oscilloscope
Bendable Conductive Connector
Patent:
7,492,177 →
Application:
11/803,733 →
Bit Pattern Synchronization in Acquired Waveforms
High Speed Arbitrary Waveform Generator
Virtual Probing
Cap at Resistors of Electrical Test Probe
Sequential Timebase
Fractional-Decimation Signal Processing
Patent:
7,466,247 →
Application:
11/906,934 →
Method of Crossover Region Phase Correction When Summing Signals in Multiple Frequency Bands
Fixture De-Embedding Method and System for Removing Test Fixture Characteristics When Calibrating Measurement Systems
Patent:
7,865,319 →
Application:
11/998,523 →
High Bandwidth Oscilloscope for Digitizing an Analog Signal Having a Bandwidth Greater Than the Bandwidth of Digitizing Components of the Oscilloscope
Method and Apparatus for Data Preview
Method and Apparatus for a High Bandwidth Oscilloscope Utilizing Multiple Channel Digital Bandwidth Interleaving
Method and Apparatus for Triggering a Test and Measurement Instrument
Application:
12/117,160 →
Publication:
US 2009/0281758
Statistically-Based Display Processing
Common Phase Error vs. Time Display
Application:
12/127,928 →
Publication:
US 2008/0303820
Probing Apparatus for Illuminating an Electrical Device Under Test
Patent:
7,595,628 →
Application:
12/132,726 →
Simultaneous Physical and Protocol Layer Analysis
Method and Apparatus for Trigger Scanning
Adherable Holder and Locater Tool
Patent:
8,134,377 →
Application:
12/180,500 →
Method and Apparatus for Multiple Trigger Path Triggering
Method and Apparatus for Analyzing Serial Data Streams
Method and Apparatus for Elimination of Spurious Response due to Mixer Feed-Through
Application:
12/245,252 →
Publication:
US 2009/0093986
Protocol Aware Error Ratio Tester
Method for De-embedding Device Measurements
Virtual Probing
High Bandwidth Oscilloscope for Digitizing an Analog Signal Having a Bandwidth Greater Than the Bandwidth of Digitizing Components of the Oscilloscope
Simultaneous Physical and Protocol Layer Analysis
Probing Blade with Conductive Connector for Use with an Electrical Test Probe
Patent:
8,098,078 →
Application:
12/715,269 →
Time Domain Reflectometry in a Coherent Interleaved Sampling Timebase
Wavelet Denoising for Time-Domain Network Analysis
User Interface for Signal Integrity Network Analyzer
Application:
12/892,094 →
Publication:
US 2011/0286506
Rotatable Display for Test and Measurement Apparatus
Method and Apparatus for Synchronization of Test and Measurement Apparatuses
Estimating Bit Error Rate Performance of Signals
Time Domain Network Analyzer
Time Domain Reflectometry Step to S-Parameter Conversion
High Bandwidth Oscilloscope for Digitizing an Analog Signal Having a Bandwidth Greater Than the Bandwidth of Digitizing Components of the Oscilloscope
Method and Apparatus for Multiple Trigger Path Triggering
Electrical test probe wedge tip
Patent:
444,401 →
Application:
29/127,136 →
Notched electrical test probe tip
Patent:
444,720 →
Application:
29/127,137 →
Electrical test probe probing head
Patent:
444,721 →
Application:
29/127,153 →
Measurement Instrument
Patent:
500,693 →
Application:
29/191,575 →
Measurement Instrument
Patent:
504,341 →
Application:
29/191,576 →
Measurement Instrument
Patent:
504,078 →
Application:
29/191,578 →
Measurement Instrument
Patent:
501,414 →
Application:
29/191,579 →
Housing for Test and Measurement Instrument
Patent:
553,520 →
Application:
29/242,941 →
Housing for Oscilloscope
Patent:
556,066 →
Application:
29/251,566 →
Housing for Test and Measurement Instrument
Patent:
581,821 →
Application:
29/303,234 →
Housing for Test and Measurement Instrument
Patent:
578,911 →
Application:
29/303,236 →
Related Assignments
(6)
Other recorded transfers of the patents in this record — the chain of ownership.
Security Agreement
Aug 27, 2010
From: LECROY CORPORATION
To: MANUFACTURERS AND TRADERS TRUST COMPANY
Reel/Frame 024892/0689 →
Security Agreement
Aug 30, 2011
From: LECROY CORPORATION
To: RBS CITIZENS, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 026826/0850 →
Release of Security Interest
Oct 15, 2012
From: MANUFACTURERS AND TRADERS TRUST COMPANY, AS AGENT
To: LECROY CORPORATION
Reel/Frame 029128/0280 →
Release of Security Interest
Oct 15, 2012
From: MANUFACTURERS AND TRADERS TRUST COMPANY, AS AGENT
To: LECROY CORPORATION
Reel/Frame 029129/0880 →
Release of Security Interest
Oct 19, 2012
From: RBS CITIZENS, N.A.
To: TELEDYNE LECROY, INC.
Reel/Frame 029155/0478 →
Release of Security Interest
Nov 20, 2012
From: JP MORGAN CHASE BANK, N.A. AS ADMINISTRATIVE AGENT SUCCESSOR ADMINISTRATIVE AGENT TO THE BANK OF NEW YORK
To: LECROY CORPORATION
Reel/Frame 029328/0042 →