Patent Assignment
Reel/Frame 029328/0042
Release of Security Interest
Recorded: 2012-11-20
Pages: 10
Assignor
Assignee
LECROY CORPORATION
700 CHESTNUT RIDGE ROAD, CHESTNUT RIDGE, NEW YORK, 10977
Covered Properties
(72)
High-Speed Sampling Arrangement and Apparatus Using Same
Patent:
5,257,025 →
Application:
06/743,695 →
Coarse/Fine a-D Converter Using Ramp Waveform to Generate Fine Digital Signal
Patent:
4,734,677 →
Application:
06/900,994 →
Method and Apparatus for Recovering Clock Information from a Received Digital Signal and for Synchronizing That Signal
Patent:
4,805,197 →
Application:
06/944,249 →
Coarse\Fine a-D Converter Using Ramp Waveform to Generate Fine Digital Signal
Patent:
4,804,939 →
Application:
07/089,471 →
High-Speed Switching Tree with Input Sampling Pulses of Constant Frequency and Means for Varying the Effective Sampling Rate
Patent:
5,218,363 →
Application:
07/760,165 →
Peptide Inhibitors of Phospholipase A2 Purified from Inflammatory Sites
Patent:
5,374,713 →
Application:
07/861,962 →
Signal Probe with Remote Control Function
Patent:
5,293,122 →
Application:
07/895,101 →
Method and Apparatus for Compacting Digital Time Series Data for Display on a Digital Oscilloscope
Patent:
5,255,365 →
Application:
07/956,556 →
Charge Sampling Circuit
Patent:
6,225,837 →
Application:
08/210,298 →
Very High Speed Precision Amplifier
Patent:
5,467,056 →
Application:
08/224,883 →
Delta Sigma Analog-to-Digital Converter with Temporally Interleaved Architecture
Patent:
5,621,408 →
Application:
08/394,427 →
Vernier Delay Line Interpolator and Coarse Counter Realignment
Patent:
5,703,838 →
Application:
08/602,904 →
Digital Oscilloscope Display and Method Therefor
Patent:
6,151,010 →
Application:
08/653,288 →
Multi-Range Analog-to-Digital Converter with Multi-Range Switching
Patent:
5,835,050 →
Application:
08/735,928 →
Vernier Delay Line Interpolator and Coarse Counter Realignment
Patent:
5,838,754 →
Application:
08/814,835 →
Recording Medium Failure Analysis Apparatus and Method
Digital Storage Oscilloscope with Simultaneous Primary Measurement and Derived Parameter Display on Common Time Axis and Method Therefor
Patent:
6,195,617 →
Application:
09/037,155 →
Self-Calibration of an Oscilloscope Using a Square-Wave Test Signal
Patent:
6,269,317 →
Application:
09/066,167 →
Waveform Translator for Dc to 75 Ghz Oscillography
Patent:
6,242,899 →
Application:
09/096,993 →
Apparatus and Method for Measuring Time Intervals with Very High Resolution
Patent:
6,137,749 →
Application:
09/155,670 →
Optical Recording Measurement Package
Patent:
6,112,160 →
Application:
09/155,969 →
Delta Sigma Analog-to-Digital Converter for Producing Multiple Digital Output Signals
Patent:
6,292,121 →
Application:
09/351,250 →
Legs for Forming a Tripod with an Electrical Test Probe Tip
Patent:
6,462,529 →
Application:
09/629,016 →
Electrical Test Probe Wedge Tip
Patent:
6,518,780 →
Application:
09/629,017 →
Notched Electrical Test Probe Tip
Patent:
6,538,424 →
Application:
09/629,018 →
Automatic Probe Identification System
Patent:
6,437,552 →
Application:
09/629,246 →
Cartridge System for a Probing Head for an Electrical Test Probe
Patent:
6,605,934 →
Application:
09/629,258 →
Method and Apparatus for Increasing Bandwidth in Sampled Systems
Patent:
6,542,914 →
Application:
09/669,955 →
Digital storage oscilloscope with simultaneous primary measurement and derived parameter display on common time axis and method therefor
Oscilloscope Panel Capture and Implementation
Streaming Architecture for Waveform Processing
Processing web for data processing in a digital oscilloscope or similar instrument
Application:
09/988,416 →
Publication:
US 2002/0097243
System for Defining Internal Variables by Selecting and Confirming the Selected Value Is Within a Defined Range of Values
Processing Web Editor for Data Processing in a Digital Oscilloscope or Similar Instrument
Application:
09/988,420 →
Publication:
US 2002/0075267
Measurement Icons for Digital Oscilloscopes
Data Compaction for Fast Display
Parallel Decimation Circuits
Precise Synchronization of Distributed Systems
Scaling Persistence Data with Interpolation
Context Sensitive Toolbar
Electrical Test Probe Flexible Spring Tip
Sample Synthesis for Matching Digitizers in Interleaved Systems
Patent:
6,567,030 →
Application:
10/090,047 →
Digital Frequency Response Compensator and Arbitrary Response Generator System
Active Differential Test Probe with a Transmission Line Input Structure
Patent:
6,822,463 →
Application:
10/261,829 →
Coil Reinforced Multilayered Inner Tubular Member for a Balloon Catheter
User Defined Processing Function
Modular Active Test Probe and Removable Tip Module Therefor
Patent:
6,956,362 →
Application:
10/321,408 →
Self-Calibrating Electrical Test Probe
Patent:
6,870,359 →
Application:
10/321,422 →
Notched Electrical Test Probe Tip
Electrical Test Probe Wedge Tip
Calibration Cache and Database
Sequence display
Application:
10/436,788 →
Publication:
US 2003/0222873
Cartridge System for a Probing Head for an Electrical Test Probe
Method and Apparatus for Bit Error Rate Analysis
Method and apparatus for analyzing serial data streams
Application:
10/673,713 →
Publication:
US 2004/0123018
Method and Apparatus for Analyzing Serial Data Streams
Method of Analyzing Serial Data Streams
Digital Group Delay Compensator
Method and Apparatus for Determining Inter-Symbol Interference for Estimating Data Dependent Jitter
High Bandwidth Real-Time Oscilloscope
Guide for Tip to Transmission Path Contact
Patent:
7,317,312 →
Application:
10/781,146 →
Processing web editor for data processing in a digital oscilloscope or similar instrument
Application:
10/802,380 →
Publication:
US 2004/0222990
Processing web editor for data processing in a digital oscilloscope or similar instrument
Application:
10/803,029 →
Publication:
US 2004/0239697
Method and apparatus for improving accuracy of touch screen input devices
Application:
10/830,788 →
Publication:
US 2004/0212601
Simultaneous Physical and Protocol Layer Analysis
Electrical test probe wedge tip
Patent:
444,401 →
Application:
29/127,136 →
Notched electrical test probe tip
Patent:
444,720 →
Application:
29/127,137 →
Electrical test probe probing head
Patent:
444,721 →
Application:
29/127,153 →
Measurement Instrument
Patent:
500,693 →
Application:
29/191,575 →
Measurement Instrument
Patent:
504,341 →
Application:
29/191,576 →
Measurement Instrument
Patent:
504,078 →
Application:
29/191,578 →
Measurement Instrument
Patent:
501,414 →
Application:
29/191,579 →
Related Assignments
(7)
Other recorded transfers of the patents in this record — the chain of ownership.
Security Agreement
May 23, 2007
From: LECROY CORPORATION
To: MANUFACTURERS AND TRADERS TRUST COMPANY
Reel/Frame 019331/0239 →
Security Agreement
Aug 27, 2010
From: LECROY CORPORATION
To: MANUFACTURERS AND TRADERS TRUST COMPANY
Reel/Frame 024892/0689 →
Security Agreement
Aug 30, 2011
From: LECROY CORPORATION
To: RBS CITIZENS, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 026826/0850 →
Release of Security Interest
Oct 15, 2012
From: MANUFACTURERS AND TRADERS TRUST COMPANY, AS AGENT
To: LECROY CORPORATION
Reel/Frame 029129/0880 →
Release of Security Interest
Oct 15, 2012
From: MANUFACTURERS AND TRADERS TRUST COMPANY, AS AGENT
To: LECROY CORPORATION
Reel/Frame 029128/0280 →
Merger
Oct 19, 2012
From: LECROY CORPORATION
To: TELEDYNE LECROY, INC.
Reel/Frame 029162/0724 →
Release of Security Interest
Oct 19, 2012
From: RBS CITIZENS, N.A.
To: TELEDYNE LECROY, INC.
Reel/Frame 029155/0478 →