Self-calibrating electrical test probe
View Patent ↗A self-calibrating test probe system of the present invention does not require probing head removal and replacement. Using the system of the present invention, the test probe and/or the entire system (including a testing instrument) may be calibrated or may self-calibrate while the probing head remains connected to an electrical component under test. The self-calibrating electrical testing probe system includes calibration circuitry including at least one input resistor, at least one relay, and at least one known calibration reference signal. If the test probe is an active test probe, the calibration circuitry may also include at least one amplifier. Each relay has a first position that provides signal access to a testing signal from an electrical component under test and a second position that provides signal access to the known calibration reference signal. Using the present invention, the error of the test probe and/or system is determined and compensated. Exemplary methods by which error compensation may be provided includes, for example, amplifying the testing signal, creating a correction table of correction values and adding an appropriate value from the correction table, or mathematically compensating.
1. A self-calibrating electrical testing probe system comprising:
(a) a test probe comprising:
(i) a cable having a first cable end and a second cable end;
(ii) a probing head associatable with said first cable end; and
(iii) a connector associatable with said second cable end; and
(b) calibration circuitry at least partially located in said test probe, said calibration circuitry comprising:
(i) at least one input resistor;
(ii) at least one amplifier;
(iii) at least one relay; and
(iv) at least one known calibration reference voltage;
(c) wherein said test probe may be calibrated while it remains connected to an electrical component under test.
2. The system of claim 1 further comprising a testing instrument.
3. The system of claim 2 wherein said testing instrument is an oscilloscope.
4. The system of claim 2 wherein said connector is integral with said testing instrument.
5. The system of claim 1 wherein said at least one relay is functionally positioned behind said at least one input resistor.
6. The system of claim 1 wherein said at least one relay is functionally positioned in front of said at least one input resistor.
7. The system of claim 1 wherein said calibration reference voltage may be positioned in a location selected from the group consisting of:
(a) said probing head;
(b) said connector; and
(c) said testing instrument.
8. The system of claim 1 wherein said electrical testing probe system may self-calibrate said test probe.
9. The system of claim 1 wherein said electrical testing probe system may self-calibrate said test probe in response to at least one condition selected from the group consisting of:
(a) a test probe being connected to a testing instrument;
(b) a test probe being disconnected to a testing instrument;
(c) a testing instrument being turned on;
(d) a testing instrument being turned off;
(e) at regularly timed intervals;
(f) when a instrument configuration changes;
(g) upon an increase in temperature;
(h) upon a decrease in temperature; and
(i) upon a user's request.
10. A self-calibrating test probe system comprising:
(a) a testing instrument;
(b) a test probe having a probing head at a first end and a connector at a second end, said connector associatable with said testing instrument; and
(c) calibration circuitry at least partially located in said test probe, said calibration circuitry comprising:
(i) at least one input resistor;
(ii) at least one amplifier;
(iii) at least one relay; and
(iv) at least one known calibration reference voltage;
(d) wherein said test probe system self-calibrates while it remains connected to an electrical component under test.
11. The system of claim 10 wherein said testing instrument is an oscilloscope.
12. The system of claim 10 wherein said connector is integral with said testing instrument.
13. The system of claim 10 wherein said at least one relay is functionally positioned behind said at least one input resistor.
14. The system of claim 10 wherein said at least one relay is functionally positioned in front of said at least one input resistor.
15. The system of claim 10 wherein said calibration reference voltage may be positioned in a location selected from the group consisting of:
(a) said probing head;
(b) said connector; and
(c) said testing instrument.
16. The system of claim 10 wherein said electrical testing probe system may be calibrated while said test probe remains connected to said electrical component under test.
17. The system of claim 10 wherein said electrical testing probe system may self-calibrate in response to at least one condition selected from the group consisting of:
(a) a test probe being connected to a testing instrument;
(b) a test probe being disconnected to a testing instrument;
(c) a testing instrument being turned on;
(d) a testing instrument being turned off;
(e) at regularly timed intervals;
(f) when a instrument configuration changes;
(g) upon an increase in temperature;
(h) upon a decrease in temperature; and
(i) upon a user's request.
18. A method for self-calibrating an electrical testing probe, said method comprising:
(a) providing a testing instrument;
(b) providing a test probe having at least one relay having a relay input;
(c) toggling said at least one relay to disconnect the relay input from a testing signal and connect said relay input to a known calibration reference source;
(d) applying a known calibration reference signal from said known calibration reference source to said test probe, said known calibration reference source having an associated expected signal;
(e) testing said known calibration reference signal applied to said test probe to obtain a measured signal;
(f) comparing said measured signal with said expected signal, the difference between said measured signal and said expected signal being a measured error; and
(g) providing compensation for said measured error.
19. The method of claim 18 , said electrical test probe remaining connected to an electrical component under test throughout steps (c)-(g).
20. The method of claim 18 , said electrical testing probe system performing said steps (c)-(g) as a self-calibration routine.
21. The method of claim 18 said step of providing compensation for said measured error further comprising the compensation step selected from the group consisting of:
(a) amplifying said testing signal to compensate for said measured error;
(b) creating a correction table of correction values and adding an appropriate value from said correction table to compensate for said measured error; and
(c) compensating mathematically for said measured error.
22. The method of claim 18 , further comprising the step of determining an input resistor error.
23. The method of claim 22 , further comprising the step of providing compensation for said input resistor error.
24. The method of claim 18 , further comprising the step of determining a testing instrument error.
25. The method of claim 24 , further comprising the step of providing compensation for said testing instrument error.
26. The method of claim 18 , said electrical testing probe system performing steps (c)-(g) in response to at least one condition selected from the group consisting of:
(a) a test probe being connected to a testing instrument;
(b) a test probe being disconnected to a testing instrument;
(c) a testing instrument being turned on;
(d) a testing instrument being turned off;
(e) at regularly timed intervals;
(f) when a instrument configuration changes;
(g) upon an increase in temperature;
(h) upon a decrease in temperature; and
(i) upon a user's request.
27. A self-calibrating electrical testing probe system comprising:
(a) a test probe;
(b) calibration circuitry at least partially located in said test probe, said calibration circuitry comprising:
(i) at least one input resistor;
(ii) at least one relay; and
(iii) at least one known calibration reference signal; and
(c) said at least one relay having a first position and a second position:
(i) said first position providing signal access to a testing signal from an electrical component under test; and
(ii) said second position providing signal access to said known calibration reference signal;
(d) wherein said test probe may be calibrated while it remains connected to said electrical component under test.
28. The system of claim 27 further comprising an error compensator.
29. The system of claim 28 wherein said error compensator toggles said at least one relay between said first and second positions to disconnect the relay input from a testing signal and connect the relay input to a known calibration reference source.
30. The system of claim 28 wherein said error compensator provides compensation for a measured error.
31. The system of claim 27 further comprising a testing instrument.
32. The system of claim 27 , wherein said test probe is an active test probe, said calibration circuitry further comprising at least one amplifier.
33. The system of claim 27 wherein said at least one relay is functionally positioned behind said at least one input resistor.
34. The system of claim 27 wherein said at least one relay is functionally positioned in front of said at least one input resistor.
35. The system of claim 27 wherein said calibration reference voltage may be positioned in a location selected from the group consisting of:
(a) said probing head;
(b) said connector; and
(c) said testing instrument.
36. The system of claim 27 wherein said electrical testing probe system may self-calibrate said test probe.
37. The system of claim 27 wherein said electrical testing probe system may self-calibrate said test probe in response to at least one condition selected from the group consisting of:
(a) a test probe being connected to a testing instrument;
(b) a test probe being disconnected to a testing instrument;
(c) a testing instrument being turned on;
(d) a testing instrument being turned off;
(e) at regularly timed intervals;
(f) when a instrument configuration changes;
(g) upon an increase in temperature;
(h) upon a decrease in temperature; and
(i) upon a user's request.