Patent Assignment
Reel/Frame 015355/0270
Grant of Security Interest
Recorded: 2004-11-05
Received: 2004-11-05
Pages: 9
Assignor
LECROY CORPORATION
Executed: 2004-10-29
Assignee
BANK OF NEW YORK, THE, AS ADMINISTRATIVE AGENT
ONE WALL STREET, NEW YORK, NY, 10286, UNITED STATES
Covered Properties
(48)
Report generating method and apparatus
Application:
60/584,065 →
Simultaneous Physical and Protocol Layer Analysis
Application:
10/836,385 →
Method and apparatus for improving accuracy of touch screen input devices
Application:
10/830,788 →
Processing web editor for data processing in a digital oscilloscope or similar instrument
Application:
10/802,380 →
Processing web editor for data processing in a digital oscilloscope or similar instrument
Application:
10/803,029 →
Guide for Tip to Transmission Path Contact
Application:
10/781,146 →
Cap at resistors of electrical test probe
Application:
60/531,077 →
Cable and substrate compensating custom resistor
Application:
60/531,555 →
Resistive probe tips
Application:
60/531,076 →
Bendable conductive connector
Application:
60/531,078 →
High Bandwidth Real-Time Oscilloscope
Application:
10/693,188 →
Method and Apparatus for Determining Inter-Symbol Interference for Estimating Data Dependent Jitter
Application:
10/688,661 →
Measurement Instrument
Application:
29/191,576 →
Measurement Instrument
Application:
29/191,578 →
Measurement Instrument
Application:
29/191,579 →
Measurement Instrument
Application:
29/191,575 →
Digital Group Delay Compensator
Application:
10/678,374 →
Method and Apparatus for Analyzing Serial Data Streams
Application:
10/673,735 →
Method and apparatus for analyzing serial data streams
Application:
10/673,713 →
Method and Apparatus for Bit Error Rate Analysis
Application:
10/673,712 →
Method of Analyzing Serial Data Streams
Application:
10/673,736 →
Cartridge System for a Probing Head for an Electrical Test Probe
Application:
10/607,791 →
Sequence display
Application:
10/436,788 →
Calibration Cache and Database
Application:
10/372,413 →
Electrical Test Probe Wedge Tip
Application:
10/364,023 →
Notched Electrical Test Probe Tip
Application:
10/364,017 →
Modular Active Test Probe and Removable Tip Module Therefor
Application:
10/321,408 →
Self-Calibrating Electrical Test Probe
Application:
10/321,422 →
User Defined Processing Function
Application:
10/314,597 →
Method for Transforming Phase Spectra to Absorption Spectra
Application:
10/291,912 →
Coil Reinforced Multilayered Inner Tubular Member for a Balloon Catheter
Application:
10/279,648 →
Active Differential Test Probe with a Transmission Line Input Structure
Application:
10/261,829 →
Sample Synthesis for Matching Digitizers in Interleaved Systems
Application:
10/090,047 →
Digital Frequency Response Compensator and Arbitrary Response Generator System
Application:
10/090,051 →
Transmission line input for electrical testing probe
Application:
60/342,974 →
Electrical Test Probe Flexible Spring Tip
Application:
10/020,707 →
Measurement Icons for Digital Oscilloscopes
Application:
10/013,563 →
Parallel Decimation Circuits
Application:
10/013,568 →
Scaling Persistence Data with Interpolation
Application:
10/013,603 →
Data Compaction for Fast Display
Application:
10/013,567 →
Context Sensitive Toolbar
Application:
10/015,125 →
Precise Synchronization of Distributed Systems
Application:
10/013,600 →
System for Defining Internal Variables by Selecting and Confirming the Selected Value Is Within a Defined Range of Values
Application:
09/988,418 →
Oscilloscope Panel Capture and Implementation
Application:
09/988,119 →
Processing Web Editor for Data Processing in a Digital Oscilloscope or Similar Instrument
Application:
09/988,420 →
Processing web for data processing in a digital oscilloscope or similar instrument
Application:
09/988,416 →
Streaming Architecture for Waveform Processing
Application:
09/988,120 →
Digital storage oscilloscope with simultaneous primary measurement and derived parameter display on common time axis and method therefor
Application:
09/752,949 →