Granted Patent B1

US 7,317,312 · App. 10/781,146 · Granted Jan 8, 2008

Abstract

Claims (40)

1. A method for using a guide for tip to transmission path contact, said method comprising the steps of:

(a) providing at least one guide insulator having at least one passageway defined by said at least one guide insulator, said at least one passageway having a tip passageway end and a transmission path passageway end, said tip passageway end suitable for at least partially accommodating said tip, said transmission path passageway end suitable for at least partially accommodating a transmission path, said at least one guide insulator having at least one passageway that includes a contact enhancing mechanism;

(b) interconnecting said guide insulator with a circuit board component having at least one transmission path such that said transmission path is at least partially accommodated within said transmission path passageway, interconnecting said contact enhancing mechanism with said at least one transmission path; and

(c) probing said transmission path by inserting a tip of an electronic test probe into said tip passageway end and touching said tip to said contact enhancing mechanism, such that said tip electrically contacts said transmission path.

2. The method of claim 1 , wherein step (c) is performed after step (b).

3. The method of claim 1 , further comprising the step of removing said tip of said electronic test probe while said guide insulator remains interconnected with said circuit board component.

4. The method of claim 1 , said step of providing at least one guide insulator further comprising the step of providing at least one guide insulator that is removably interconnectable with a circuit board component having at least one transmission path.

5. The method of claim 1 , wherein using said guide in steps (b) and (c) facilitates relatively secure contact between said tip and said transmission path.

6. The method of claim 1 , said tip passageway end guiding said tip towards said transmission path.

7. A method for using a guide for tip to transmission path contact, said method comprising the steps of:

(a) providing at least one guide insulator having at least one passageway defined by said at least one guide insulator, said at least one passageway having a tip passageway end and a transmission path passageway end, said tip passageway end suitable for at least partially accommodating said tip, said transmission path passageway end suitable for at least partially accommodating a transmission path;

(b) interconnecting said guide insulator with a circuit board component having at least one transmission path such that said transmission path is at least partially accommodated within said transmission path passageway; and

(c) probing said transmission path by inserting a tip of an electronic test probe into said tip passageway end such that said tip electrically contacts said transmission path;

(d) wherein step (c) is performed after step (b).

8. The method of claim 7 , said step of providing at least one guide insulator further comprising the step of providing at least one guide insulator having at least one passageway that includes a contact enhancing mechanism.

9. The method of claim 7 , further comprising the step of removing said tip of said electronic test probe while said guide insulator remains interconnected with said circuit board component.

10. The method of claim 7 , said step of providing at least one guide insulator further comprising the step of providing at least one guide insulator that is removably interconnectable with a circuit board component having at least one transmission path.

11. The method of claim 7 , wherein using said guide in steps (b) and (c) facilitates relatively secure contact between said tip and said transmission path.

12. The method of claim 7 , said tip passageway end guiding said tip towards said transmission path.

13. A method for using a guide for tip to transmission path contact, said method comprising the steps of:

(a) providing at least one guide insulator having at least one passageway defined by said at least one guide insulator, said at least one passageway having a tip passageway end and a transmission path passageway end, said tip passageway end suitable for at least partially accommodating said tip, said transmission path passageway end suitable for at least partially accommodating a transmission path;

(b) interconnecting said guide insulator with a circuit board component having at least one transmission path such that said transmission path is at least partially accommodated within said transmission path passageway; and

(c) probing said transmission path by inserting a tip of an electronic test probe into said tip passageway end such that said tip electrically contacts said transmission path.

14. The method of claim 13 , said step of providing at least one guide insulator further comprising the step of providing at least one guide insulator having at least one passageway that includes a contact enhancing mechanism.

15. The method of claim 14 , said step of providing at least one guide insulator having at least one passageway that includes a contact enhancing mechanism further comprising the step of providing at least one guide insulator having at least one passageway having a contact enhancing mechanism selected from a group consisting of:

(a) solid contact enhancing mechanism;

(b) combination contact enhancing mechanism; and

(c) soft contact enhancing mechanism.

16. The method of claim 13 , further comprising the step of removing said tip of said electronic test probe while said guide insulator remains interconnected with said circuit board component.

17. The method of claim 13 , said step of providing at least one guide insulator further comprising the step of providing at least one guide insulator that is removably interconnectable with a circuit board component having at least one transmission path.

18. The method of claim 13 , wherein said transmission path is at least partially accommodated within said transmission path passageway before said tip of an electronic test probe it inserted into said tip passageway end.

19. The method of claim 13 , wherein using said guide in steps (b) and (c) facilitates relatively secure contact between said tip and said transmission path.

20. The method of claim 13 , said tip passageway end guiding said tip towards said transmission path.

21. The method of claim 13 , wherein said step of providing at least one guide insulator further comprises the step of providing at least one guide insulator having a tip passageway end with at least one guide enhancing mechanism selected from the group consisting of:

(a) a funnel shaped opening; and

(b) an enlarged, partial funnel shaped opening.

22. The method of claim 13 , wherein said step of providing at least one guide insulator having at least one passageway further comprises the step of providing at least one guide insulator having fewer passageways than the number of transmission paths of the device to be probed.

23. The method of claim 13 , wherein said step of providing at least one guide insulator having at least one passageway further comprises the step of providing at least one guide insulator having two passageways.

24. The method of claim 13 , wherein said step of providing at least one guide insulator further comprises the step of providing at least one guide insulator having at least one mounting apparatus and at least one divider guide insulator, each divider guide insulator positionable between close transmission paths.

25. The method of claim 13 , wherein said step of providing at least one guide insulator further comprises the step of providing at least two guide insulators, said at least two guide insulators being adjustable in relation to each other.

Assignments (10)