Granted Patent B2

US 7,450,043 · App. 11/590,342 · Granted Nov 11, 2008

Abstract

Claims (39)

1. A system for compensation of deterministic jitter in measurements made when utilizing a plurality of time interleaved analog-to-digital converters (ADCs) comprising:

edge timing measurement error information for each of the plurality of time interleaved ADCs, the edge timing error information being defined, in a calibration phase, as a relationship for compensation of deterministic jitter in measurements made when utilizing a plurality of time interleaved analog-to-digital converters (ADCs), by:

detecting a multitude of edges of a waveform;

determining measured edge times corresponding to the multitude of edges;

determining edge timing measurement errors based upon the comparison of ideal edge times and the measured edge times by associating a value of each measured edge time in relation to the associated one or more time interleaved ADCs to form a scatter relationship, and determining deterministic errors in accordance with the scatter relationship; and

associating each edge timing measurement error with one or more of the time interleaved ADCs; and

a processing element for converting a measured edge time of one or more edges of a waveform into a corrected edge time;

wherein the processing element determines the corrected edge time by subtracting the edge timing measurement error corresponding to one or more of the time interleaved ADCs.

2. The system of claim 1 , wherein the subtracted edge timing measurement error is determined in accordance with edge timing measurement error information corresponding to two ADCs that consecutively sampled the waveform.

3. The system of claim 2 , wherein a sample time of each of the two ADCs straddle the measured edge time.

4. The system of claim 1 , wherein the subtracted edge timing measurement error is determined in accordance with the edge timing measurement error information corresponding to a single ADC.

5. The system of claim 4 , wherein a sample time of the single ADC is within a predetermined time of the measured edge time.

6. The system of claim 1 , wherein the measured edge time is determined by an arbitrary edge detection and interpolation algorithm.

7. The system of claim 6 , wherein the measured edge time is utilized to determine which one or more of the plurality of ADCs sampled the one or more edges of the waveform.

8. A method for compensation of deterministic jitter in measurements made when utilizing a plurality of time interleaved analog-to-digital converters (ADCs), comprising the steps of:

defining edge timing measurement error information for each of the plurality of time interleaved ADCs, the edge timing error information being defined, in a calibration phase, as a relationship for compensation of deterministic jitter in measurements made when utilizing a plurality of time interleaved analog-to-digital converters (ADCs), by:

detecting a multitude of edges of a waveform;

determining measured edge times corresponding to the multitude of edges;

determining edge timing measurement errors based upon the comparison of ideal edge times and the measured edge times by associating a value of each measured edge time in relation to the associated one or more time interleaved ADCs to form a scatter relationship, and determining deterministic errors in accordance with the scatter relationship; and

associating each edge timing measurement error with one or more of the time interleaved ADCs; and

converting a measured edge time of one or more edges of a waveform into a corrected edge time;

wherein the corrected edge time is determined by subtracting the edge timing measurement error corresponding to one or more of the time interleaved ADCs.

9. The method of claim 8 , wherein the subtracted edge timing measurement error is determined in accordance with edge timing measurement error information corresponding to two ADCs that consecutively sampled the waveform.

10. The method of claim 9 , wherein a sample time of each of the two ADCs straddle the measured edge time.

11. The method of claim 8 , wherein the subtracted edge timing measurement error is determined in accordance with the edge timing measurement error information corresponding to a single ADC.

12. The method of claim 11 , wherein a sample time of the single ADC is within a predetermined time of the measured edge time.

13. The method of claim 8 , wherein the measured edge time is determined by an arbitrary edge detection and interpolation algorithm.

14. The method of claim 13 , wherein the measured edge time is utilized to determine which one or more of the plurality of ADCs sampled the one or more edges of the waveform.

15. A method for defining, in a calibration phase, a relationship represented by a function determined through regression, for compensation of deterministic jitter in measurements made when utilizing a plurality of time interleaved analog-to-digital converters (ADCs), comprising the steps of:

detecting a multitude of edges of a waveform;

determining measured edge times corresponding to the multitude of edges;

determining edge timing measurement errors based upon the comparison of ideal edge times and the measured edge times; and associating each edge timing measurement error with one or more of the time interleaved ADCs.

16. The method of claim 15 , wherein the defined relationship is represented by a look up table.

17. The method of claim 16 , wherein the look up table is generated by smoothing data of the associated edge timing measurements and the one or more associated ADCs.

18. A method for defining, in a calibration phase, a relationship for compensation of deterministic jitter in measurements made when utilizing a plurality of time interleaved analog-to-digital converters (ADCs), comprising the steps of:

detecting a multitude of edges of a waveform;

determining measured edge times corresponding to the multitude of edges;

determining edge timing measurement errors based upon the comparison of ideal edge times and the measured edge times by associating a value of each measured edge time in relation to the associated one or more time interleaved ADCs to form a scatter relationship, and determining deterministic errors in accordance with the scatter relationship; and

associating each edge timing measurement error with one or more of the time interleaved ADCs.

Assignments (8)