Cap at resistors of electrical test probe
View Patent ↗A lossy dielectric device dissipates, absorbs, and/or dampens electric fields. The lossy dielectric device may be used with any transmission path, such as a transmission line or resistor in a probe head. The lossy dielectric device preferably includes a lossy dielectric material contained within a container. The container is positionable and securable substantially adjacent the transmission path to improve the curve of a frequency response. Preferably, the container is insulative, puncture resistant, and thin. In some preferred embodiments, a temporary or permanent connection mechanism is also included.
1. A lossy dielectric device for use with a transmission path of a probing head of a test probe, said device comprising:
(a) a container;
(b) lossy dielectric material contained within said container; and
(c) said container positionable substantially adjacent said transmission path to improve the curve of a frequency response of said test probe.
2. The lossy dielectric device of claim 1 wherein said container is insulative, puncture resistant, and thin.
3. The lossy dielectric device of claim 1 wherein said container is made of a material selected from the group consisting of:
(a) plastic;
(b) rubber;
(c) polymeric material; and
(d) biologically compatible elastically deformable material.
4. The lossy dielectric device of claim 1 wherein said container has a structure selected from the group consisting of:
(a) an at least partially flexible structure;
(b) a completely flexible structure; and
(c) a structure with a semi rigid bottom side and a flexible upper side.
5. The lossy dielectric device of claim 1 wherein said dielectric material is selected from a group consisting of:
(a) a mixture of salt and water;
(b) saline solution;
(c) a polysiloxane or a silicone gel; and
(d) bio-osmotic gel.
6. The lossy dielectric device of claim 1 further comprising at least one permanent connection mechanism.
7. The lossy dielectric device of claim 1 further comprising at least one temporary connection mechanism.
8. The lossy dielectric device of claim 1 further comprising a layer of ferrite material.
9. The lossy dielectric device of claim 1 , wherein said lossy dielectric material is a lossy dielectric fluid, a “squishy” material, or a formable material enclosed in said container.
10. A probing head of a test probe, said probing head comprising:
(a) a transmission path;
(b) a container;
(c) lossy dielectric material contained within said container; and
(d) said container securable substantially adjacent said transmission path to improve the curve of a frequency response of said test probe.
11. The probing head of claim 10 wherein said container is insulative, puncture resistant, and thin.
12. The probing head of claim 10 wherein said container is made of a material selected from the group consisting of:
(a) plastic;
(b) rubber;
(c) polymeric material; and
(d) biologically compatible elastically deformable material.
13. The probing head of claim 10 wherein said container has a structure selected from the group consisting of:
(a) an at least partially flexible structure;
(b) a completely flexible structure; and
(c) a structure with a semi rigid bottom side and a flexible upper side.
14. The probing head of claim 10 wherein said dielectric material is selected from a group consisting of:
(a) a mixture of salt and water;
(b) saline solution;
(c) a polysiloxane or a silicone gel; and
(d) bio-osmotic gel.
15. The probing head of claim 10 further comprising at least one permanent connection mechanism.
16. The probing head of claim 10 further comprising at least one temporary connection mechanism.
17. The probing head of claim 10 further comprising a layer of ferrite material.
18. The probing head of claim 10 , wherein said lossy dielectric material is a lossy dielectric fluid, a “squishy” material, or a formable material enclosed in said container.
19. A frequency response improving system associatable with a probing head of a test probe, said system comprising:
(a) a probing head;
(b) a transmission path associated with said probing head;
(c) a container;
(d) lossy dielectric material contained within said container; and
(e) said container positionable and securable substantially adjacent to at least part of said transmission path to improve the curve of a frequency response of said test probe.
20. The system of claim 19 wherein said container has a structure selected from the group consisting of:
(a) an at least partially flexible structure;
(b) a completely flexible structure; and
(c) a structure with a semi rigid bottom side and a flexible upper side.
21. The system of claim 19 , wherein said lossy dielectric material is a lossy dielectric fluid, a “squishy” material, or a formable material enclosed in said container.
22. A frequency response improving system for use with a test probe having a probing head, said probing head having a transmission path, said system comprising:
(a) a container;
(b) lossy dielectric material contained within said container; and
(c) said container positionable and securable substantially adjacent at least part of said transmission path to improve the curve of a frequency response of said test probe.
23. The probing head of claim 22 wherein said container has a structure selected from the group consisting of:
(a) an at least partially flexible structure;
(b) a completely flexible structure; and
(c) a structure with a semi rigid bottom side and a flexible upper side.
24. The system of claim 22 , wherein said lossy dielectric material is a lossy dielectric fluid, a “squishy” material, or a formable material enclosed in said container.