Resistive test probe tips and applications therefor
View Patent ↗A test probe tip constructed substantially from resistive material. The resistive material is made of resistive conducting material substantially enclosed in and dispersed throughout encapsulating material. The test probe tip has a probing end for probing electronic circuitry and a connection end for interfacing with a probing head. The resistive conducting material forms at least one path through the encapsulating material from the probing end to the connection end. The resistive conducting material may be a plurality of longitudinally-extending resistive/conductive members or a plurality of particulate resistive/conductive members.
1. A test probe tip or contact comprising:
(a) resistive material having a resistance described by the equation R 1 =0.75×(√(L 1 /(C 1 ×Length)) where R 1 is the resistance, L 1 is the inductance, and C 1 is the capacitance per millimeter;
(b) said test probe tip or contact constructed substantially from said resistive material, said test probe tip comprising:
(i) a probing end for probing electronic circuitry; and
(ii) a connection end for interfacing with a probing head; and
(c) said resistive material forming at least one electrical path from said probing end to said connection end.
2. The test probe tip or contact of claim 1 wherein said resistive material is nonmetallic.
3. The test probe tip or contact of claim 1 wherein said resistive material is pultruded resistive material.
4. The test probe tip or contact of claim 1 wherein said resistive material is pultruded rod.
5. The test probe tip or contact of claim 1 wherein said test probe tip or contact is a molded test probe tip or contact.
6. The test probe tip or contact of claim 1 wherein said test probe tip is constructed entirely of said resistive material.
7. The test probe tip or contact of claim 1 , said resistive material having a longitudinal axis, said resistive material comprising:
(a) a plurality of longitudinally-extending resistive/conductive members, at least one resistive/conductive member having a first resistive/conductive member end and a second resistive/conductive member end;
(b) encapsulating material enclosing said plurality of longitudinally-extending resistive/conductive member; and
(c) said first resistive/conductive member end and said second resistive/conductive member end exposed from said encapsulating material to provide electrical contacts.
8. The test probe tip or contact of claim 7 wherein said encapsulating material is nonconductive encapsulating material.
9. The test probe tip or contact of claim 7 wherein said plurality of longitudinally-extending resistive/conductive members are conductive fiber elements.
10. The test probe tip or contact of claim 7 wherein said plurality of longitudinally-extending resistive/conductive members is a plurality of nonmetallic longitudinally-extending resistive/conductive members.
11. The test probe tip or contact of claim 1 wherein said resistive conducting material includes a plurality of conductive fiber elements.
12. The test probe tip or contact of claim 11 wherein said plurality of conductive fiber elements is a plurality of nonmetallic conductive fiber elements.
13. The test probe tip or contact of claim 1 wherein said resistive conducting material includes a plurality of conductive fiber elements, wherein said plurality of conductive fiber elements is made from a material selected from the group consisting of:
(a) carbon;
(b) carbon/graphite;
(c) nichrome; and
(d) graphite.
14. The test probe tip or contact of claim 1 wherein said resistive conducting material includes, wherein said encapsulating material is made from a material selected from the group consisting of:
(a) a polymer;
(b) structural thermoplastic;
(c) thermosetting resins;
(d) polyesters;
(e) epoxies;
(f) vinyl esters;
(g) polyetheretherketones;
(h) polyetherimides;
(i) polyethersulphones;
(j) polypropylene;
(k) nylon;
(l) an elastomeric matrix;
(m) a silicone;
(n) fluorosilicone; and
(o) polyurethane elastomer.
15. The test probe tip or contact of claim 1 , wherein said resistive material includes a plurality of longitudinally-extending resistive/conductive members.
16. The test probe tip or contact of claim 15 wherein said plurality of longitudinally-extending resistive/conductive members is a plurality of nonmetallic longitudinally-extending resistive/conductive members.
17. The test probe tip or contact of claim 1 , wherein said resistive material includes a plurality of particulate resistive/conductive members.
18. The test probe tip or contact of claim 17 wherein said plurality of particulate resistive/conductive members is a plurality of nonmetallic particulate resistive/conductive members.