IP Library Granted Patent US 7,317,345
Granted Patent B2
US 7,317,345 · App. 11/069,537 · Granted Jan 8, 2008

Anti-gate leakage programmable capacitor

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Quick Facts
Patent No.
US 7,317,345
App. No.
11/069,537
Granted
Jan 8, 2008
Kind
B2
Abstract

An anti-gate leakage programmable capacitor including at least one capacitor having a first terminal coupled to a first node and a second terminal, a second node, and a control circuit which selectively couples the second terminal of the capacitor to the second node or which drives the second terminal to the same voltage as the first node. In one embodiment, the programmable capacitor includes multiple capacitors, an amplifier having an input coupled to the first node and an output, and a switch circuit coupled to the second node, to each second terminal of each capacitor and to the amplifier output. The switch circuit selectively switches each second terminal of each capacitor between the amplifier output and the second node. The switch circuit may include pairs of switches each controlled by a corresponding select signal to selectively switch a corresponding capacitor between the reference node and the output of the amplifier.

Claims (47)

1. An anti-gate leakage programmable capacitor, comprising:

at least one capacitor having a first terminal coupled to a first node and a second terminal;

a second node; and

a control circuit, comprising:

a amplifier circuit having an input coupled to said first node and an output, wherein said amplifier circuit drives its output to the same voltage as said first node; and

a switch circuit, coupled to said output of said amplifier circuit, said second node and said second terminal of said capacitor, wherein said switch circuit selectively couples said second terminal of said at capacitor to said second node when said capacitor is selected and selectively couples said second terminal of said capacitor to said output of said amplifier circuit when said capacitor is not selected.

2. The anti-gate leakage programmable capacitor of claim 1 , wherein said capacitor comprises a metal-oxide semiconductor transistor configured as a capacitor.

3. The anti-gate leakage programmable capacitor of claim 1 , wherein said control circuit comprises:

said amplifier circuit comprising a unity gain amplifier having an input coupled to said first node and an output; and

said switch circuit comprising:

at least one first switch having a first current terminal coupled to said second terminal of said capacitor, a second current terminal coupled to said second node and a control terminal receiving a select signal; and

at least one second switch having a first current terminal coupled to said second terminal of said capacitor, a second current terminal coupled to said output of said amplifier and a control terminal receiving said select signal;

wherein said first and second switches are controlled by said select signal to selectively couple said second terminal of said capacitor to either one of said second node and said output of said unity gain amplifier.

4. The anti-gate leakage programmable capacitor of claim 3 , wherein said unity gain amplifier comprises an operational amplifier having an output, having a non-inverting input coupled to said first node, and having an inverting input coupled to said output of said operational amplifier.

5. The anti-gate leakage programmable capacitor of claim 3 , wherein said at least one first switch comprises a metal-oxide semiconductor transistor having a drain and source coupled between a second terminal of said capacitor and said second node and having a gate receiving said select signal.

6. The anti-gate leakage programmable capacitor of claim 3 , wherein said at least one second switch comprises a pass gate having current terminals coupled between a second terminal of said capacitor and said output of said amplifier, and having a complementary pair of control terminals receiving said select signal and an inverted select signal.

7. The anti-gate leakage programmable capacitor of claim 3 , wherein:

said at least one capacitor comprises a plurality of capacitors, each having a first terminal coupled to said first node and a second terminal;

said at least one first switch comprising a plurality of first switches, each having a first current terminal coupled to a second terminal of a corresponding capacitor, a second current terminal coupled to said second node and a control terminal receiving a corresponding one of a plurality of select signals; and

said at least one second switch comprising a plurality of second switches, each having a first current terminal coupled to a second terminal of a corresponding capacitor, a second current terminal coupled to said output of said amplifier and a control terminal receiving a corresponding select signal;

wherein each pair of said plurality of first and second switches is controlled by a corresponding select signal to selectively switch a second terminal of a corresponding capacitor to either one of said second node and said output of said amplifier.

8. The anti-gate leakage programmable capacitor of claim 7 , wherein said plurality of capacitors collectively form a binary-weighted set of capacitances.

9. A phase locked loop (PLL) circuit comprising:

a phase frequency detector having a first input receiving a first clock, a second input receiving a second clock, and at least one output providing at least one clock control signal;

a charge pump having at least one input receiving said clock control signal and an output coupled to a frequency control voltage node having a controlled voltage relative to a reference node;

a voltage controlled oscillator (VCO) having an input coupled to said frequency control voltage node and an output that provides said second clock; and

a programmable capacitor, coupled between said frequency control voltage node and said reference node, comprising:

a plurality of capacitors, each having a first terminal coupled to said frequency control voltage node and a second terminal;

an amplifier having an input coupled to said frequency control voltage node and an output; and

a switch circuit, coupled to said reference node, to each second terminal of each of said plurality of capacitors and to said amplifier output, that selectively switches each second terminal of each capacitor between said amplifier output and said reference node.

10. The PLL of claim 9 , wherein said switch circuit comprises:

a plurality of first switches, each having a first current terminal coupled to a second terminal of a corresponding one of said plurality of capacitors, a second current terminal coupled to said reference node and a control terminal receiving a select signal; and

a plurality of second switches, each having a first current terminal coupled to a second terminal of a corresponding capacitor, a second current terminal coupled to said output of said amplifier and at least one control terminal receiving a corresponding one of said plurality of select signals;

wherein each pair of said plurality of first and second switches is controlled by a corresponding one of said plurality of select signals to selectively switch a second terminal of a corresponding capacitor between said reference node and said output of said amplifier.

11. The PLL of claim 10 , wherein each first switch comprises a metal-oxide semiconductor transistor and wherein each second switch comprises a MOS pass gate receiving a complementary pair of select signals.

12. The PLL of claim 9 , wherein each of said plurality of capacitors comprises a metal-oxide semiconductor transistor having its drain and source coupled to its substrate.

13. The PLL of claim 9 , wherein said amplifier comprises a unity gain amplifier.

14. A method of minimizing gate leakage of a programmable capacitor having a plurality of capacitors coupled to a first node and a corresponding plurality of first switches coupled to a second node, wherein each capacitor and first switch pair are coupled in series between the first and second nodes forming a plurality of intermediate junctions, said method comprising:

driving a third node to a voltage level substantially equal to the voltage of the first node;

activating selected ones of the first switches to selectively couple corresponding capacitors to the second node; and

coupling the intermediate junction of each unselected capacitor to the third node.

15. The method of claim 14 , wherein said driving a third node comprises coupling an input of a unity gain amplifier to the first node and coupling the output of the amplifier to the third node.

16. The method of claim 14 , wherein said activating selected ones of the first switches comprises turning on selected ones of a plurality of metal-oxide semiconductor (MOS) transistors coupled to said plurality of capacitors.

17. The method of claim 16 , wherein said turning on selected ones of a plurality of MOS transistors comprises asserting a selected combination of select signals.

18. The method of claim 14 , wherein said coupling the intermediate junction of each unselected capacitor to the third node comprises activating a corresponding second switch coupled between the intermediate junction and the third node.

19. The method of claim 18 , wherein said activating a corresponding second switch coupled between the intermediate junction and the third node comprises turning on a corresponding pass gate.

20. The method of claim 19 , wherein said turning on a corresponding pass gate comprises asserting complementary select signals.

Assignments (30)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
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Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
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RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
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To: NXP B.V.
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To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Feb 2, 2007
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