Method and apparatus for reduced power cell
View Patent ↗The invention relates to reduced power cells. Some embodiments of the invention provide a memory circuit that has a storage cell. The storage cell contains several electronic components and an input. The electronic components receive a reduced voltage from the input to the cell. The reduced voltage reduces the current leakage of the electronic components within the cell. Some embodiments provide a memory circuit that has a level converter. The level converter receives a reduced voltage and converts the reduced voltage into values that can be used to store and retrieve data with stability in the cell. Some embodiments provide a method for storing data in a memory circuit that has a storage cell. The method applies a reduced voltage to the input of the cell. The method level converts the reduced voltage. The reduced voltage is converted to a value that can be used to store and retrieve data with stability in the cell. The reduced voltage reduces a current leakage of electronic components within the cell.
1. A memory circuit that is part of an integrated circuit that operates at standard power-supply voltage levels, the memory circuit comprising:
a storage cell;
said storage cell having a plurality of electronic components;
said storage cell receiving a reduced power-supply voltage and storing data at a reduced operating voltage during the operation of the memory circuit,
a level converter attached to said storage cell, wherein said level converter: (1) receives said reduced operating voltage stored in the storage cell, and (2) level converts said reduced operating voltage into a standard voltage level so that the data stored in the storage cell is supplied to another device in the integrated circuit at the standard voltage level;
wherein said reduced operating voltage reduces the current leakage of said electronic components within said cell.
2. The memory circuit of claim 1 , wherein the data stored in the storage cell is configuration data, the memory circuit further comprising an output line coupled to said storage cell, said output line for providing the data stored in said cell.
3. The memory circuit of claim 2 , wherein said data stored in said cell is provided continuously along said output line.
4. The memory circuit of claim 3 , wherein the data stored in the storage cell is level converted to a standard power-supply voltage level of another circuit that contains the memory circuit, before being supplied to the output line.
5. The memory circuit of claim 1 , said memory circuit for use by a configurable circuit.
6. The memory circuit of claim 1 , wherein said storage cell comprises a pair of cross coupled CMOS inverters.
7. The memory circuit of claim 1 , wherein said level converter comprises a pair of cross coupled PMOS transistors.
8. A method of storing data in a memory circuit that is part of an integrated circuit that operates at standard power-supply voltage levels, the memory circuit comprising a storage cell, said cell comprising a plurality of electronic components, said method comprising:
supplying the storage cell with a reduced power-supply voltage;
storing data in the storage cell at a reduced operating voltage;
receiving the data at the reduced operating voltage into a level converter; and
level converting said reduced operating voltage into a standard voltage level that is supplied to another device in the integrated circuit;
wherein said reduced operating voltage reduces the current leakage of electronic components within said cell.
9. The method of claim 8 , wherein the data is configuration data.
10. The method of claim 9 , wherein the other device is a configurable circuit, the method further comprising outputting the data stored in the storage cell to the configurable circuit.
11. The method of claim 8 , wherein the storage cell comprises a cross-coupled pair of inverters.
12. The memory circuit of claim 1 , further comprising:
a first control circuit coupled to the storage cell;
the first control circuit for receiving a standard operating voltage, reducing the standard operating voltage into the reduced operating supply voltage, and supplying the reduced operating supply voltage to the storage cell.
13. The memory circuit of claim 12 , wherein the first control circuit reduces the standard operating voltage to the storage cell when the storage cell is storing data.
14. The memory circuit of claim 12 further comprising a second control circuit for supplying the standard operating voltage to the storage cell during read or write access to the storage cell.
15. The memory circuit of claim 12 , wherein the standard operating voltage is reduced by a threshold.
16. A configurable integrated circuit operating at a standard operating voltage, the configurable integrated circuit comprising:
a configurable circuit for configurably performing a set of operations;
a memory circuit comprising a storage cell with electronic components;
said storage cell for storing configuration data at reduced operating voltage in order to reduce leakage current through the electronic components during the operation of the memory circuit;
said memory circuit for outputting configuration data at the standard operating voltage to the configurable circuit;
a level converter attached to said storage cell, wherein said level converter:
(1) receives said reduced operating voltage stored in the storage cell; and
(2) level converts said reduced operating voltage into the standard operating voltage to supply the data stored in the storage cell to the configurable circuit.
17. The configurable integrated circuit of claim 16 , wherein said level converter comprises a pair of cross coupled PMOS transistors.
18. The configurable integrated circuit of claim 16 , wherein said storage cell comprises a pair of cross coupled CMOS inverters.