IP Library Granted Patent US 6,995,460
Granted Patent B1
US 6,995,460 · App. 11/123,489 · Granted Feb 7, 2006

Leadless plastic chip carrier with etch back pad singulation

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Quick Facts
Patent No.
US 6,995,460
App. No.
11/123,489
Granted
Feb 7, 2006
Kind
B1
Abstract

A leadless plastic chip carrier is constructed by half etching one or both sides of the package design onto a leadframe strip so as to create unique design features such as power and/or ground ring surrounding the die attach pad, interlocking rivet head construction for the contact pads, and an interlocking pattern for the die attach pad. After wire bonding and molding, a further etching is performed to isolate and expose contact pads. Singulation of individual chip packages from the leadframe strip is then performed by saw singulation or die punching.

Claims (29)

1. A leadless plastic chip carrier, comprising:

a semiconductor die mounted to a ground plane;

at least one row of contact pads circumscribing said ground plane;

a plurality of wire bonds connecting said semiconductor die and said at least one row of contact pads; and

an overmold covering said semiconductor die, said wire bonds and said at least one row of contact pads and said ground plane, such that at least one surface of said at least one row of contact pads and at least one surface of said ground plane are exposed from the overmold; wherein

said at least one row of contact pads is recessed into said overmold to form a plurality of etch down cavities.

2. The leadless plastic chip carrier of claim 1 , wherein each of said contact pads comprises a plurality of metal layers deposited to form a rivet shape in profile.

3. The leadless plastic chip carrier of claim 2 , wherein said plurality of metal layers comprises successive layers of Au, Ni, Cu, Ni and Au.

4. The leadless plastic chip carrier of claim 2 , wherein said plurality of metal layers comprises successive layers of Au, Ni, Cu, and Ag.

5. The leadless plastic chip carrier of claim 2 , wherein said plurality of metal layers comprises successive layers of Tin, Cu, Ni and Au.

6. The leadless plastic chip carrier of claim 2 , wherein said plurality of metal layers comprises successive layers of Tin, Cu, and Ag.

7. The leadless plastic chip carrier of claim 1 , wherein each of said contact pads is round.

8. The leadless plastic chip carrier of claim 1 , wherein each of said contact pads is rectangular.

9. The leadless plastic chip carrier of claim 1 , further including a plurality of solder balls within said etch down cavities and connected to said at least one row of contact pads.

10. The leadless plastic chip carrier of claim 1 , wherein an outer edge of said ground plane conforms to an interlock pattern.

11. The leadless plastic chip carrier of claim 1 , wherein the at least one surface of said row of contact pads and the at least one surface of said ground plane that are exposed are coated with a thin uniform layer of solder.

12. A leadless plastic chip carrier, comprising:

a semiconductor die mounted to a ground plane;

at least one row of contact pads circumscribing said ground plane;

a plurality of wire bonds connecting said semiconductor die and said at least one row of contact pads; and

an overmold covering said semiconductor die, said wire bonds and said at least one row of contact pads, such that at least one surface of said at least one row of contact pads and at least one surface of said ground plane are exposed from the overmold; wherein

each of said contact pads has a rivet shape in profile.

13. The leadless plastic chip carrier of claim 12 , wherein an outer edge of said ground plane conforms to an interlock pattern.

14. The leadless plastic chip carrier of claim 12 , wherein said at least one row of contact pads comprises a plurality of metal layers.

15. The leadless plastic chip carrier of claim 14 , wherein said plurality of metal layers comprises successive layers of Au, Ni, Cu, Ni and Au.

16. The leadless plastic chip carrier of claim 14 , wherein said plurality of metal layers comprises successive layers of Au, Ni, Cu, and Ag.

17. The leadless plastic chip carrier of claim 14 , wherein said plurality of metal layers comprises successive layers of Tin, Cu, Ni and Au.

18. The leadless plastic chip carrier of claim 14 , wherein said plurality of metal layers comprises successive layers of Tin, Cu, and Ag.

19. The leadless plastic chip carrier of claim 12 , wherein the at least one surface of said row of contact pads and the at least one surface of said ground plane that are exposed are coated with a thin uniform layer of solder.

Assignments (7)
CORRECTIVE ASSIGNMENT TO CORRECT THE ADD ANNEX INADVERTENTLY LEFT OUT ORIGINAL ASSIGNMENT DOCUMENT PREVIOUSLY RECORDED AT REEL: 037880 FRAME: 0534. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jul 8, 2016
From: UTAC HONG KONG LIMITED
To: UTAC HEADQUARTERS PTE. LTD.
Reel/Frame 039822/0591 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 23, 2016
From: UTAC HONG KONG LIMITED
To: UTAC HEADQUARTERS PTE. LTD.
Reel/Frame 037880/0534 →
CHANGE OF NAME Recorded Oct 29, 2010
From: ASAT LIMITED
To: UTAC HONG KONG LIMITED
Reel/Frame 025217/0348 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS - SECOND PRIORITY Recorded Jun 29, 2010
From: UTAC HONG KONG LIMITED
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024599/0827 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS - FIRST PRIORITY Recorded Jun 29, 2010
From: UTAC HONG KONG LIMITED
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024599/0743 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS - SECOND PRIORITY Recorded Jun 29, 2010
From: UTAC HONG KONG LIMITED
To: THE HONGKONG AND SHANGHAI BANKING CORPORATION LIMITED, AS SECURITY AGENT
Reel/Frame 024611/0097 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 17, 2005
From: KWAN, KIN PUI; LAU, WING HIM; TSANG, KWOK CHEUNG; FAN, CHUN HO; MCLELLAN, NEIL
To: ASAT LTD.
Reel/Frame 016794/0109 →