IP Library Granted Patent US 7,271,032
Granted Patent B1
US 7,271,032 · App. 11/123,491 · Granted Sep 18, 2007

Leadless plastic chip carrier with etch back pad singulation

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Quick Facts
Patent No.
US 7,271,032
App. No.
11/123,491
Granted
Sep 18, 2007
Kind
B1
Abstract

A leadless plastic chip carrier is constructed by half etching one or both sides of the package design onto a leadframe strip so as to create unique design features such as power and/or ground ring surrounding the die attach pad, interlocking rivet head construction for the contact pads, and an interlocking pattern for the die attach pad. After wire bonding and molding, a further etching is performed to isolate and expose contact pads. Singulation of individual chip packages from the leadframe strip is then performed by saw singulation or die punching.

Claims (49)

1. A process for fabricating a leadless plastic chip carrier, comprising the steps of:

depositing a mask on a first surface of a leadframe strip to define at least one row of contact pads and a die attach pad of said leadless plastic chip carrier;

depositing a plurality of layers on portions of said first surface exposed by said mask for creating said at least one row of contact pads and said die attach pad;

dissolving away said mask;

mounting a semiconductor die to said die attach pad on said first surface and wire bonding said semiconductor die to said at least one row of contact pads;

encapsulating said first surface of said leadframe strip in a molded material; and

etching back a bottom surface of said leadframe strip for exposing said contact pads and said die attach pad.

2. The process of claim 1 , wherein said step of depositing said plurality of layers includes an initial deposition of flash Cu which is etched away during step of etching back said bottom surface to create a cavity.

3. The process of claim 2 , wherein said initial deposition of flash Cu is followed by depositing layers of Au, Ni, Cu, Ni and Au.

4. The process of claim 2 , wherein said initial deposition of flash Cu is followed by depositing layers of Au, Ni, Cu and Ag.

5. The process of claim 2 , wherein, further including a step of attaching solder balls to said contact pads exposed as a result of said step of etching back said bottom surface of said leadframe strip.

6. The process of claim 1 , wherein said step of depositing said plurality of layers includes depositing successive layers of Au, Ni, Cu, Ni and Au.

7. The process of claim 1 , wherein said step of depositing said plurality of layers includes depositing successive layers of Au, Ni, Cu, and Ag.

8. The process of claim 1 , wherein said step of depositing said plurality of layers includes depositing successive layers of Tin, Cu, Ni and Au.

9. The process of claim 1 , wherein said step of depositing said plurality of layers includes depositing successive layers of Tin, Cu, and Ag.

10. The process of claim 1 , further comprising the step of singulating said leadless plastic chip carrier from said leadframe strip.

11. A process for fabricating a leadless plastic chip carrier, comprising the steps of:

depositing a mask on a first surface of a leadframe strip to define at least one row of contact pads and a die attach pad of said leadless plastic chip carrier;

depositing a plurality of layers on portions of said first surface exposed by said mask for creating said at least one row of contact pads and said die attach pad;

dissolving away said mask;

mounting a semiconductor die to said die attach pad on said first surface and wire bonding said semiconductor die to said at least one row of contact pads;

encapsulating said first surface of said leadframe strip in a molded material; and

etching back a bottom surface of said leadframe strip for exposing said contact pads and said die attach pad; wherein

the step of depositing a plurality of layers includes forming a mushroom cap shaped portion at an upper portion of the contact pads.

12. The process of claim 11 , wherein said step of depositing said plurality of layers includes an initial deposition of flash Cu which is etched away during step of etching back said bottom surface to create a cavity.

13. The process of claim 12 , further including a step of attaching solder balls to said contact pads exposed as a result of said step of etching back said bottom surface of said leadframe strip.

14. The process of claim 12 , wherein said initial deposition of flash Cu is followed by depositing layers of Au, Ni, Cu, Ni and Au.

15. The process of claim 12 , wherein said initial deposition of flash Cu is followed by depositing layers of Au, Ni, Cu and Ag.

16. The process of claim 11 , wherein said step of depositing said plurality of layers includes depositing successive layers of Au, Ni, Cu, Ni and Au.

17. The process of claim 11 , wherein said step of depositing said plurality of layers includes depositing successive layers of Au, Ni, Cu, and Ag.

18. The process of claim 11 , wherein said step of depositing said plurality of layers includes depositing successive layers of Tin, Cu, Ni and Au.

19. The process of claim 11 , wherein said step of depositing said plurality of layers includes depositing successive layers of Tin, Cu, and Ag.

20. The process of claim 11 , wherein the step of depositing a plurality of layers includes creating a power/ground ring.

21. The process of claim 20 , wherein the power/ground ring is disposed between the die attach pad and the at least one row of contact pads so as to substantially surround the die attach pad.

22. A process for fabricating a leadless plastic chip carrier, comprising the steps of:

depositing a mask on a first surface of a leadframe strip to define at least one row of contact pads and a die attach pad of said leadless plastic chip carrier;

depositing a flash Cu layer on portions of said first surface exposed by said mask;

depositing a plurality of layers on said flash Cu layer for creating said at least one row of contact pads and said die attach pad;

dissolving away said mask;

mounting a semiconductor die to said die attach pad on said first surface and wire bonding said semiconductor die to said at least one row of contact pads;

encapsulating said first surface of said leadframe strip in a molded material; and

etching back a bottom surface of said leadframe strip and said flash Cu layer for exposing said contact pads and said die attach pad.

23. The process of claim 22 , further comprising the step of attaching solder balls to said contact pads exposed as a result of said step of etching back said bottom surface of said leadframe strip and said flash Cu layer.

24. The process of claim 22 , wherein said initial deposition of flash Cu is followed by depositing layers of Au, Ni, Cu, Ni and Au.

25. The process of claim 22 , wherein said initial deposition of flash Cu is followed by depositing layers of Au, Ni, Cu and Ag.

26. The process of claim 22 , wherein said step of depositing said plurality of layers includes depositing successive layers of Tin, Cu, Ni and Au.

27. The process of claim 22 , wherein said step of depositing said plurality of layers includes depositing successive layers of Tin, Cu, and Ag.

28. The process of claim 22 , wherein the step of depositing a plurality of layers includes creating a power/ground ring.

29. The process of claim 28 , wherein the power/ground ring is disposed between the die attach pad and the at least one row of contact pads so as to substantially surround the die attach pad.

Assignments (8)
SECURITY INTEREST Recorded Dec 7, 2022
From: SIO2 MEDICAL PRODUCTS, INC.
To: SALZUFER HOLDING INC., AS ADMINISTRATIVE AGENT
Reel/Frame 062094/0121 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ADD ANNEX INADVERTENTLY LEFT OUT ORIGINAL ASSIGNMENT DOCUMENT PREVIOUSLY RECORDED AT REEL: 037880 FRAME: 0534. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jul 8, 2016
From: UTAC HONG KONG LIMITED
To: UTAC HEADQUARTERS PTE. LTD.
Reel/Frame 039822/0591 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 23, 2016
From: UTAC HONG KONG LIMITED
To: UTAC HEADQUARTERS PTE. LTD.
Reel/Frame 037880/0534 →
CHANGE OF NAME Recorded Oct 29, 2010
From: ASAT LIMITED
To: UTAC HONG KONG LIMITED
Reel/Frame 025217/0408 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS - SECOND PRIORITY Recorded Jun 29, 2010
From: UTAC HONG KONG LIMITED
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024599/0827 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS - SECOND PRIORITY Recorded Jun 29, 2010
From: UTAC HONG KONG LIMITED
To: THE HONGKONG AND SHANGHAI BANKING CORPORATION LIMITED, AS SECURITY AGENT
Reel/Frame 024611/0097 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS - FIRST PRIORITY Recorded Jun 29, 2010
From: UTAC HONG KONG LIMITED
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024599/0743 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 29, 2005
From: KWAN, KIN PUI; LAU, WING HIM; TSANG, KWOK CHEUNG; FAN, CHUN HO; MCLELLAN, NEIL
To: ASAT LTD.
Reel/Frame 016847/0441 →