Method for forming nanoscale features
View Patent ↗Here is presented a versatile technique for machining of nanometer-scale features using tightly-focused ultrashort laser pulses. By the invention, the size of features can be reduced far below the wavelength of light, thus enabling nanomachining of a wide range of materials. The features may be extremely small (<20 nm) and are highly reproducible.
1. A method of producing one or more features of micrometer size or less in a material comprising:
generating at least one laser pulse of femtosecond duration or less,
directing said pulse to a material to deposit enemy in the material to extract electrons from a valence band providing unbound electrons at a density sufficient to define a first absorption volume, and
directing said pulse to the material to deposit added energy within at least a portion of the first absorption volume causing contraction of said first absorption volume to a smaller second absorption volume, thereby causing damage of the material selectively within said second absorption volume essentially without collateral damage to the balance of the material in said first absorption volume in the presence of an entraining fluid that entrains debris caused by such damage.
2. The method of claim 1 wherein the material has a surface, the pulse is directed to the surface, and the entraining fluid moves along the surface.
3. The method of claim 1 wherein the entraining fluid is a liquid bath that is essentially quiescent.
4. The method of claim 1 wherein the entraining fluid is a gas.
5. The method of claim 4 wherein the gas is moving and exerts a force sufficient to entrain the debris.
6. The method of claim 1 wherein the entraining fluid is essentially quiescent and has a density sufficient to entrain the debris.
7. The method of claim 1 wherein the entraining fluid is moving and exerts a force sufficient to entrain the debris.
8. The method of claim 1 wherein the entraining fluid is water or liquid hydrocarbon.
9. The method of claim 1 wherein the material is submersed in the fluid.
10. The method of claim 1 wherein said features are nanoscale features having at least one dimension less than a micrometer.