IP Library Granted Patent US 7,224,433
Granted Patent B2
US 7,224,433 · App. 11/174,103 · Granted May 29, 2007

Method and apparatus for immersion lithography

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Quick Facts
Patent No.
US 7,224,433
App. No.
11/174,103
Granted
May 29, 2007
Kind
B2
Abstract

A method and apparatus for immersion lithography is described. The method includes positioning a semiconductor substrate under an optical immersion head assembly, providing an immersion liquid between the substrate and the optical immersion head assembly, and supplying a tensio-active gaseous substance along the perimeter of the contact area of the immersion liquid and the substrate. The immersion liquid contacts at least an area of the substrate. The tensio-active gaseous substance is chosen such that, when at least partially mixed with the immersion liquid, the mixture has a lower surface tension than the immersion liquid, thereby creating a surface tension gradient pulling the immersion liquid from the perimeter towards an inside portion of the contact area.

Claims (31)

1. A method for immersion lithography, comprising in combination:

positioning a substrate under an optical immersion head assembly;

providing an immersion liquid between the substrate and the optical immersion head assembly, wherein the immersion liquid contacts at least an area of the substrate; and

supplying a tensio-active gaseous substance to different sections along a perimeter of the contact area of the immersion liquid and the substrate,

wherein the tensio-active gaseous substance at least partially mixed with the immersion liquid forms a mixture having a lower surface tension than the immersion liquid, thereby creating a surface tension gradient pulling the immersion liquid from the perimeter towards an inside portion of the contact area, and

wherein confinement of the immersion liquid is separately optimized at each of the different sections.

2. A method according to claim 1 , wherein the tensio-active gaseous substance and a concentration of the tensio-active gaseous substance are selected to be compatible with a photoresist.

3. A method according to claim 1 , wherein the tensio-active gaseous substance is selected from the group consisting of isopropylalcohol (IPA), butanol, ethanol, hexanol, equivalents, and a mixture thereof.

4. A method according to claim 1 , wherein the tensio-active gaseous substance comprises IPA vapor.

5. A method according to claim 1 , wherein the tensio-active gaseous substance comprises IPA vapor and a vapor of the immersion liquid.

6. A method according to claim 3 , wherein the tensio-active gaseous substance further comprises an inert gas.

7. A method according to claim 1 , wherein the tensio-active gaseous substance comprises a mixture of IPA and N 2 vapor.

8. A method according to claim 1 , wherein the different sections are selected according to a local orientation of the perimeter with respect to a relative velocity vector.

9. A method according to claim 1 , wherein the different sections are divided in a side part, an advancing part, and a receding part.

10. A method according to claim 1 , wherein supplying the tensio-active gaseous substance comprises providing a jet directed to the perimeter of the contact area.

11. A method according to claim 1 , wherein the tensio-active gaseous substance is supplied through a slit-shaped outlet directed to the perimeter of the contact area and mounted around the optical immersion head assembly.

12. A method according to claim 1 , wherein supplying the immersion liquid comprises supplying the immersion liquid at one side of the optical immersion head assembly and draining the immersion liquid at another side of the optical immersion head assembly.

13. A method according to claim 1 , further comprising re-circulating the immersion liquid.

14. A method according to claim 1 , further comprising treating the immersion liquid.

15. An apparatus for immersion lithography, comprising in combination:

means for holding a substrate;

an optical immersion head assembly;

means for supplying an immersion liquid between the substrate and the optical immersion head assembly; and

means for supplying a tensio-active gaseous substance is separated into different sections along a perimeter of a contact area of the immersion liquid and the substrate, wherein a surface tension gradient is created pulling the immersion liquid from the perimeter towards an inside portion of the contact area, and

wherein the means for supplying the tensio-active gaseous substance is suitable for separately optimizing confinement of the immersion liquid in each of the different sections.

16. An apparatus according to claim 15 , wherein the different sections are selected according to a local orientation of the perimeter with respect to a relative velocity vector.

17. An apparatus according to claim 15 , wherein the different sections are divided into a side part, an advancing part, and a receding part.

18. An apparatus according to claim 15 , wherein the means for supplying the tensio-active gaseous substance comprises a device providing a jet directed to the perimeter of the contact area.

19. An apparatus according to claim 15 , wherein the means for supplying a tensio-active gaseous substance comprises a nozzle with a slit-shaped outlet directed to the perimeter of the contact area and mounted around the optical immersion head assembly.

20. An apparatus according to claim 15 , wherein the means for supplying the immersion liquid is arranged to supply the immersion liquid at one side of the optical immersion head assembly and drain the immersion liquid at another side of the optical immersion head assembly.

21. An apparatus according to claim 15 , further comprising a recirculation device arranged to treat the immersion liquid.

Assignments (3)
CHANGE OF NAME Recorded Dec 4, 2009
From: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
To: IMEC
Reel/Frame 023594/0846 →
CORRECTIVE ASSIGNMENT CORRECTION OF ASSIGNMENT RECORDED ON AUGUST 16, 2005 AT REEL 016640 FRAME 0557 Recorded Oct 17, 2005
From: MARTENS, PAUL; FYEN, WIM
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 016890/0531 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 16, 2005
From: MERTENS, PAUL; FYEN, WIM
To: MCDONNELL BOEHNEN HULBERT & BERGHOFF LLP
Reel/Frame 016640/0557 →