Patent Assignment
Reel/Frame 023594/0846
Change of Name
Recorded: 2009-12-04
Pages: 22
Assignor
INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Executed: 1984-01-16
Assignee
IMEC
KAPELDREEF 75, LEUVEN, 3001, BELGIUM
Covered Properties
(70)
Method and Apparatus for Removing a Liquid from a Surface
Patent:
6,334,902 →
Application:
09/331,021 →
Method and Apparatus for Localized Liquid Treatment of the Surface of a Substrate
Patent:
6,398,975 →
Application:
09/553,988 →
Method for Ultra-Fast Controlling of a Magnetic Cell and Related Devices
Fully Integrated Tuneable Spin Torque Device for Generating an Oscillating Signal and Method for Tuning Such Apparatus
Device for Electrostatic Discharge Protection
Single Bit Nonvolatile Memory Cell and Methods for Programming and Erasing Thereof
Insulating Barrier, Nvm Bandgap Design
High dielectric constant composition and method of making same
Application:
11/124,303 →
Publication:
US 2005/0202222
Method and Apparatus for Immersion Lithography
Method of Manufacturing a Thermoelectric Generator and Thermoelectric Generator Thus Obtained
Method for Providing an Optical Interface and Devices According to Such Methods
Devices and Methods for Ultra-Wideband Communications
Method and System for Optimizing a Barc Stack
Method for forming a silicidated contact
Application:
11/246,516 →
Publication:
US 2007/0080408
Method for making a passivated semiconductor substrate
Application:
11/249,642 →
Publication:
US 2006/0086950
Method for Designing a Micro Electromechanical Device with Reduced Self-Actuation
Methods and Systems for Characterising and Optimising Immersion Lithographic Processing
Non-Volatile Memory Devices
Method for Forming Dual Fully Silicided Gates and Devices with Dual Fully Silicided Gates
Application:
11/382,986 →
Publication:
US 2006/0263961
Method for forming fully silicided gates and devices obtained thereof
Application:
11/434,434 →
Publication:
US 2006/0258156
Probe Device for Electrical Stimulation and Recording of the Activity of Excitable Cells
Method for Extracting the Distribution of Charge Stored in a Semiconductor Device
Method for Operating a Non-Volatile Charge-Trapping Memory Device and Method for Determining Programming/Erase Conditions
Metal nanostructures and pharmaceutical compositions
Application:
11/479,388 →
Publication:
US 2007/0116773
Neurotransmitter stimulation of neurons with feedback from sensors
Application:
11/485,742 →
Publication:
US 2007/0016151
Method for Forming Germanides and Devices Obtained Thereof
Electrostatic Discharge Protected Circuits
Method and System for Optically Coupling Components
Circuit, System and Method for Monitoring an Optical Fiber Network
Method and Apparatus for Detecting an Analyte
Digital-To-Analogue Converter System with Increased Performance
Method for Determining Time to Failure of Submicron Metal Interconnects
Method and System for Measuring Physical Parameters with a Piezoelectric Bimorph Cantilever in a Gaseous or Liquid Environment
Method for forming silicon germanium layers at low temperatures, layers formed therewith and structures comprising such layers
Application:
11/643,235 →
Publication:
US 2010/0032812
Methods for manufacturing dense integrated circuits
Application:
11/645,232 →
Publication:
US 2007/0172770
Organic Light-Emitting Device with Field-Effect Enhanced Mobility
Organic Semi-Conductor Photo-Detecting Device
Slanted Segmented Coupler
Method for Modulating the Effective Work Function
Application:
11/754,775 →
Publication:
US 2007/0272967
Method for Encapsulating a Device in a Microcavity
Method for Determining a Pulse Position in a Signal
Method for Treating a Damaged Porous Dielectric
Method and Solution to Grow Charge-Transfer Complex Salts
Method to remove resist layers from a substrate
Application:
11/904,277 →
Publication:
US 2008/0085480
Sensor for Eliminating Undesired Components and Measurements Method Using Said Sensor
Diamond Enhanced Thickness Shear Mode Resonator
Method to Improve the Selective Epitaxial Growth (Seg) Process
Application:
11/962,020 →
Publication:
US 2008/0153266
Methods for manufacturing a CMOS device with dual dielectric layers
Application:
11/972,601 →
Publication:
US 2008/0191286
Method for Controlled Formation of a Gate Dielectric Stack
Application:
11/972,615 →
Publication:
US 2008/0308881
Device and Method for Generating a Signal with Predefined Transcient at Start-Up
Method for Improving Erase Saturation in Non-Volatile Memory Devices and Devices Obtained Thereof
Electrical Device Comprising Analog Frequency Conversion Circuitry and Method for Deriving Characteristics Thereof
Method for Removal of Bulk Metal Contamination from Iii-V Semiconductor Substrates
Method for Forming a Nickelsilicide Fusi Gate
Interface Device and Method for Using the Same
Cmos Compatible Microneedle Structures
System with Distributed Analogue Resources
Communication System over a Power Line Distribution Network
Connecting Scheme for Orthogonal Assembly of Microstructures
Application:
12/110,676 →
Publication:
US 2009/0325424
Low-Voltage, Large Displacement Stepping Actuator and Method for Fabricating the Same
A/D Converter Comprising a Voltage Comparator Device
Method for Determining an Analyte in a Sample
Photovoltaic Structures and Method to Produce the Same
Application:
12/271,659 →
Publication:
US 2009/0308456
Devices Comprising Delay Line for Applying Variable Delay to Clock Signal
Scalable Interpoly Dielectric Stacks with Improved Immunity to Program Saturation
Method and Apparatus for Preventing Galvanic Corrosion in Semiconductor Processing
Application:
12/350,095 →
Publication:
US 2009/0223832
Method for Effective Refractive Index Trimming of Optical Waveguiding Structures and Optical Waveguiding Structures
Defect Etching of Germanium
Application:
12/362,045 →
Publication:
US 2009/0215275
Large Time Constant Steering Circuit and Instrumentation Amplifier Implementing Same
Method for Operating a Non-Volatile Charge-Trapping Memory Device and Method for Determining Programming/Erase Conditions
Application:
12/368,103 →
Publication:
US 2009/0141563
Related Assignments
(25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Aug 29, 2003
From: VASSILEV, VESSELIN K.; GROESENEKEN, GUIDO
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 014459/0238 →
Confidentiality Agreement of Gang Xue and Imec
Jul 6, 2004
From: HOUDT, JAN VAN; XUE, GANG
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC); INFINEON AG, A GERMAN CORPORATION
Reel/Frame 015544/0954 →
Assignment of Assignor's Interest
Jul 6, 2004
From: VAN HOUDT, JAN; XUE, GANG
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC VZW); INFINEON AG
Reel/Frame 015531/0123 →
Assignment of Assignor's Interest
Aug 15, 2005
From: FIORINI, PAOLO; LEONOV, VLADIMIR
To: MCDONNELL BOEHNEN HULBERT & BERGHOFF LLP
Reel/Frame 016638/0574 →
Assignment of Assignor's Interest
Aug 16, 2005
From: MERTENS, PAUL; FYEN, WIM
To: MCDONNELL BOEHNEN HULBERT & BERGHOFF LLP
Reel/Frame 016640/0557 →
Assignment of Assignor's Interest
Sep 23, 2005
From: BAETS, ROELAND; BOCKSTAELE, RONNY; NAESSENS, KRIS; RITS, OLIVIER
To: MCDEONNELL BOEHNEN HULBERT & BERGHOFF LLP
Reel/Frame 016840/0116 →
Assignment of Assignor's Interest
Oct 12, 2005
From: RYCKAERT, JULIEN
To: MCDONNELL BOEHNEN HULBERT & BERGHOFF LLP
Reel/Frame 016876/0742 →
Corrective Assignment Correction of Assignment Recorded on August 16, 2005 at Reel 016640 Frame 0557
Oct 17, 2005
From: MARTENS, PAUL; FYEN, WIM
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 016890/0531 →
Corrective Assignment Correction of Assignment Recorded Aug. 15, 2005 at Reel/Frame 016638/0574
Oct 17, 2005
From: FIORINI, PAOLO; LEONOV, VLADIMIR
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 016890/0535 →
Assignment of Assignor's Interest
Nov 15, 2005
From: DE BEECK, MARIA OP
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 017019/0593 →
Corrective Assignment. Correction of Assignment Recorded on September 23,2005 at Reel/Frame:016840/0116.
Dec 5, 2005
From: BAETS, ROELAND; BOCKSTAELE, RONNY; NACSSENS, KRIS; RITS, OLIVIER
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC); GENT (RUG), UNIVERSITEIT
Reel/Frame 017090/0850 →
Assignment of Assignor's Interest
Jan 5, 2006
From: CAYMAX, MATTY; BONZOM RENAUD; LEYS, FREDERIK; MCURIS, MARC
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 017163/0160 →
Assignment of Assignor's Interest
Feb 2, 2006
From: SEDKY, SHERIF; VAN HOOF, CHRIS; BAERT, KRIST
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 017269/0366 →
Corrective Assignment to Correct the Assignee Name from Mcdonnell Boehnen Hulbert & Berghoff Llp to Interuniversitair Microelektronica Centrum (Imec) Previously Recorded on Reel 016876 Frame 0742. Assignor(S) Hereby Confirms the Assignment of Assignor's Interest (See Document for Details).
Feb 16, 2006
From: RYCKAERT, JULIEN
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 017179/0045 →
Assignment of Assignor's Interest
Apr 14, 2006
From: ROTTENBERG, XAVIER; TILMANS, HENDRIKUS
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 017474/0004 →
Assignment of Assignor's Interest
Jun 16, 2006
From: POLLENTIER, IVAN
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 017810/0463 →
Assignment of Assignor's Interest
Jul 19, 2006
From: KITTL, JORGE ADRIAN; LAUWERS, ANNE; VELOSO, ANABELA; KOTTANTHARAYIL, ANIL
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC); TEXAS INSTRUMENTS INCORPORATED; KONINKLIJKE PHILLIPS ELECTRONICS
Reel/Frame 017960/0800 →
Assignment of Assignor's Interest
May 8, 2007
From: EYCKMANS, WOUTER; LAGAE, LIESBET
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 019261/0453 →
Assignment of Assignor's Interest
Jan 13, 2009
From: KONINKLIJKE PHILIPS ELECTRONICS N.V.
To: NXP B.V.
Reel/Frame 022092/0572 →
Assignment of Assignor's Interest
Apr 27, 2009
From: BLOMME, PIETER; GOVOREANU, BOGDAN; ROSMEULEN, MAARTEN
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 022597/0130 →
Assignment of Assignor's Interest
Apr 29, 2009
From: ABSIL, PHILIPPE; KITTL, JORGE
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC); TEXAS INSTRUMENTS INC.
Reel/Frame 022612/0428 →
Assignment of Assignor's Interest
Apr 29, 2009
From: CARTIER, EDUARD; CHEN, JERRY; ZHAO, CHAO
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 022611/0445 →
Assignment of Assignor's Interest
Apr 29, 2009
From: GOVOREANU, BOGDAN; ROSMEULEN, MAARTEN; BLOMME, PIETER
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 022610/0210 →
Assignment of Assignor's Interest
Jul 1, 2009
From: EYCKMANS, WOUTER; LAGAE, LIESBET
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 022904/0719 →
Change of Name
Oct 26, 2009
From: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC VZW)
To: IMEC
Reel/Frame 023419/0581 →