Method for manufacturing and operating a non-volatile memory

1. A method for manufacturing a nonvolatile memory comprising:

forming first trenches having a designated depth and a second trench having a depth smaller than that of the first trenches, and filling the first and second trenches with an oxidation film;

planarizing the oxidation film, and etching the oxidation film in the second trench so that the oxidation film remains at the central portion of the second trench;

forming a tunnel oxidation film in the second trench from which the oxidation film is etched, and depositing a first polysilicon film thereon;

etching the first polysilicon film back so that a 2-bit floating gate is formed in the second trench;

removing the oxidation film in the second trench by wet etching, and forming a common source on the silicon substrate under the second trench by depositing a lower oxidation film and using the lower oxidation film as a buffer film;

depositing a nitride film and an upper oxidation film on the resulting structure provided with the deposited common source;

depositing a second polysilicon film on the entire surface of the upper oxidation film; and

forming a control gate by etching the second polysilicon film.

2. The method as set forth in claim 1 , wherein, in the formation of the control gate, the etching of the second polysilicon film is performed using the upper oxidation film as an etching stop film.

3. The method as set forth in claim 1 , wherein, in the formation of the control gate, the etching of the second polysilicon film is performed such that the upper oxidation film and the lower oxidation film remain.

4. The method as set forth in claim 3 , wherein drains are formed at both sides of the upper surface of the floating gate using the remaining oxidation films as a buffer film through ion implantation.

5. A method for operating a nonvolatile memory manufacture by the method as set forth in claim 1 , wherein the nonvolatile memory is an NOR type, data erasing and writing functions of which are performed by Fowler-Nordhiem tunneling.

6. A method for operating the nonvolatile memory as set forth in claim 5 , the data erasing operation of which is performed by applying a voltage of 0V to the common source and applying intermediate bias voltage out of high voltage to the control gate.

7. A method for operating the nonvolatile memory as set forth in claim 5 , the data writing operation of which is performed by applying bias voltage to the drains so that Fowler-Nordheim tunneling from the floating gate to drain terminals is achieved.