Patent Assignment
Reel/Frame 053703/0227
Assignment of Assignor's Interest
Recorded: 2020-09-03
Pages: 19
Assignor
MAGNACHIP SEMICONDUCTOR, LTD.
Executed: 2020-08-28
Assignee
KEY FOUNDRY CO., LTD.
215 DAESIN-RO (HYANGJEONG-DONG), HEUNGDEOK-GU, CHEONGJU-SI, CHUNGBUK, KOREA, REPUBLIC OF
Covered Properties
(243)
Esd Protection Circuit
Patent:
6,631,059 →
Application:
09/640,727 →
Analog to Digital Converter Having a Parellel Converter and Logic for Generating Serial Data
Patent:
6,414,621 →
Application:
09/704,752 →
Semiconductor Device and Method for Fabricating the Same
Patent:
6,486,035 →
Application:
09/708,441 →
Metal Wiring in Semiconductor Device and Method for Fabricating the Same
Patent:
6,380,079 →
Application:
09/709,624 →
Offset Compensation Apparatus in a Differential Amplifier Circuit and Offset Compensation Method Thereof
Comparator with Offset Voltage
Patent:
6,445,218 →
Application:
09/783,963 →
Digital-Analogue Transformer Using Resistor String
Method for Fabricating Semiconductor Device
Semiconductor Device of Sub-Micron or High Voltage Cmos Structure and Method for Manufacturing the Same
Method for Fabricating Capacitor of Semiconductor Device
Analog-To-Digital Converter Having Gamma-Corrected Reference Voltages
Modulator of Phase Shift Keying (Psk) Type
Method for Forming a Borderless Contact of a Semiconductor Device
Transistor of Semiconductor Device and Method of Manufacturing the Same
Semiconductor Device and Method of Forming the Same
Operational Transconductance Amplifier for an Output Buffer
Switched-Capacitor Integrator
Charge Pump Circuit for Reducing Jitter
Comparator with Offset Voltage
Semiconductor Device with via-Contact Plugs
Method for Forming T-Shaped Conductive Wires of Semiconductor Device Utilizing Notching Phenomenon
Method for Fabricating Merged Dram with Logic Semiconductor Device
Method for Forming a Rom Coding in a Semiconductor Device
Method of Manufacturing a Transistor in a Semiconductor Device
Method for Manufacturing Semiconductor Device
Method of Manufacturing a Semiconductor Device
Power Divider
Method for Fabricating Capacitor of Semiconductor Device
Sram Cell and Method for Fabricating the Same
Method for Forming Copper Metal Line in Semiconductor Device
Method for Forming Multi-Layer Metal Line of Semiconductor Device
Method for Detecting Flare Noise of Semiconductor Device
Method for Forming Contact Hole in Semiconductor Device
Structure of Sram Having Asymmetric Silicide Layer
Method for Fabricating Mim Capacitor
Method for Manufacturing Semiconductor Device of Sub-Micron or High Voltage Cmos Structure
Method of Forming a Capacitor in a Semiconductor Device
Method of Manufacturing Capacitor in Semiconductor Devices
Method of Forming Dual Damascene Pattern in Semiconductor Device
Method of Forming Copper Wiring in a Semiconductor Device
Plate for Forming Metal Wires and Method of Forming Metal Wires Using the Same
Comparison Apparatus Operated at a Low Voltage
Method of Manufacturing Semiconductor Devices
Method for Forming Isolation Film for Semiconductor Devices
Method of Forming Isolation Films in Semiconductor Devices
Method of Forming Metal Line in Semiconductor Device
Method for Forming Metal Wiring Without Metal Byproducts That Create Bridge Between Metal Wires in a Semiconductor Device
Method for Forming Isolation Film for Semiconductor Devices
Semiconductor Device and Method of Forming the Same
Method of Forming Metal Line Layer in Semiconductor Device
Method of Forming Trench in Semiconductor Device
Method of Forming Metal Line Layer in Semiconductor Device
Method of Forming Insulating Film in Semiconductor Device
Method for Forming Salicide in Semiconductor Device
Method for Forming Isolation Layer of Semiconductor Device
Method of Forming Copper Wiring in Semiconductor Device
Semiconductor Device Having on-Chip Reference Voltage Generator
Method for Fabricating Merged Logic Cmos Device
Method for Forming T-Shaped Conductor Wires of Semiconductor Device
Method for Manufacturing a Nonvolatile Memory Transistor
Method for Manufacturing a Semiconductor Device
Semiconductor Device and Method of Fabricating the Same
Semiconductor Device for Reducing Plasma Charging Damage
Test Pattern of Semiconductor Device
Method for Forming Low-K Dielectric Layer of Semiconductor Device
Method for Fabricating Semiconductor Device
Method for Forming Inductor in Semiconductor Device
Radio Frequency Semiconductor Device and Method of Manufacturing the Same
Method for Forming Interlayer Insulation Film in Semiconductor Device
Method for Forming Metal Wires in Semiconductor Device
Method for Forming Inductor in Semiconductor Device
Method of Manufacturing Semiconductor Device
Radio Frequency Integrated Circuit, and Method for Manufacturing the Same
Cmos Output Buffer Circuit
Test Pattern for Reliability Measurement of Copper Interconnection Line Having Moisture Window and Method for Manufacturing the Same
Nonvolatile Memory Device and Method for Manufacturing the Same
Method for Manufacturing a Non-Volatile Memory Device
Method of Improving Residue and Thermal Characteristics of Semiconductor Device
Method of Forming Metal Wiring for High Voltage Element
Device for Electrostatic Discharge Protection and Circuit Thereof
Device for Electrostatic Discharge Protection and Method of Manufacturing the Same
Generator for Supplying Reference Voltage and Reference Current of Stable Level Regardless of Temperature Variation
Structure of Dummy Pattern in Semiconductor Device
Method of Manufacturing Semiconductor Device
Method for Removing Photoresist Layer and Method for Forming Metal Line in Semiconductor Device Using the Same
Parallel Capacitor of Semiconductor Device
Flash Cell Using a Piezoelectric Effect
Wafer Alignment Method
Semiconductor Device Manufacturing Method
Method for Manufacturing and Operating a Non-Volatile Memory
Non-Volatile Memory Device and Method for Fabricating the Same
Electrostatic Discharge Protection Device
Nonvolatile Memory Device and Method for Manufacturing the Same
Method for Fabricating Semiconductor Device
Method for Fabricating Module of Semiconductor Chip
Method for Fabricating Semiconductor Device
Non-Volatile Memory Device Having Selection Gates Formed on the Sidewalls of Dielectric Layers
Electro-Static Discharge Protection Circuit and Method for Fabricating the Same
Method for Fabricating Semiconductor Device
Device for Electrostatic Discharge Protection and Method of Manufacturing the Same
System and Method for Differential Efuse Sensing Without Reference Fuses
Semiconductor Device
Esd Protection Circuit
Non-Volatile Memory Device
Epitaxial silicon wafer and method for fabricating the same
High Power Device Isolation and Integration
Structure for Differential Efuse Sensing Without Reference Fuses
Method for Forming Salicide in Semiconductor Device
Semiconductor Integrated Circuit
Transistor Having Recess Channel and Fabricating Method Thereof
High Voltage Device
Non-Volatile Memory Device and Method for Fabricating the Same
Method of Forming Metal Wiring of Semiconductor Device
Patent:
41,653 →
Application:
12/284,848 →
Semiconductor Device with Deep Trench Structure
Esd Protection Circuit
Method of Manufacturing Semiconductor Device Including Forming a T-Shape Gate Electrode
Method for Forming Gate Oxide of Semiconductor Device
Method for Forming Gate of Semiconductor Device
Silicon Wafer and Fabrication Method Thereof
Insulator, Capacitor with the Same and Fabrication Method Thereof, and Method for Fabricating Semiconductor Device
Electrostatic Discharge Protection Device and Method for Manufacturing the Same
Capacitor Structure
Capacitor and Method for Fabricating the Same
Nonvolatile Memory Cell and Method for Fabricating the Same
Method for Forming Deep Trench in Semiconductor Device
High Power Device Isolation and Integration
Transistor Having Recess Channel and Fabricating Method Thereof
Semiconductor Device
Semiconductor Device
Semiconductor Device
Semiconductor Device
Semiconductor Device and Method for Fabricating Semiconductor Device
Semiconductor Device and Method for Fabricating the Same
Schottky Diode and Method for Fabricating the Same
Semiconductor Device for Preventing Crack in Pad Region and Fabricating Method Thereof
Method for Forming Gate Oxide of Semiconductor Device
Semiconductor Device and Manufacturing Method Thereof
Nonvolatile Memory Device and Method for Fabricating the Same
Semiconductor Device with Mim Capacitor and Method for Manufacturing the Same
Element Isolation Structure of Semiconductor and Method for Forming the Same
Silicon Wafer and Fabrication Method Thereof
Semiconductor Device and Method of Fabricating the Same
Semiconductor Device
Semiconductor Device and Method for Fabricating the Same
Electro-Static Discharge Protection Device
Non-Volatile Memory Device and Method for Fabricating the Same
Capacitor and Method for Fabricating the Same
Isolation Structure, Semiconductor Device Having the Same, and Method for Fabricating the Isolation Structure
Nonvolatile Memory Device and Method of Manufacturing Thereof
High Voltage Semiconductor Device
Metal Wiring of Semiconductor Device and Method for Manufacturing the Same
High Voltage Device and Method for Fabricating the Same
Silicon Wafer and Fabrication Method Thereof
Semiconductor Device and Method for Fabricating the Same
Electrical Fuse and Method of Fabricating the Same
Semiconductor Device
Semiconductor Device
Semiconductor Device
Semiconductor Device and Method for Fabricating Semiconductor Device
Method for Wafer Level Reliability
Semiconductor Device and Manufacturing Method Thereof
Semiconductor-Based Hall Sensor
Semiconductor Device and Manufacture Method Thereof
Lateral Double-Diffused Mos Transistor Having Deeper Drain Region Than Source Region
Semiconductor Power Device and Method of Fabricating the Same
Esd Transistor
Esd Transistor for High Voltage and Esd Protection Circuit Thereof
Semiconductor Device and Manufacturing Method Thereof
Semiconductor Device
Semiconductor Device and Manufacturing Method Thereof
Semiconductor Device
Non-Volatile Memory Device Having Asymmetrical Control Gates Surrounding a Floating Gate and Manufacturing Method Thereof
Method of Fabricating a Ldmos Device Having a First Well Depth Less Than a Second Well Depth
Method for Fabricating a Shorttky Diode Including a Guard Ring Overlapping an Insolation Layer
A Semiconductor Device Having Circuitry Positioned Above a Buried Magnetic Sensor
Low-Cost Semiconductor Device Manufacturing Method
Method of Manufacturing Non-Volatile Memory Device
Vertical Bipolar Junction Transistor and Manufacturing Method Thereof
Capacitor Type Humidity Sensor
Vertical Hall Sensor, Hall Sensor Module and Method for Manufacturing the Same
Humidity Sensor with Void Within Interconnect and Method of Manufacturing the Same
Semiconductor Device with Voids Within Silicon-on-Insulator (Soi) Structure and Method of Forming the Semiconductor Device
Hall Sensor with Improved Doping Profile
Patent:
9,299,919 →
Application:
14/625,648 →
Semiconductor and Method of Fabricating the Same
Insulator, Capacitor with the Same and Fabrication Method Thereof, and Method for Fabricating Semiconductor Device
Semiconductor Device and Method of Fabricating the Same
Isolation Structure, Semiconductor Device Having the Same, and Method for Fabricating the Isolation Structure
Semiconductor Device
Method of Manufacturing Non Volatile Memory Device
Semiconductor Structure Having a Junction Field Effect Transistor and a High Voltage Transistor and Method for Manufacturing the Same
Schottky Diode Having Floating Guard Rings
Level Shifter and Non-Volatile Memory Device Using the Same
Metal Wiring of Semiconductor Device and Method for Manufacturing the Same
Semiconductor Device for Preventing Crack in Pad Region and Fabricating Method Thereof
Semiconductor Device with Voids Within Silicon-on-Insulator (Soi) Structure and Method of Forming the Semiconductor Device
One Time Programmable Non-Volatile Memory Device
Method for Wafer Level Reliability
Semiconductor and Method of Fabricating the Same
Method of Manufacturing a Cmos Transistor
Single Poly Non-Volatile Memory Device, Method of Manufacturing the Same and Single Poly Non-Volatile Memory Device Array
Method of Fabricating Dmos and Cmos Transistors
Patent:
9,859,168 →
Application:
15/408,200 →
Integrated Semiconductor Device and Method for Manufacturing the Same
Display Driver Semiconductor Device and Manufacturing Method Thereof
Low-Cost Semiconductor Device Manufacturing Method
Semiconductor Device
Integrated Semiconductor Device Having Isolation Structure for Reducing Noise
Display Driver Semiconductor Device and Manufacturing Method Thereof
Method of Fabricating Dmos and Cmos Transistors
High Voltage Semiconductor Device
Semiconductor Device and Manufacturing Method Thereof
Semiconductor Structure Having a Junction Field Effect Transistor and a High Voltage Transistor and Method for Manufacturing the Same
Semiconductor Device Having Circuitry Positioned Above a Buried Magnetic Sensor
Tie-High and Tie-Low Circuits
Semiconductor Device Comprising Schottky Barrier Diodes
Decoupling Capacitor Circuit
Semiconductor Device Having a Deep-Trench Capacitor Including Void and Fabricating Method Thereof
Integrated Semiconductor Device Having Isolation Structure for Reducing Noise
Method of Manufacturing a Cmos Transistor
Power Semiconductor Device and Method for Manufacturing the Same
Semiconductor Device with High Voltage Field Effect Transistor and Junction Field Effect Transistor
Single Poly Multi Time Program Cell and Method of Operating the Same
Integrated Semiconductor Device and Method for Manufacturing the Same
Semiconductor Device and Method for Manufacturing the Same
Insulator, Capacitor with the Same and Fabrication Method Thereof, and Method for Fabricating Semiconductor Device
Single Poly Non-Volatile Memory Device, Method of Manufacturing the Same and Single Poly Non-Volatile Memory Device Array
Method of Manufacturing a Cmos Transistor
Semiconductor Device and Manufacturing Method Thereof
Semiconductor Device Having Deep Trench Structure and Method of Manufacturing Thereof
Semiconductor Device
High Voltage Semiconductor Device
Semiconductor and Method of Fabricating the Same
Display Driver Semiconductor Device and Manufacturing Method Thereof
Semiconductor Device with Electrostatic Discharge Protection
Semiconductor Device with Controllable Channel Length and Manufacturing Method Thereof
Semiconductor Device Comprising Schottky Barrier Diodes
Integrated Semiconductor Device and Method for Manufacturing the Same
Nonvolatile Memory Device
Semiconductor Device with Controllable Channel Length and Manufacturing Method of Semiconductor Device with Controllable Channel Length
Semiconductor Device Including Nonvolatile Memory Device and Logic Device and Manufacturing Method of Semiconductor Device Including Nonvolatile Memory Device and Logic Device
High Voltage Semiconductor Device and Manufacturing Method of High Voltage Semiconductor Device
Semiconductor Device Having a Diode Type Electrical Fuse (E-Fuse) Cell Array
Manufacturing Method of Semiconductor Device Using Gate-Through Implantation
Single Poly Non-Volatile Memory Device, Method of Manufacturing the Same and Single Poly Non-Volatile Memory Device Array
Related Assignments
(2)
Other recorded transfers of the patents in this record — the chain of ownership.
Corrective Assignment to Correct the Receiving Party Address Previously Recorded at Reel: 024563 Frame: 0807. Assignor(S) Hereby Confirms the Release by Secured Party.
Nov 25, 2014
From: US BANK NATIONAL ASSOCIATION
To: MAGNACHIP SEMICONDUCTOR LTD.
Reel/Frame 034469/0001 →
Change of Name
Mar 12, 2024
From: KEY FOUNDRY CO., LTD.
To: SK KEYFOUNDRY INC.
Reel/Frame 066794/0290 →